Charge Transport in Low Dimensional Semiconductor Structures [[electronic resource] ] : The Maximum Entropy Approach / / by Vito Dario Camiola, Giovanni Mascali, Vittorio Romano |
Autore | Camiola Vito Dario |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
Descrizione fisica | 1 online resource (XVI, 337 p. 83 illus., 23 illus. in color.) |
Disciplina | 621.3815284 |
Collana | The European Consortium for Mathematics in Industry |
Soggetto topico |
Mathematical physics
Applied mathematics Engineering mathematics Nanotechnology Mathematical Physics Theoretical, Mathematical and Computational Physics Mathematical and Computational Engineering |
ISBN | 3-030-35993-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Band Structure and Boltzmann Equation -- Maximum Entropy Principle -- Application of MEP to Charge Transport in Semiconductors -- Application of MEP to Silicon -- Some Formal Properties of the Hydrodynamical Model -- Quantum Corrections to the Semiclassical Models -- Mathematical Models for the Double-Gate MOSFET -- Numerical Method and Simulations -- Application of MEP to Charge Transport in Graphene. |
Record Nr. | UNISA-996418193503316 |
Camiola Vito Dario | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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Charge Transport in Low Dimensional Semiconductor Structures : The Maximum Entropy Approach / / by Vito Dario Camiola, Giovanni Mascali, Vittorio Romano |
Autore | Camiola Vito Dario |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
Descrizione fisica | 1 online resource (XVI, 337 p. 83 illus., 23 illus. in color.) |
Disciplina | 621.3815284 |
Collana | The European Consortium for Mathematics in Industry |
Soggetto topico |
Mathematical physics
Applied mathematics Engineering mathematics Nanotechnology Mathematical Physics Theoretical, Mathematical and Computational Physics Mathematical and Computational Engineering |
ISBN | 3-030-35993-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Band Structure and Boltzmann Equation -- Maximum Entropy Principle -- Application of MEP to Charge Transport in Semiconductors -- Application of MEP to Silicon -- Some Formal Properties of the Hydrodynamical Model -- Quantum Corrections to the Semiclassical Models -- Mathematical Models for the Double-Gate MOSFET -- Numerical Method and Simulations -- Application of MEP to Charge Transport in Graphene. |
Record Nr. | UNINA-9910483112403321 |
Camiola Vito Dario | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Progress in Industrial Mathematics at ECMI 2014 / / edited by Giovanni Russo, Vincenzo Capasso, Giuseppe Nicosia, Vittorio Romano |
Edizione | [1st ed. 2016.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
Descrizione fisica | 1 online resource (XXV, 1185 p. 210 illus., 198 illus. in color.) |
Disciplina | 004 |
Collana | The European Consortium for Mathematics in Industry |
Soggetto topico |
Mathematics - Data processing
Mathematical models Computer science - Mathematics Neural networks (Computer science) Engineering mathematics Engineering - Data processing Macroeconomics Computational Science and Engineering Mathematical Modeling and Industrial Mathematics Mathematics of Computing Mathematical Models of Cognitive Processes and Neural Networks Mathematical and Computational Engineering Applications Macroeconomics and Monetary Economics |
ISBN | 3-319-23413-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface -- Part I: Minisymposia -- Part II: Contributed Sessions -- Anile Prize Lecture. |
Record Nr. | UNINA-9910254072703321 |
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Scientific Computing in Electrical Engineering : SCEE 2018, Taormina, Italy, September 2018 / / Giuseppe Nicosia, Vittorio Romano, editors |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2020] |
Descrizione fisica | 1 online resource (XVI, 288 p. 108 illus., 97 illus. in color.) |
Disciplina | 004.0151 |
Collana | The European Consortium for Mathematics in Industry |
Soggetto topico |
Computer science - Mathematics
Mathematical models |
ISBN | 3-030-44101-6 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Computational Electromagnetics -- Device Modeling and Simulation -- Circuit Simulation -- Mathematical and Computational Methods -- Model Order Reduction -- Index. |
Record Nr. | UNISA-996418260703316 |
Cham, Switzerland : , : Springer, , [2020] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
Scientific Computing in Electrical Engineering : SCEE 2018, Taormina, Italy, September 2018 / / Giuseppe Nicosia, Vittorio Romano, editors |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2020] |
Descrizione fisica | 1 online resource (XVI, 288 p. 108 illus., 97 illus. in color.) |
Disciplina | 004.0151 |
Collana | The European Consortium for Mathematics in Industry |
Soggetto topico |
Computer science - Mathematics
Mathematical models |
ISBN | 3-030-44101-6 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Computational Electromagnetics -- Device Modeling and Simulation -- Circuit Simulation -- Mathematical and Computational Methods -- Model Order Reduction -- Index. |
Record Nr. | UNINA-9910484496403321 |
Cham, Switzerland : , : Springer, , [2020] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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