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Photoelectron spectroscopy : bulk and surface electronic structures / / Shigemasa Suga, Akira Sekiyama, Christian Tusche
| Photoelectron spectroscopy : bulk and surface electronic structures / / Shigemasa Suga, Akira Sekiyama, Christian Tusche |
| Autore | Suga Shigemasa |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (529 pages) |
| Disciplina | 543.0858 |
| Collana | Springer series in surface sciences |
| Soggetto topico | Photoelectron spectroscopy |
| ISBN | 3-030-64073-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Preface -- Acknowledgements -- Contents -- About the Authors -- Acronyms -- Symbols -- 1 Introduction -- References -- 2 Theoretical Background -- 2.1 Photoemission Process as One of the Optical Processes -- 2.2 Three-Step Model -- 2.2.1 Introduction of Three-Step Model -- 2.2.2 Step-1: Photoexitations in Solids -- 2.2.3 Step-2: Travel of Photoelectrons to the Surface -- 2.2.4 Step-3: Emission of Photoelectrons into the Vacuum -- 2.3 Matrix Element Effects -- 2.3.1 Momentum Conservation Law for Valence-Band Excitations -- 2.3.2 Photoionization Cross-Sections (PICS) -- 2.3.3 Photoelectron Angular Distribution and Polarization Dependence -- 2.3.4 Polarization Dependence in Angle-Resolved Photoemission -- 2.3.5 Other Remarks -- 2.4 Valence-Band Photoexcitation Process for Non-interacting Systems -- 2.4.1 Koopmans' Theorem -- 2.4.2 Formulation of Angle-Integrated Photoemission for Non-interacting Systems -- 2.4.3 Formulation of Angle-Resolved Photoemission for Non-interacting Systems -- 2.5 Valence-Band Photoexcitation Process for Strongly Correlated Electrons Systems -- 2.5.1 Effects of Coulomb Repulsions -- 2.5.2 Formulations of ARPES Spectra of Strongly Correlated Electron Systems -- 2.5.3 Quasiparticles and Incoherent Part in the PES Spectra -- 2.5.4 Energy Scale of the Self-energy -- 2.6 Core-Level Photoexcitation Process for Strongly Correlated Electrons Systems -- 2.6.1 Core-Level PES Spectra Reflecting the Outer Strongly Correlated Electronic States -- 2.6.2 Formulations of Core-Level PES -- 2.6.3 Intra-atomic Multiplet Structure in the Core-Level PES Spectra -- 2.7 Theoretical Models to Describe the Spectra of Strongly Correlated Electron Systems -- 2.7.1 Overview -- 2.7.2 Periodic Anderson Model (PAM) and d-p Model -- 2.7.3 Single Impurity Anderson Model -- 2.7.4 Configuration-Interaction Cluster Model -- 2.7.5 Hubbard Model.
2.7.6 Dynamical Mean Field Theory -- 2.7.7 Some Remarks -- References -- 3 Instrumentation and Methodology -- 3.1 Synchrotron Radiation and Undulator Radiation -- 3.2 Principle of Grating and Crystal Monochromators -- 3.2.1 Grating Monochromators -- 3.2.2 Crystal Monochromators -- 3.2.3 Focusing Mirrors -- 3.3 Examples of Light Sources -- 3.3.1 High Resolution Vacuum Ultraviolet Synchrotron Radiation Beam Lines -- 3.3.2 High Resolution Soft X-ray Beam Lines -- 3.3.3 High Resolution Hard X-ray Beam Lines -- 3.3.4 Laboratory Vacuum Ultraviolet Sources -- 3.3.5 Laser Sources -- 3.3.6 Miscellaneous Subjects -- 3.4 Electron Spectrometers -- 3.4.1 Hemispherical Analyzers -- 3.4.2 Cylindrical Mirror Analyzers -- 3.4.3 Two-Dimensional Analyzers -- 3.4.4 Time-of-Flight Analyzers -- 3.5 Sample Preparation and Characterization -- 3.5.1 Ion Sputtering, Scraping, Fracturing and Cleavage -- 3.5.2 In-Situ Sample Growth and Surface Analysis -- 3.5.3 Samples at Low Temperatures or at Ambient Pressure -- 3.6 Methodology -- 3.6.1 Angle-Integrated Photoelectron Spectroscopy -- 3.6.2 Resonance Photoemission and Constant Initial State Spectrum -- 3.6.3 Angle-Resolved Photoelectron Spectroscopy -- 3.6.4 Photoelectron Spectroscopy in the μm and nm Regions -- 3.6.5 Momentum Microscope -- References -- 4 Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- 4.1 Concept of Inelastic Mean Free Path -- 4.2 How to Separate the Bulk and Surface Contributions in the Spectra -- References -- 5 Examples of Angle-Integrated Photoelectron Spectroscopy -- 5.1 Valence Band Spectra -- 5.2 Core Level Spectra -- 5.3 Multiplet Structures -- References -- 6 Angle Resolved Photoelectron Spectroscopy in the hν Region of 15 to 200 eV -- 6.1 General -- 6.2 Layered Materials -- 6.3 Rare Earth Compounds -- 6.4 One Dimensional Materials -- 6.5 Topological Insulators -- 6.6 Superconductors. 6.7 Quantum Well States -- References -- 7 High-Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- 7.1 Angle-Integrated Soft X-ray Photoelectron Spectroscopy -- 7.1.1 Ce Compounds -- 7.1.2 Yb Compounds -- 7.1.3 Transition Metal Compounds -- 7.2 Angle-Resolved Soft X-ray Photoelectron Spectroscopy -- 7.2.1 Ce Compounds -- 7.2.2 La2−xSrxCuO4 and Nd2−xCexCuO4 -- 7.2.3 Layered Ruthenates Sr2−xCaxRuO4 -- 7.2.4 V6O13 and SrCuO2 -- 7.2.5 Other Materials (VSe2, LaRu2P2, BiTeI) -- 7.3 Standing Wave -- References -- 8 Hard X-ray Photoelectron Spectroscopy -- 8.1 La1−xSrxMnO3, La2−xSrxCuO4 and Nd2-xCexCuO4 -- 8.2 Sm Compounds -- 8.3 Pr Compounds -- 8.4 Yb Compounds -- 8.5 V Oxides -- 8.6 Recoil Effects -- 8.7 Angle-Resolved Hard X-ray Photoelectron Spectroscopy -- 8.8 Polarization Dependence of Hard X-ray Photoelectron Spectroscopy -- 8.9 Linear Dichroism in Angle-Resolved Core-Level Photoemission -- 8.9.1 Formulations and Simulations of Polarization-Dependent Angle-Resolved Core-Level Photoemission Spectra -- 8.9.2 Partially Filled 4f States Under Crystalline Electric Fields -- 8.9.3 Tetragonal and Cubic Yb Compounds -- 8.9.4 Tetragonal Sm Compounds -- 8.9.5 Cubic Pr Compounds -- 8.9.6 Tetragonal Ce Compounds -- References -- 9 Very Low Photon Energy Photoelectron Spectroscopy -- 9.1 Angle Integrated and Resolved ELEPES by Laser Excitation -- 9.1.1 Angle-Integrated Measurements -- 9.1.2 Angle-Resolved Measurements -- 9.2 ELEPES by Synchrotron Radiation -- 9.3 ELEPES by Microwave-Excited Rare Gas Lamp -- 9.4 Two-Photon Excitation Photoelectron Spectroscopy -- References -- 10 Magnetic Dichroism and Spin Polarization in Photoelectron Spectroscopy -- 10.1 Magnetic Circular and Linear Dichroism in Photoelectron Spectroscopy. 10.2 Principle and Instrumentation for Spin Polarized Photoelectron Spectroscopy -- 10.3 Spin Polarized Photoelectron Spectroscopy for Non-magnetic Materials -- 10.3.1 Pt -- 10.3.2 High-Tc Cuprate -- 10.3.3 Rashba Effect and Topological Insulators -- 10.4 Spin Polarized Photoelectron Spectroscopy of Magnetic Materials -- References -- 11 Momentum Microscopy -- 11.1 The Concept of Momentum Space Imaging -- 11.1.1 Instrumental Aspects -- 11.1.2 Energy and Momentum Resolution -- 11.2 Evolution and Applications of Momentum Microscopy -- 11.2.1 Fermi Surface Mapping with a High-Pass Energy Filter -- 11.2.2 Aberration Compensated Energy Filter -- 11.2.3 Electronic Structure of Noble Metals -- 11.2.4 High-Resolution Spectroscopy of Layered Semiconductors -- 11.2.5 Double-Pass Energy Filter -- 11.2.6 Other Dispersive Energy Filters -- 11.3 Time-of-Flight Momentum Microscopy -- 11.3.1 Time-of-Flight Electron Energy Analysis -- 11.3.2 Energy Resolution of a Time-of-Flight Spectrometer -- 11.3.3 Rapid Band Structure Mapping -- 11.3.4 Time-Resolved Spectroscopy -- 11.4 High-Energy Momentum Microscopy -- 11.4.1 Hard X-ray Photoemission Microscopy and Spectroscopy -- 11.4.2 Bulk Fermi Surface Tomography -- 11.5 Spin-Resolved Momentum Microscopy -- 11.5.1 Working Principle of Imaging Spin Filters -- 11.5.2 Properties of the Spin-Filter Crystal -- 11.5.3 Measurements Principles -- 11.5.4 Spin-Resolved ToF Momentum Microscopy -- 11.5.5 Imaging Complex Spin Textures -- 11.5.6 Electronic Structure of Ferromagnets -- 11.5.7 Efficiency of Multichannel Spin Filters -- 11.6 Spin-Resolved Photoelectron Microscopy -- 11.7 Laser Excited Momentum Microscopy -- 11.7.1 Spin Texture of Topological Insulators -- 11.7.2 Surface Doping Effects -- References -- 12 Photoelectron Diffraction and Photoelectron Holography -- References -- 13 Inverse Photoemission -- 13.1 General Concept. 13.2 Isochromat IPES -- 13.3 Angle-Resolved IPES -- 13.4 IPES with a Fixed Incident Electron Energy -- 13.5 IPES of Quantum Well States -- 13.6 Spin Polarized Inverse Photoemission Spectroscopy (SP-IPES) -- 13.6.1 Principle and Instrumentation -- 13.6.2 Several SP-IPES Studies -- References -- 14 Complementary Techniques for Studying Bulk Electronic States -- 14.1 Core Absorption Spectroscopy -- 14.2 Infrared and Far-Infrared Spectroscopy -- 14.3 Resonance Inelastic X-ray Scattering -- 14.4 Magneto Optical Studies: Core Absorption and Soft X-ray Resonance Inelastic Scattering -- References -- 15 Surface Spectroscopy by Scanning Tunneling Microscope -- 15.1 Scanning Tunneling Spectroscopy by Scanning Tunneling Microscope -- 15.2 Scanning Tunneling Spectroscopy and Momentum Microscopy of SmB6 -- References -- 16 Summary and Outlook -- 16.1 Bulk Sensitive Electronic Structure Investigation: HAXARPES -- 16.2 Advances of Photoelectron Analyzers for ARPES and Momentum Microscopy -- 16.3 Electronic Structure Investigation of Micro-Nano Regions -- 16.4 Investigation of Complex Spin Textures in k-Space -- 16.5 Miscellaneous -- 16.6 Outlook -- References -- List of Samples -- Index. |
| Record Nr. | UNINA-9910488693403321 |
Suga Shigemasa
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| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Photoelectron Spectroscopy [[electronic resource] ] : Bulk and Surface Electronic Structures / / by Shigemasa Suga, Akira Sekiyama
| Photoelectron Spectroscopy [[electronic resource] ] : Bulk and Surface Electronic Structures / / by Shigemasa Suga, Akira Sekiyama |
| Autore | Suga Shigemasa |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (XVIII, 378 p. 192 illus., 70 illus. in color.) |
| Disciplina | 547.346 |
| Collana | Springer Series in Optical Sciences |
| Soggetto topico |
Lasers
Photonics Optics Electrodynamics Surfaces (Physics) Interfaces (Physical sciences) Thin films Quantum optics Physical chemistry Materials science Optics, Lasers, Photonics, Optical Devices Classical Electrodynamics Surface and Interface Science, Thin Films Quantum Optics Physical Chemistry Characterization and Evaluation of Materials |
| ISBN | 3-642-37530-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Theoretical Background -- Instrumentation and Methodology -- Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- Examples of Angle Integrated Photoelectron Spectroscopy -- Angle-Resolved Photoelectron Spectroscopy in HV-regions -- High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- Very Low Photon Energy Photoelectron Spectroscopy -- Inverse Photoemission -- Photoelectron Diffraction -- Complementary Techniques for Studying Bulk Electronic Structures -- Surface Spectroscopy by Scanning Tunneling Microscope. |
| Record Nr. | UNINA-9910300384003321 |
|
Suga Shigemasa
|
||
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||