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On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev
| On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev |
| Autore | Rumiantsev Andrej |
| Pubbl/distr/stampa | Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] |
| Descrizione fisica | 1 online resource (278 pages) |
| Disciplina | 621.38152 |
| Collana | River publishers series in electronic materials and devices |
| Soggetto topico | Semiconductors - Characterization |
| Soggetto genere / forma | Electronic books. |
| ISBN | 87-7022-111-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910478905803321 |
Rumiantsev Andrej
|
||
| Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev
| On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev |
| Autore | Rumiantsev Andrej |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] |
| Descrizione fisica | 1 online resource (278 pages) |
| Disciplina | 621.38152 |
| Collana | River publishers series in electronic materials and devices |
| Soggetto topico | Semiconductors - Characterization |
| ISBN |
1-00-333899-2
1-003-33899-2 1-000-79285-4 87-7022-111-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910793777703321 |
|
Rumiantsev Andrej
|
||
| Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev
| On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev |
| Autore | Rumiantsev Andrej |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] |
| Descrizione fisica | 1 online resource (278 pages) |
| Disciplina | 621.38152 |
| Collana | River publishers series in electronic materials and devices |
| Soggetto topico | Semiconductors - Characterization |
| ISBN |
1-00-333899-2
1-003-33899-2 1-000-79285-4 87-7022-111-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910810030503321 |
|
Rumiantsev Andrej
|
||
| Gistrup, Denmark ; ; Delft, Netherlands : , : River Publishers, , [2019] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||