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Capacitance cell measurement of the out-of-plane expansion of thin films [[electronic resource] /] / Chad R. Snyder, Frederick I. Mopsik
| Capacitance cell measurement of the out-of-plane expansion of thin films [[electronic resource] /] / Chad R. Snyder, Frederick I. Mopsik |
| Autore | Snyder Chad R |
| Pubbl/distr/stampa | [Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2001] |
| Descrizione fisica | 1 online resource (x, 32 pages) : illustrations |
| Altri autori (Persone) | MopsikF. I |
| Collana |
NIST special publication
NIST recommended practice guide |
| Soggetto topico |
Thin-film circuits
Thin films - Thermal properties Expansion (Heat) - Measurement |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910699291703321 |
Snyder Chad R
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| [Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2001] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Survey of FY 2001 nanotechnology related research at the National Institute of Standards and Technology / / Chad R. Snyder; J. Patrick Looney; Michael P. Casassa
| Survey of FY 2001 nanotechnology related research at the National Institute of Standards and Technology / / Chad R. Snyder; J. Patrick Looney; Michael P. Casassa |
| Autore | Snyder Chad R |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2002 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
CasassaMichael P
LooneyJ. Patrick SnyderChad R |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710526403321 |
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Snyder Chad R
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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