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Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910480349803321 |
Rüeger Jean M
|
||
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910789208203321 |
|
Rüeger Jean M
|
||
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910820311303321 |
|
Rüeger Jean M
|
||
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||