Analysis of dimensional metrology standards / / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering
| Analysis of dimensional metrology standards / / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering |
| Autore | Evans John |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2001 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
EvansJohn
FrechetteSimon HorstJohn HuangHui KramerThomas MessinaE. R (Elena R.) ProctorFrederick M RippeyBill ScottHarry VorburgerTed WaveringAl |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710526703321 |
Evans John
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2001 | ||
| Lo trovi qui: Univ. Federico II | ||
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Feature-Based Inspection and Control System / / Thomas R. Kramer; John Horst; Hui Huang; Elena Messina; Frederick M. Proctor; Harry Scott
| Feature-Based Inspection and Control System / / Thomas R. Kramer; John Horst; Hui Huang; Elena Messina; Frederick M. Proctor; Harry Scott |
| Autore | Kramer Thomas R |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
HorstJohn
HuangHui KramerThomas R MessinaE. R (Elena R.) ProctorFrederick M ScottHarry |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710774303321 |
Kramer Thomas R
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
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The NIST DMIS interpreter / / Thomas R. Kramer; Frederick M. Proctor; William G. Rippey; Harry Scott
| The NIST DMIS interpreter / / Thomas R. Kramer; Frederick M. Proctor; William G. Rippey; Harry Scott |
| Autore | Kramer Thomas R |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
KramerThomas R
ProctorFrederick M RippeyWilliam G ScottHarry |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710771303321 |
Kramer Thomas R
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 | ||
| Lo trovi qui: Univ. Federico II | ||
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The NIST DMIS interpreter version 2 / / Thomas R. Kramer; Frederick M. Proctor; William G. Rippey; Harry Scott
| The NIST DMIS interpreter version 2 / / Thomas R. Kramer; Frederick M. Proctor; William G. Rippey; Harry Scott |
| Autore | Kramer Thomas R |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1998 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
KramerThomas R
ProctorFrederick M RippeyWilliam G ScottHarry |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710532503321 |
Kramer Thomas R
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1998 | ||
| Lo trovi qui: Univ. Federico II | ||
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Terrain Characterization for TRL-6 evaluation of an unmanned ground vehicle / / Michael Shneier; Tsai Hong; Tommy Chang; Harry Scott; Steve Legowik; Gerry Cheok; Chuck Giauque; David Gilsinn; Christopher Witzgall
| Terrain Characterization for TRL-6 evaluation of an unmanned ground vehicle / / Michael Shneier; Tsai Hong; Tommy Chang; Harry Scott; Steve Legowik; Gerry Cheok; Chuck Giauque; David Gilsinn; Christopher Witzgall |
| Autore | Shneier Michael |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChangTommy
CheokGeraldine S GiauqueChuck GilsinnDavid HongTsai LegowikSteve ScottHarry ShneierMichael WitzgallChristopher |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710776803321 |
Shneier Michael
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
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