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The art and science of microelectronic circuit design / / A. I. Belous, Vitali Saladukha
The art and science of microelectronic circuit design / / A. I. Belous, Vitali Saladukha
Autore Belous A. I (Anatoliĭ Ivanovich)
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2022]
Descrizione fisica 1 online resource (445 pages)
Disciplina 621.38173
Soggetto topico Integrated circuits
ISBN 3-030-89854-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Preface -- Acknowledgements -- Contents -- Chapter 1: Standard Characteristics of Digital Microcircuits -- 1.1 Structure of Digital Microciruits -- 1.1.1 General Structure of Digital Microcircuits -- 1.1.2 Architecture of Internal Cells of Digital Microcircuits -- 1.1.3 Architecture of Digital Mirocircuit Matching Elements -- 1.2 System of Main Parameters and Chracteristics of Digital Microcircuits -- 1.2.1 Functional Parameters of Digital Microcircuits -- 1.2.2 Electical Parameters of Digital Microcircuits -- 1.2.3 Dynamic Parameters of Digital Microcircuits -- 1.3 Schematic Implementation of Digital Microcircuits -- 1.3.1 Power Characteristics of Standard Logic Cells of Digital Microcircuits -- 1.3.2 Schematic Implementation of Standard Digital Microcircuits -- 1.3.3 Techniques of Digital Microcircuits Element Base Selection -- 1.4 Impact of Destabilizing Factors on Serviceability of Digital Microcircuits -- 1.4.1 Immunity of Digital Microcircuits to Electrostatic Discharge -- 1.4.2 Microcircuits Overload Tolerance -- 1.4.3 Dependence of Electrical Characteristics of Digital Microcircuits Upon Operational Modes -- 1.4.4 Immunity of Digital Microcircuits to the Impact Produced by Interferences -- 1.5 Parasitic Elements and Effects in Digital Microcircuits -- 1.5.1 Parasitic Transistor Elements Inside Digital Microcircuit Dice -- 1.5.2 Miller´s Effect -- 1.5.3 Latch-Up Effect -- References -- Chapter 2: Schematic Solutions of Digital CMOS Microcircuits -- 2.1 Standard Logic Cells of Digital CMOS Microcircuits -- 2.1.1 Static CMOS Logic Cells -- 2.1.2 Standard LC of Dynamic CMOS Logic -- 2.2 Memory Elements of the Digital CMOS Integrated Circuits -- 2.2.1 Memory Elements, Clocked by the Level of the Synchrosignal -- 2.2.2 Memory Elements, Clocked by the Synchrosignal Edge -- References.
Chapter 3: Schematic Technical Solutions of the Bipolar Integrated Circuits -- 3.1 Digital Integrated Circuits on the Bipolar Transistors with the Schottky Diodes -- 3.1.1 Basic TTLS Logic Elements of Digital Integrated Circuits -- 3.1.2 Basic Logic Elements of Schottky Transistor Logic -- 3.1.3 Basic Logic Elements of the Integrated Schottky Logic -- 3.1.4 Base Logic Elements of the Diode-Transistor Logic with Schottky Diodes -- 3.2 Memory Elements of TTLS Integrated Circuits -- 3.2.1 Memory Elements, Synchrosignal Edge Cycled -- 3.2.2 Memory Elements, Cycled by the Level of the Synchrosignal -- 3.3 Schematics of the Input Matching Elements of the TTLS Integrated Circuits -- 3.3.1 Input Matching TTLS Elements of Integrated Circuits with the standard TTL input levels -- 3.3.2 Input ME TTLS of Integrated Circuits with the Enhanced Load Capacitance -- 3.3.3 Input ME TTLS of the Integrated Circuits with the Paraphrase Outputs -- 3.3.4 Input ME TTLS Integrated Circuits with Memory -- 3.3.5 Input BE TTLS of Integrated Circuits with the Enhanced Noise Immunity -- 3.3.6 Input Matching Element with Conversion of the Signal Levels -- 3.3.7 Protection Diagrams of the Input ME TTLS Integrated Circuits -- 3.4 Schematics of the Output Matching Elements of TTLS Integrated Circuits -- 3.4.1 Output ME TTLS of Integrated Circuits with Standard TTL Output Levels -- 3.4.2 Output ME of TTLS Integrated Circuits with Memory -- 3.4.3 Output ME of TTLS Integrated Circuits with Conversion of signal levels -- 3.4.4 Schematics of the Protection Circuits of the Output ME of TTLS Integrated Circuits -- 3.5 Digital Integrated Circuits on the Basis of the Integrated Injection Logic -- 3.5.1 Varieties of the Basic Elements of the I2L Integrated Circuits -- 3.5.2 Memory Elements of I2L Integrated Circuits.
3.5.3 Schematics of the Input Matching Elements of the I2L Integrated Circuits -- 3.5.4 Protection of the I2L Pins of the Integrated Circuits from Overvoltage and Static Electricity -- References -- Chapter 4: Circuit Engineering of Bi-CMOS IC -- 4.1 Basic Logic Elements of Bi-CMOS IC -- 4.2 Bi-CMOS IC Memory Elements -- 4.3 Circuit Engineering of Bi-CMOS IC Input Matching Components -- 4.3.1 Input MC of Bi-CMOS IC with Signal Level Conversion -- 4.3.2 Input MC of Bi-CMOS IC with Increased Load Capacity -- 4.3.3 Input MC of Bi-CMOS IC with Paraphase Outputs -- 4.3.4 Input MC of Bi-CMOS IC with Increased Noise Immunity -- 4.3.5 Input MC of Bi-CMOS Memory IC -- 4.3.6 Circuit Engineering of Input MC of Bi-CMOS IC Protection -- 4.4 Circuit Engineering of Bi-CMOS IC Matching Output Components -- 4.4.1 Output MC of Bi-CMOS IC with the Formation of CMOS Output Levels -- 4.4.2 Output MC of Bi-CMOS ICs with the Formation of TTL Output Levels -- 4.4.3 Output MC of Bi-CMOS IC with the Formation of ECL Output Levels -- 4.4.4 Output MC BI-CMOS Memory ICs -- 4.4.5 Circuit Engineering of the Output MC BI-CMOS IC Protection Circuits -- References -- Chapter 5: Structure and Specific Features of Design Libraries for Submicron Microcircuits -- 5.1 Development Process Flow and Standard Structure of a Process Design Kit (PDK) -- 5.2 Terms and Definitions Used to Describe PDK Components -- 5.3 PDK Standardization -- 5.4 Mixed Analog/Digital Microcircuit Design Flow -- 5.5 Summarized Information Model of Mixed Analog-Digital IC Design -- 5.6 Specifying Basic PDK Components and Standard Elements List -- 5.7 Development Features of Digital Libraries for Designing ASICs with Submicron Design Rules -- 5.8 Structural and Circuit-Level Features of Designing Basic Cells for Submicron Microcircuits Library -- 5.8.1 Voltage Level Shifters -- 5.8.2 Power Gating Circuits.
5.8.3 Isolation Library Cells for Submicron Microcircuits -- 5.8.4 ``Always-on´´ Buffers -- 5.9 Standard PDK Data Files -- 5.10 Standard PDK Current Source Models (CCS) -- 5.11 Methods and Examples of Standard IC Design Tools Adaptation to 90, 65, and 45 Nm Microcircuit Design -- 5.11.1 Synopsys Tutorial (Educational) Design Kit: Capabilities, Applications, and Prospects -- 5.11.2 Synopsys EDK Overview -- 5.11.3 Synopsys Digital Standard Cell Library -- 5.11.4 I/O Standard Cell Library -- 5.11.5 Standard Set of PDK Memory Modules -- 5.11.6 Phase-Locked Loop (PLL) -- 5.11.7 Geography of EDK Applications and Prospects -- 5.12 Contents of Educational Design Kits Provided by IMEC -- References -- Chapter 6: Digital IC and System-on-Chip Design Flows -- 6.1 Choosing the IC Design Flow -- 6.2 System Design Stage -- 6.3 Functional Design Stage (Fig. 6.3) -- 6.4 Logic Design Stage -- 6.5 Physical (Topological) Design Stage -- 6.6 Stage of Physical Verification and Preparation for Production (Fig. 6.6) -- 6.7 Project Certification -- 6.8 SoC Design Flow -- 6.8.1 Trends in the Development of Design Tools -- 6.8.2 SoC Design Methodology -- 6.8.3 SoC Design Flow -- 6.8.4 SoC System Design -- 6.8.5 CAD Software for the System Level -- 6.9 Practical Example of the System-on-Chip Simulation -- 6.9.1 Standard Design Flow of the SoC of Cadence Company -- 6.9.2 Description of the Simulation and Verification Environment -- 6.9.3 Project in the Cadence Incisive Environment -- References -- Chapter 7: Fundamentals of CMOS Microcircuits Logic Design with Reduced Power Consumption -- 7.1 Basics of Low-Power-Driven Logic Synthesis of CMOS Microcircuits -- 7.2 Identification of Power Dissipation Sources in CMOS Microcircuits -- 7.3 Probabilistic Evaluation of Optimization Options by Predicted Switching Activity of IC Nodes.
7.4 Selection of Element Basis for Low-Power CMOS Microcircuit Design -- 7.5 Logic Synthesis of CMOS Microcircuits in the Basis of Library Elements -- 7.6 Power Dissipation-Driven Optimization of Two-Level Logic Circuits -- 7.7 Selection of Basic Gates for Technology-Independent Functional Circuit -- 7.8 Optimization of Multilevel Logic Circuits of Multi-input Gates -- 7.9 Optimization of Multilevel Logic Circuits of Double Input Gates -- 7.10 Technology Mapping -- 7.11 Estimation of Power Consumption of Designed CMOS Microcircuits at Logic and Circuitry Levels -- 7.12 Low-Power CMOS Microcircuit Design Technology with ELS Package -- 7.13 ELS Software Package Architecture -- 7.14 Functional Capabilities of ELS Software Package -- References -- Chapter 8: Fundamentals of Building a Quality Management System for Manufacturing Submicron Integrated Circuits Based on Test ... -- 8.1 Methodology of the Organization of Technological Test Control in the Process of Design and Production of Microelectronic P... -- 8.1.1 Place and Role of Semiconductor Test Structures in the Process of Manufacturing Integrated Circuits -- 8.1.2 Classification of Technological Test Structures -- 8.1.3 Methods of Placing Test Structures on Semiconductor Wafers -- 8.2 Principles of Control of the Process of Manufacturing Chips Using Test Structures -- 8.2.1 Assessment of the Quality of the Process Based on the Method of Interoperative Control of Wafers -- 8.2.2 Typical Composition of the Test Module for Monitoring Production Processes -- 8.2.3 Typical Composition of Test Structures for Quality Control of Submicron ICs -- 8.2.4 Statistical Processing of Measurement Results of Test Structures -- 8.3 Forecasting the IC Yield Based on the Results of the Test Control -- 8.3.1 Features of Simulation of the IC Yield.
8.3.2 Model of Postoperative Separation of Defects in the Technological Process of IC Manufacturing.
Record Nr. UNINA-9910544845303321
Belous A. I (Anatoliĭ Ivanovich)  
Cham, Switzerland : , : Springer, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
High Velocity Microparticles in Space : Influence Mechanisms and Mitigating Effects of Electromagnetic Irradiation / / by Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
High Velocity Microparticles in Space : Influence Mechanisms and Mitigating Effects of Electromagnetic Irradiation / / by Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Edizione [1st ed. 2019.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019
Descrizione fisica 1 online resource (320 pages)
Disciplina 604.7
629.472
Soggetto topico Electronic circuits
Electronics
Microelectronics
Nanotechnology
Circuits and Systems
Electronics and Microelectronics, Instrumentation
ISBN 3-030-04158-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Chapter 1. Problems with Obtaining Materials for the Protection of Integrated Circuits From High-Velocity Streams of Microparticles and Possible Solutions -- Chapter 2. Methods and Equipment for Studying the Processes of Interaction of High-Velocity Streams of Microparticles with Materials -- Chapter 3. Effects of Exposure to High-Velocity Streams of Microparticles -- Chapter 4. Changes in the Structure and Properties of Single- and Multilayer Materials under the Influence of a High-Velocity Stream of Microparticles -- Chapter 5. Special Aspects of the Production Technology for Multilayer Protective Materials used in the Integrated Circuit Packaging -- Chapter 6. Method of Protection From Electromagnetic Radiation -- Chpater 7. Environmental Friendly Method of Production of Nanocomposites and Nanomembranes.
Record Nr. UNINA-9910337628603321
Belous Anatoly  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
High-Speed Digital System Design : Art, Science and Experience / / by Anatoly Belous, Vitali Saladukha
High-Speed Digital System Design : Art, Science and Experience / / by Anatoly Belous, Vitali Saladukha
Autore Belous Anatoly
Edizione [1st ed. 2020.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Descrizione fisica 1 online resource (XXXVII, 933 p. 751 illus., 532 illus. in color.)
Disciplina 621.3815
621.38104
Soggetto topico Electronic circuits
Electronics
Microelectronics
Computer engineering
Internet of things
Embedded computer systems
Circuits and Systems
Electronics and Microelectronics, Instrumentation
Cyber-physical systems, IoT
ISBN 3-030-25409-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Chapter 1. Information And Communication Technologies And Systems Based On Them -- Chapter 2. Wired Interfaces Of High-Speed Electronic Devices -- Chapter 3. Wireless Telecommunication Systems -- Chapter 4. Basic Components Of Telecommunication Systems -- Chapter 5. Specialized Chips For Telecommunication Systems -- Chapter 6. Methods And Means Of Ensuring Interference Resistance Of High-Speed Electronic Devices -- Chapter 7. Basics Of Designing Structures Of Printed Circuit Boards Of High-Speed Electronic Devices -- Chapter 8. Packaging Technologies For Electronic Devices -- Chapter 9. Protection Of High-Speed Electronic Devices From Electromagnetic Interference -- Chapter 10. Power Supply Systems Of High-Speed Electronic Devices -- Chapter 11. Measurement And Analysis Of SHF Devices.
Record Nr. UNINA-9910366591703321
Belous Anatoly  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , [2017]
Descrizione fisica 1 online resource (xiv, 399 pages) : illustrations
Disciplina 629.474
Collana Artech House space technology and applications series
Soggetto topico Space vehicles - Electronic equipment
Soggetto genere / forma Electronic books.
ISBN 1-5231-3258-2
1-63081-468-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Space Microelectronics, Volume 1: Modern Spacecraft Classification, Failure, and Electrical Component Requirements; Contents; Preface; Chapter 1 Modern Spacecraft; 1.1 Space Industry Development; 1.2 Classification of Modern Spacecraft; 1.3 Spacecraft Designs and Structures; 1.4 Spacecraft Onboard Systems; 1.4.1 Classification of Spacecraft Onboard Systems; 1.4.2 Peculiarities of Design of Onboard Information Control Complexes withthe Use of Programmable Logic Microchips; 1.5 Earth Remote Sensing Spacecraft; 1.5.1 ERS Spacecraft of the Russian Federation and the Republic of Belarus
1.5.2 ERS Spacecraft of Ukraine1.5.3 ERS Spacecraft of the United States; 1.5.4 ERS Spacecraft of Fran; 1.5.5 ERS Spacecraft of Japan; 1.5.6 ERS Spacecraft of India; 1.5.7 ERS Spacecraft of China; 1.5.8 ERS Spacecraft of the European Space Agency; 1.5.9 Earth Remote Sensing Spacecraft of Other Countries; 1.6 Earth Remote Sensing Radar Stations; 1.7 The Effect of Space Radiation on SC; 1.8 Micrometeoroid Effect on SC; 1.9 The Problem of Space Debris in Earth Orbit; 1.10 The Use of Microelectronic Technologies for the Development ofSpace Microrocket Engines
1.11 Military and Special-Purpose Spacecraft1.11.1 Missile Early-Warning System; 1.11.2 MEWS Ground-Based Echelon; 1.11.3 Phased Arrays; 1.11.4 MEWS Space Echelon; 1.11.5 Military Reconnaissance Satellites; References; Selected Bibliography; Chapter 2 Launch Vehicle and Spacecraft Failures and Accidents; 2.1 Rocket and Space Technology Safety Issues; 2.2 Analysis of Launch Vehicle Failure Causes; 2.3 Analysis of Spacecraft Failures; 2.4 Analysis of Failure Causes of Rocket and SpaceTechnology Products; 2.5 Trend Analysis of Launch Vehicle Accident Risks in 2000-2009
2.6 Analysis of SC Failure Trends in 2000-20092.7 Analysis of LV and SC Accident Causes in 2000-2009; 2.8 Analysis of Computer System and Software Failures; 2.9 Analysis of Onboard System Failures at the International Space Station in 2000s; 2.10 Methods of Ensuring Onboard Equipment Reliability of Spacecraft of Long-Life Operation; References; Chapter 3 Microwave Electronics for Space and Military Applications; 3.1 Basics of Microwave Electronics; 3.2 Structure and Properties of Gallium Arsenide; 3.3 Comparative Characteristics of GaAs and Si Properties
3.4 Microelectronic Devices Based on GaAs3.4.1 Diodes Based on GaAs; 3.4.2 Field Transistors; 3.5 Heterojunction Bipolar Transistors; 3.6 Optoelectronic Devices on GaAs; 3.6.1 LEDs; 3.6.2 Solar Batteries; 3.7 New Devices on GaAs; 3.8 Condition and Prospects of Development of Monolithic Microwave Integrated Circuits; 3.8.1 Main Spheres of Usage of Monolithic Microwave Integrated Circuits; 3.8.2 Main Materials for MMIC Production; 3.8.3 MMIC Active Elements and Their Reliability; 3.8.4 Advanced MMIC Design and Technology Solutions; 3.9 Basic Areas and Peculiarities of GaAs MMIC Application
Record Nr. UNINA-9910480037303321
Belous Anatoly  
Norwood : , : Artech House, , [2017]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , [2017]
Descrizione fisica 1 online resource (xiv, 399 pages) : illustrations
Disciplina 629.474
Collana Artech House space technology and applications series
Soggetto topico Space vehicles - Electronic equipment
ISBN 1-5231-3258-2
1-63081-468-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Space Microelectronics, Volume 1: Modern Spacecraft Classification, Failure, and Electrical Component Requirements; Contents; Preface; Chapter 1 Modern Spacecraft; 1.1 Space Industry Development; 1.2 Classification of Modern Spacecraft; 1.3 Spacecraft Designs and Structures; 1.4 Spacecraft Onboard Systems; 1.4.1 Classification of Spacecraft Onboard Systems; 1.4.2 Peculiarities of Design of Onboard Information Control Complexes withthe Use of Programmable Logic Microchips; 1.5 Earth Remote Sensing Spacecraft; 1.5.1 ERS Spacecraft of the Russian Federation and the Republic of Belarus
1.5.2 ERS Spacecraft of Ukraine1.5.3 ERS Spacecraft of the United States; 1.5.4 ERS Spacecraft of Fran; 1.5.5 ERS Spacecraft of Japan; 1.5.6 ERS Spacecraft of India; 1.5.7 ERS Spacecraft of China; 1.5.8 ERS Spacecraft of the European Space Agency; 1.5.9 Earth Remote Sensing Spacecraft of Other Countries; 1.6 Earth Remote Sensing Radar Stations; 1.7 The Effect of Space Radiation on SC; 1.8 Micrometeoroid Effect on SC; 1.9 The Problem of Space Debris in Earth Orbit; 1.10 The Use of Microelectronic Technologies for the Development ofSpace Microrocket Engines
1.11 Military and Special-Purpose Spacecraft1.11.1 Missile Early-Warning System; 1.11.2 MEWS Ground-Based Echelon; 1.11.3 Phased Arrays; 1.11.4 MEWS Space Echelon; 1.11.5 Military Reconnaissance Satellites; References; Selected Bibliography; Chapter 2 Launch Vehicle and Spacecraft Failures and Accidents; 2.1 Rocket and Space Technology Safety Issues; 2.2 Analysis of Launch Vehicle Failure Causes; 2.3 Analysis of Spacecraft Failures; 2.4 Analysis of Failure Causes of Rocket and SpaceTechnology Products; 2.5 Trend Analysis of Launch Vehicle Accident Risks in 2000-2009
2.6 Analysis of SC Failure Trends in 2000-20092.7 Analysis of LV and SC Accident Causes in 2000-2009; 2.8 Analysis of Computer System and Software Failures; 2.9 Analysis of Onboard System Failures at the International Space Station in 2000s; 2.10 Methods of Ensuring Onboard Equipment Reliability of Spacecraft of Long-Life Operation; References; Chapter 3 Microwave Electronics for Space and Military Applications; 3.1 Basics of Microwave Electronics; 3.2 Structure and Properties of Gallium Arsenide; 3.3 Comparative Characteristics of GaAs and Si Properties
3.4 Microelectronic Devices Based on GaAs3.4.1 Diodes Based on GaAs; 3.4.2 Field Transistors; 3.5 Heterojunction Bipolar Transistors; 3.6 Optoelectronic Devices on GaAs; 3.6.1 LEDs; 3.6.2 Solar Batteries; 3.7 New Devices on GaAs; 3.8 Condition and Prospects of Development of Monolithic Microwave Integrated Circuits; 3.8.1 Main Spheres of Usage of Monolithic Microwave Integrated Circuits; 3.8.2 Main Materials for MMIC Production; 3.8.3 MMIC Active Elements and Their Reliability; 3.8.4 Advanced MMIC Design and Technology Solutions; 3.9 Basic Areas and Peculiarities of GaAs MMIC Application
Record Nr. UNINA-9910796810803321
Belous Anatoly  
Norwood : , : Artech House, , [2017]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space Microelectronics . Volume 1 : Modern Spacecraft Classification, Failure, and Electrical Component Requirements / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , [2017]
Descrizione fisica 1 online resource (xiv, 399 pages) : illustrations
Disciplina 629.474
Collana Artech House space technology and applications series
Soggetto topico Space vehicles - Electronic equipment
ISBN 1-5231-3258-2
1-63081-468-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Space Microelectronics, Volume 1: Modern Spacecraft Classification, Failure, and Electrical Component Requirements; Contents; Preface; Chapter 1 Modern Spacecraft; 1.1 Space Industry Development; 1.2 Classification of Modern Spacecraft; 1.3 Spacecraft Designs and Structures; 1.4 Spacecraft Onboard Systems; 1.4.1 Classification of Spacecraft Onboard Systems; 1.4.2 Peculiarities of Design of Onboard Information Control Complexes withthe Use of Programmable Logic Microchips; 1.5 Earth Remote Sensing Spacecraft; 1.5.1 ERS Spacecraft of the Russian Federation and the Republic of Belarus
1.5.2 ERS Spacecraft of Ukraine1.5.3 ERS Spacecraft of the United States; 1.5.4 ERS Spacecraft of Fran; 1.5.5 ERS Spacecraft of Japan; 1.5.6 ERS Spacecraft of India; 1.5.7 ERS Spacecraft of China; 1.5.8 ERS Spacecraft of the European Space Agency; 1.5.9 Earth Remote Sensing Spacecraft of Other Countries; 1.6 Earth Remote Sensing Radar Stations; 1.7 The Effect of Space Radiation on SC; 1.8 Micrometeoroid Effect on SC; 1.9 The Problem of Space Debris in Earth Orbit; 1.10 The Use of Microelectronic Technologies for the Development ofSpace Microrocket Engines
1.11 Military and Special-Purpose Spacecraft1.11.1 Missile Early-Warning System; 1.11.2 MEWS Ground-Based Echelon; 1.11.3 Phased Arrays; 1.11.4 MEWS Space Echelon; 1.11.5 Military Reconnaissance Satellites; References; Selected Bibliography; Chapter 2 Launch Vehicle and Spacecraft Failures and Accidents; 2.1 Rocket and Space Technology Safety Issues; 2.2 Analysis of Launch Vehicle Failure Causes; 2.3 Analysis of Spacecraft Failures; 2.4 Analysis of Failure Causes of Rocket and SpaceTechnology Products; 2.5 Trend Analysis of Launch Vehicle Accident Risks in 2000-2009
2.6 Analysis of SC Failure Trends in 2000-20092.7 Analysis of LV and SC Accident Causes in 2000-2009; 2.8 Analysis of Computer System and Software Failures; 2.9 Analysis of Onboard System Failures at the International Space Station in 2000s; 2.10 Methods of Ensuring Onboard Equipment Reliability of Spacecraft of Long-Life Operation; References; Chapter 3 Microwave Electronics for Space and Military Applications; 3.1 Basics of Microwave Electronics; 3.2 Structure and Properties of Gallium Arsenide; 3.3 Comparative Characteristics of GaAs and Si Properties
3.4 Microelectronic Devices Based on GaAs3.4.1 Diodes Based on GaAs; 3.4.2 Field Transistors; 3.5 Heterojunction Bipolar Transistors; 3.6 Optoelectronic Devices on GaAs; 3.6.1 LEDs; 3.6.2 Solar Batteries; 3.7 New Devices on GaAs; 3.8 Condition and Prospects of Development of Monolithic Microwave Integrated Circuits; 3.8.1 Main Spheres of Usage of Monolithic Microwave Integrated Circuits; 3.8.2 Main Materials for MMIC Production; 3.8.3 MMIC Active Elements and Their Reliability; 3.8.4 Advanced MMIC Design and Technology Solutions; 3.9 Basic Areas and Peculiarities of GaAs MMIC Application
Record Nr. UNINA-9910809940103321
Belous Anatoly  
Norwood : , : Artech House, , [2017]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , 2017
Descrizione fisica 1 online resource (xxiv, 604 pages)
Disciplina 621.3815
Collana Artech house space technology and applications series
Soggetto topico Electronic circuit design
Soggetto genere / forma Electronic books.
ISBN 1-5231-3259-0
1-63081-469-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro; Space Microelectronics Volume 2: Integrated Circuit Design for Space Applications; Introduction; Preface; Chapter 1 Considerations for Selection and Application of Foreign Electronic Component Bases in Designing Domestic Spacecraft; 1.1 General Problems of ECB Selection for REE of Space Application; 1.2 Restriction on Export of Foreign-Made Electronic Components to Russia; 1.2.1 Restriction of ECB Exports from the United States; 1.2.2 Restriction on ECB Exports from Europe and Other Countries; 1.2.3 International Export Control Organizations
1.3 Peculiarities of Application of Foreign-Made Industrial ECB in Rocket and Space Technology1.4 Counterfeit Microelectronic Products and Methods of Their Detection; 1.4.1 Types of Counterfeit Components; 1.4.2 Effective Methods of Detecting Counterfeit Products; 1.4.3 Electric Testing of Microelectronic Products for Space Application; 1.5 Peculiarities of Selection and Application of Foreign Processors in Domestic Spacecraft; 1.5.1 Application Aspects of Foreign Processors in Domestic Spacecraft; 1.5.2 Versions and Qualifications of UT 699 and GR 712 Microprocessors
1.5.3 Architecture and Hardware Features of UT 699 and GR 712 Microprocessors of Leon 3FT Family1.5.4 Peculiarities of Microprocessor Leon 3 Programming; 1.6 Radiation-Tolerant DC Converters for Space and Military Applications; 1.6.1 Total Ionizing Dose (TID); 1.6.2 Enhanced Low-Dose Rate Sensitivity (ELDRS); 1.6.3 Single Event Effects (SEE); 1.6.4 Analysis of Parameter Limits in Worst-Case Scenarios; 1.6.5 MIL-PRF-38534 Standard Class K Requirements; 1.6.6 Absence of Optocouplers in Hybrid DC-DC Converters
1.7 Best Practices of Work Arrangement for Producing Electronic Components of Space System On-Board Equipment1.8 Accelerated Reliability Testing of ECB SA; 1.9 Analysis of Test Results for Microcircuits Purchased in Russia Between 2009 and 2011; References; Chapter 2 Peculiarities of the Technological Process of Production and Basic Constructions of Submicron Transistors and Schottky Diodes; 2.1 On the Terminology of Submicron Microelectronics; 2.2 Tendencies and Perspectives of Modern Technology Development in Microelectronics; 2.2.1 Scaling Problem
2.2.2 Modern Submicron Technology: An Example of Its Implementation for Microprocessor Production2.3 Peculiarities of Submicron MOS Transistors; 2.3.1 MOS Transistors Structures in VLSIC; 2.3.2 Methods to Improve MOS Transistor Properties; 2.3.3 MOS Transistors with the Structure Silicon on Insulator; 2.3.4 Transistors with Double, Triple, and Cylindrical Gates; 2.3.5 Other Types of Transistor Structures; 2.3.6 The Peculiarities of Transistors for Analog Applications; 2.4 Constructional-Technological Peculiarities of High-Temperature Schottky Diodes
Altri titoli varianti Integrated circuit design for space applications
Record Nr. UNINA-9910480720603321
Belous Anatoly  
Norwood : , : Artech House, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , 2017
Descrizione fisica 1 online resource (xxiv, 604 pages)
Disciplina 621.3815
Collana Artech house space technology and applications series
Soggetto topico Electronic circuit design
ISBN 1-5231-3259-0
1-63081-469-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro; Space Microelectronics Volume 2: Integrated Circuit Design for Space Applications; Introduction; Preface; Chapter 1 Considerations for Selection and Application of Foreign Electronic Component Bases in Designing Domestic Spacecraft; 1.1 General Problems of ECB Selection for REE of Space Application; 1.2 Restriction on Export of Foreign-Made Electronic Components to Russia; 1.2.1 Restriction of ECB Exports from the United States; 1.2.2 Restriction on ECB Exports from Europe and Other Countries; 1.2.3 International Export Control Organizations
1.3 Peculiarities of Application of Foreign-Made Industrial ECB in Rocket and Space Technology1.4 Counterfeit Microelectronic Products and Methods of Their Detection; 1.4.1 Types of Counterfeit Components; 1.4.2 Effective Methods of Detecting Counterfeit Products; 1.4.3 Electric Testing of Microelectronic Products for Space Application; 1.5 Peculiarities of Selection and Application of Foreign Processors in Domestic Spacecraft; 1.5.1 Application Aspects of Foreign Processors in Domestic Spacecraft; 1.5.2 Versions and Qualifications of UT 699 and GR 712 Microprocessors
1.5.3 Architecture and Hardware Features of UT 699 and GR 712 Microprocessors of Leon 3FT Family1.5.4 Peculiarities of Microprocessor Leon 3 Programming; 1.6 Radiation-Tolerant DC Converters for Space and Military Applications; 1.6.1 Total Ionizing Dose (TID); 1.6.2 Enhanced Low-Dose Rate Sensitivity (ELDRS); 1.6.3 Single Event Effects (SEE); 1.6.4 Analysis of Parameter Limits in Worst-Case Scenarios; 1.6.5 MIL-PRF-38534 Standard Class K Requirements; 1.6.6 Absence of Optocouplers in Hybrid DC-DC Converters
1.7 Best Practices of Work Arrangement for Producing Electronic Components of Space System On-Board Equipment1.8 Accelerated Reliability Testing of ECB SA; 1.9 Analysis of Test Results for Microcircuits Purchased in Russia Between 2009 and 2011; References; Chapter 2 Peculiarities of the Technological Process of Production and Basic Constructions of Submicron Transistors and Schottky Diodes; 2.1 On the Terminology of Submicron Microelectronics; 2.2 Tendencies and Perspectives of Modern Technology Development in Microelectronics; 2.2.1 Scaling Problem
2.2.2 Modern Submicron Technology: An Example of Its Implementation for Microprocessor Production2.3 Peculiarities of Submicron MOS Transistors; 2.3.1 MOS Transistors Structures in VLSIC; 2.3.2 Methods to Improve MOS Transistor Properties; 2.3.3 MOS Transistors with the Structure Silicon on Insulator; 2.3.4 Transistors with Double, Triple, and Cylindrical Gates; 2.3.5 Other Types of Transistor Structures; 2.3.6 The Peculiarities of Transistors for Analog Applications; 2.4 Constructional-Technological Peculiarities of High-Temperature Schottky Diodes
Altri titoli varianti Integrated circuit design for space applications
Record Nr. UNINA-9910796811103321
Belous Anatoly  
Norwood : , : Artech House, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Space microelectronics. . Volume 2 Integrated circuit design for space applications / / Anatoly Belous, Vitali Saladukha, Siarhei Shvedau
Autore Belous Anatoly
Pubbl/distr/stampa Norwood : , : Artech House, , 2017
Descrizione fisica 1 online resource (xxiv, 604 pages)
Disciplina 621.3815
Collana Artech house space technology and applications series
Soggetto topico Electronic circuit design
ISBN 1-5231-3259-0
1-63081-469-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro; Space Microelectronics Volume 2: Integrated Circuit Design for Space Applications; Introduction; Preface; Chapter 1 Considerations for Selection and Application of Foreign Electronic Component Bases in Designing Domestic Spacecraft; 1.1 General Problems of ECB Selection for REE of Space Application; 1.2 Restriction on Export of Foreign-Made Electronic Components to Russia; 1.2.1 Restriction of ECB Exports from the United States; 1.2.2 Restriction on ECB Exports from Europe and Other Countries; 1.2.3 International Export Control Organizations
1.3 Peculiarities of Application of Foreign-Made Industrial ECB in Rocket and Space Technology1.4 Counterfeit Microelectronic Products and Methods of Their Detection; 1.4.1 Types of Counterfeit Components; 1.4.2 Effective Methods of Detecting Counterfeit Products; 1.4.3 Electric Testing of Microelectronic Products for Space Application; 1.5 Peculiarities of Selection and Application of Foreign Processors in Domestic Spacecraft; 1.5.1 Application Aspects of Foreign Processors in Domestic Spacecraft; 1.5.2 Versions and Qualifications of UT 699 and GR 712 Microprocessors
1.5.3 Architecture and Hardware Features of UT 699 and GR 712 Microprocessors of Leon 3FT Family1.5.4 Peculiarities of Microprocessor Leon 3 Programming; 1.6 Radiation-Tolerant DC Converters for Space and Military Applications; 1.6.1 Total Ionizing Dose (TID); 1.6.2 Enhanced Low-Dose Rate Sensitivity (ELDRS); 1.6.3 Single Event Effects (SEE); 1.6.4 Analysis of Parameter Limits in Worst-Case Scenarios; 1.6.5 MIL-PRF-38534 Standard Class K Requirements; 1.6.6 Absence of Optocouplers in Hybrid DC-DC Converters
1.7 Best Practices of Work Arrangement for Producing Electronic Components of Space System On-Board Equipment1.8 Accelerated Reliability Testing of ECB SA; 1.9 Analysis of Test Results for Microcircuits Purchased in Russia Between 2009 and 2011; References; Chapter 2 Peculiarities of the Technological Process of Production and Basic Constructions of Submicron Transistors and Schottky Diodes; 2.1 On the Terminology of Submicron Microelectronics; 2.2 Tendencies and Perspectives of Modern Technology Development in Microelectronics; 2.2.1 Scaling Problem
2.2.2 Modern Submicron Technology: An Example of Its Implementation for Microprocessor Production2.3 Peculiarities of Submicron MOS Transistors; 2.3.1 MOS Transistors Structures in VLSIC; 2.3.2 Methods to Improve MOS Transistor Properties; 2.3.3 MOS Transistors with the Structure Silicon on Insulator; 2.3.4 Transistors with Double, Triple, and Cylindrical Gates; 2.3.5 Other Types of Transistor Structures; 2.3.6 The Peculiarities of Transistors for Analog Applications; 2.4 Constructional-Technological Peculiarities of High-Temperature Schottky Diodes
Altri titoli varianti Integrated circuit design for space applications
Record Nr. UNINA-9910825161103321
Belous Anatoly  
Norwood : , : Artech House, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Viruses, Hardware and Software Trojans : Attacks and Countermeasures / / by Anatoly Belous, Vitali Saladukha
Viruses, Hardware and Software Trojans : Attacks and Countermeasures / / by Anatoly Belous, Vitali Saladukha
Autore Belous Anatoly
Edizione [1st ed. 2020.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Descrizione fisica 1 online resource (839 pages)
Disciplina 005.8
621.3815
Soggetto topico Electronic circuits
Computer engineering
Internet of things
Embedded computer systems
Microprocessors
Circuits and Systems
Cyber-physical systems, IoT
Processor Architectures
ISBN 3-030-47218-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- Information weapon: concepts, means, methods and examples of application -- Computer Viruses, Malicious Logic and Spyware -- Hardware Trojans in Electronic Devices -- Hardware Trojans in Microcircuits -- Methods of Identification of Hardware Trojans in Integrated Circuits -- Reverse Engineering of Integrated Circuits -- Methods of counteracting hardware IC Trojans -- Is the Trojan phenomenon a new stage in the evolution of modern weapons?.
Record Nr. UNINA-9910407732303321
Belous Anatoly  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui