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Optical properties of nanoparticle systems [[electronic resource] ] : Mie and beyond / / Michael Quinten
| Optical properties of nanoparticle systems [[electronic resource] ] : Mie and beyond / / Michael Quinten |
| Autore | Quinten Michael |
| Edizione | [4th ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2011 |
| Descrizione fisica | 1 online resource (504 p.) |
| Disciplina | 535.028 |
| Soggetto topico |
Nanoparticles - Optical properties
Nanophotonics |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-282-88970-2
9786612889707 3-527-63315-4 3-527-63313-8 3-527-63314-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Properties of Nanoparticle Systems; Contents; Preface; 1: Introduction; 2: Nanoparticle Systems and Experimental Optical Observables; 3: Interaction of Light with Matter - The Optical Material Function; 4: Fundamentals of Light Scattering by an Obstacle; 5: Mie ' s Theory for Single Spherical Particles; 6: Application of M ie ' s Theory; 7: Extensions of M ie ' s Theory; 8: Limitations of Mie ' s Theory - Size and Quantum Size Effects in Very Small Nanoparticles; 9: Beyond M ie ' s Theory I - Nonspherical Particles; 10: Beyond Mie ' s Theory II - The Generalized Mie Theory
11: The Generalized Mie Theory Applied to Different Systems12: Densely Packed Systems; 13: Near - Field and SERS; 14: Effective Medium Theories; References; Color Plates; Index |
| Record Nr. | UNINA-9910140907803321 |
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical properties of nanoparticle systems [[electronic resource] ] : Mie and beyond / / Michael Quinten
| Optical properties of nanoparticle systems [[electronic resource] ] : Mie and beyond / / Michael Quinten |
| Autore | Quinten Michael |
| Edizione | [4th ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2011 |
| Descrizione fisica | 1 online resource (504 p.) |
| Disciplina | 535.028 |
| Soggetto topico |
Nanoparticles - Optical properties
Nanophotonics |
| ISBN |
1-282-88970-2
9786612889707 3-527-63315-4 3-527-63313-8 3-527-63314-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Properties of Nanoparticle Systems; Contents; Preface; 1: Introduction; 2: Nanoparticle Systems and Experimental Optical Observables; 3: Interaction of Light with Matter - The Optical Material Function; 4: Fundamentals of Light Scattering by an Obstacle; 5: Mie ' s Theory for Single Spherical Particles; 6: Application of M ie ' s Theory; 7: Extensions of M ie ' s Theory; 8: Limitations of Mie ' s Theory - Size and Quantum Size Effects in Very Small Nanoparticles; 9: Beyond M ie ' s Theory I - Nonspherical Particles; 10: Beyond Mie ' s Theory II - The Generalized Mie Theory
11: The Generalized Mie Theory Applied to Different Systems12: Densely Packed Systems; 13: Near - Field and SERS; 14: Effective Medium Theories; References; Color Plates; Index |
| Record Nr. | UNINA-9910830992803321 |
|
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical properties of nanoparticle systems : Mie and beyond / / Michael Quinten
| Optical properties of nanoparticle systems : Mie and beyond / / Michael Quinten |
| Autore | Quinten Michael |
| Edizione | [4th ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2011 |
| Descrizione fisica | 1 online resource (504 p.) |
| Disciplina | 535.028 |
| Soggetto topico |
Nanoparticles - Optical properties
Nanophotonics |
| ISBN |
1-282-88970-2
9786612889707 3-527-63315-4 3-527-63313-8 3-527-63314-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Properties of Nanoparticle Systems; Contents; Preface; 1: Introduction; 2: Nanoparticle Systems and Experimental Optical Observables; 3: Interaction of Light with Matter - The Optical Material Function; 4: Fundamentals of Light Scattering by an Obstacle; 5: Mie ' s Theory for Single Spherical Particles; 6: Application of M ie ' s Theory; 7: Extensions of M ie ' s Theory; 8: Limitations of Mie ' s Theory - Size and Quantum Size Effects in Very Small Nanoparticles; 9: Beyond M ie ' s Theory I - Nonspherical Particles; 10: Beyond Mie ' s Theory II - The Generalized Mie Theory
11: The Generalized Mie Theory Applied to Different Systems12: Densely Packed Systems; 13: Near - Field and SERS; 14: Effective Medium Theories; References; Color Plates; Index |
| Record Nr. | UNINA-9910877625803321 |
|
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten
| A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten |
| Autore | Quinten Michael |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2013 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 530.42750287 |
| Soggetto topico |
Thin films - Optical properties
Thin films - Measurement Optical measurements |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-299-47599-X
3-527-66437-8 3-527-66434-3 3-527-66435-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
A Practical Guide to Optical Metrology for Thin Films; Contents; Preface; 1 Introduction; 2 Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.5.1 Transmission Gratings; 2.5.1.1 Lamellar Transmission Gratings; 2.5.1.2 Holographic Transmission Gratings; 2.5.2 Reflection Gratings; 2.5.2.1 Lamellar Reflection Gratings; 2.5.2.2 Blazed Gratings; 2.5.2.3 Holographic Gratings; 2.6 Scattering
2.7 Dielectric Function and Refractive Index2.7.1 Models for the Dielectric Function; 2.7.2 Kramers-Kronig Analysis of Dielectric Functions; 2.7.3 Empiric Formulas for the Refractive Index; 2.7.4 EMA Models; 3 Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.1.1 Coherent Superposition of Reflected Light; 3.1.2 Influence of Absorption on the Layer; 3.1.3 Partial Incoherence due to Thick Substrates; 3.1.4 Partial Incoherence due to Roughness; 3.1.5 Coherent Superposition of Transmitted Light 3.2 Propagating Wave Model for a Layer Stack3.2.1 Coherent Reflectance and Transmittance of a Layer Stack; 3.2.2 Consideration of Incoherent Substrates; 3.2.3 Consideration of Surface Roughness; 3.2.4 r-t-ø Model for a Layer Stack; 4 The Optical Measurement; 4.1 Spectral Reflectance and Transmittance Measurement; 4.2 Ellipsometric Measurement; 4.3 Other Optical Methods; 4.3.1 Prism Coupling; 4.3.2 Chromatic Thickness Determination; 4.4 Components for the Optical Measurement; 4.4.1 Light Sources; 4.4.1.1 Halogen Lamps; 4.4.1.2 White Light LED; 4.4.1.3 Superluminescence Diodes 4.4.1.4 Xenon High-Pressure Arc Lamps4.4.1.5 Deuterium Lamps; 4.4.2 Optical Components; 4.4.2.1 Lenses and Mirrors; 4.4.2.2 Polarizers and Analyzers; 4.4.2.3 Optical Retarders; 4.4.3 Optical Fibers; 4.4.4 Miniaturized Spectrometers; 4.4.4.1 Gratings; 4.4.4.2 Detectors; 4.4.4.3 System Properties; 5 Thin-Film Thickness Determination; 5.1 Fast Fourier Transform; 5.1.1 Single Layer; 5.1.2 Layer Stack; 5.1.3 Accuracy, Resolution, Repeatability, and Reproducibility; 5.2 Regression Analysis with χ2-Test; 5.2.1 Method of Thickness Determination 5.2.2 Accuracy, Resolution, Repeatability, and Reproducibility6 The Color of Thin Films; 7 Applications; 7.1 High-Reflection and Antireflection Coatings; 7.1.1 HR Coatings on Metallic Mirrors; 7.1.2 AR Coatings on Glass; 7.1.3 AR Coatings on Solar Wafers; 7.2 Thin Single- and Double-Layer Coatings; 7.2.1 SiO2 on Silicon Wafers; 7.2.2 Si3N4 Hardcoat; 7.2.3 Double-Layer System; 7.2.4 Porous Silicon on Silicon; 7.3 Photoresists and Photolithographic Structuring; 7.4 Thickness of Wafers and Transparent Plastic Films; 7.4.1 Thickness of Semiconductor, Glass, and Sapphire Wafers 7.4.2 Thickness of Transparent Plastic Films |
| Record Nr. | UNINA-9910141393003321 |
|
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten
| A practical guide to optical metrology for thin films [[electronic resource] /] / Michael Quinten |
| Autore | Quinten Michael |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2013 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 530.42750287 |
| Soggetto topico |
Thin films - Optical properties
Thin films - Measurement Optical measurements |
| ISBN |
1-299-47599-X
3-527-66437-8 3-527-66434-3 3-527-66435-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
A Practical Guide to Optical Metrology for Thin Films; Contents; Preface; 1 Introduction; 2 Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.5.1 Transmission Gratings; 2.5.1.1 Lamellar Transmission Gratings; 2.5.1.2 Holographic Transmission Gratings; 2.5.2 Reflection Gratings; 2.5.2.1 Lamellar Reflection Gratings; 2.5.2.2 Blazed Gratings; 2.5.2.3 Holographic Gratings; 2.6 Scattering
2.7 Dielectric Function and Refractive Index2.7.1 Models for the Dielectric Function; 2.7.2 Kramers-Kronig Analysis of Dielectric Functions; 2.7.3 Empiric Formulas for the Refractive Index; 2.7.4 EMA Models; 3 Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.1.1 Coherent Superposition of Reflected Light; 3.1.2 Influence of Absorption on the Layer; 3.1.3 Partial Incoherence due to Thick Substrates; 3.1.4 Partial Incoherence due to Roughness; 3.1.5 Coherent Superposition of Transmitted Light 3.2 Propagating Wave Model for a Layer Stack3.2.1 Coherent Reflectance and Transmittance of a Layer Stack; 3.2.2 Consideration of Incoherent Substrates; 3.2.3 Consideration of Surface Roughness; 3.2.4 r-t-ø Model for a Layer Stack; 4 The Optical Measurement; 4.1 Spectral Reflectance and Transmittance Measurement; 4.2 Ellipsometric Measurement; 4.3 Other Optical Methods; 4.3.1 Prism Coupling; 4.3.2 Chromatic Thickness Determination; 4.4 Components for the Optical Measurement; 4.4.1 Light Sources; 4.4.1.1 Halogen Lamps; 4.4.1.2 White Light LED; 4.4.1.3 Superluminescence Diodes 4.4.1.4 Xenon High-Pressure Arc Lamps4.4.1.5 Deuterium Lamps; 4.4.2 Optical Components; 4.4.2.1 Lenses and Mirrors; 4.4.2.2 Polarizers and Analyzers; 4.4.2.3 Optical Retarders; 4.4.3 Optical Fibers; 4.4.4 Miniaturized Spectrometers; 4.4.4.1 Gratings; 4.4.4.2 Detectors; 4.4.4.3 System Properties; 5 Thin-Film Thickness Determination; 5.1 Fast Fourier Transform; 5.1.1 Single Layer; 5.1.2 Layer Stack; 5.1.3 Accuracy, Resolution, Repeatability, and Reproducibility; 5.2 Regression Analysis with χ2-Test; 5.2.1 Method of Thickness Determination 5.2.2 Accuracy, Resolution, Repeatability, and Reproducibility6 The Color of Thin Films; 7 Applications; 7.1 High-Reflection and Antireflection Coatings; 7.1.1 HR Coatings on Metallic Mirrors; 7.1.2 AR Coatings on Glass; 7.1.3 AR Coatings on Solar Wafers; 7.2 Thin Single- and Double-Layer Coatings; 7.2.1 SiO2 on Silicon Wafers; 7.2.2 Si3N4 Hardcoat; 7.2.3 Double-Layer System; 7.2.4 Porous Silicon on Silicon; 7.3 Photoresists and Photolithographic Structuring; 7.4 Thickness of Wafers and Transparent Plastic Films; 7.4.1 Thickness of Semiconductor, Glass, and Sapphire Wafers 7.4.2 Thickness of Transparent Plastic Films |
| Record Nr. | UNINA-9910830321103321 |
|
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A practical guide to optical metrology for thin films / / Michael Quinten
| A practical guide to optical metrology for thin films / / Michael Quinten |
| Autore | Quinten Michael |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, c2013 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 530.4275 |
| Soggetto topico |
Thin films - Optical properties
Thin films - Measurement Optical measurements |
| ISBN |
1-299-47599-X
3-527-66437-8 3-527-66434-3 3-527-66435-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
A Practical Guide to Optical Metrology for Thin Films; Contents; Preface; 1 Introduction; 2 Propagation of Light and Other Electromagnetic Waves; 2.1 Properties of Electromagnetic Waves; 2.2 Huygens-Fresnel Principle; 2.3 Interference of Electromagnetic Waves; 2.4 Reflection and Refraction; 2.5 Diffraction; 2.5.1 Transmission Gratings; 2.5.1.1 Lamellar Transmission Gratings; 2.5.1.2 Holographic Transmission Gratings; 2.5.2 Reflection Gratings; 2.5.2.1 Lamellar Reflection Gratings; 2.5.2.2 Blazed Gratings; 2.5.2.3 Holographic Gratings; 2.6 Scattering
2.7 Dielectric Function and Refractive Index2.7.1 Models for the Dielectric Function; 2.7.2 Kramers-Kronig Analysis of Dielectric Functions; 2.7.3 Empiric Formulas for the Refractive Index; 2.7.4 EMA Models; 3 Spectral Reflectance and Transmittance of a Layer Stack; 3.1 Reflectance and Transmittance of a Single Layer; 3.1.1 Coherent Superposition of Reflected Light; 3.1.2 Influence of Absorption on the Layer; 3.1.3 Partial Incoherence due to Thick Substrates; 3.1.4 Partial Incoherence due to Roughness; 3.1.5 Coherent Superposition of Transmitted Light 3.2 Propagating Wave Model for a Layer Stack3.2.1 Coherent Reflectance and Transmittance of a Layer Stack; 3.2.2 Consideration of Incoherent Substrates; 3.2.3 Consideration of Surface Roughness; 3.2.4 r-t-ø Model for a Layer Stack; 4 The Optical Measurement; 4.1 Spectral Reflectance and Transmittance Measurement; 4.2 Ellipsometric Measurement; 4.3 Other Optical Methods; 4.3.1 Prism Coupling; 4.3.2 Chromatic Thickness Determination; 4.4 Components for the Optical Measurement; 4.4.1 Light Sources; 4.4.1.1 Halogen Lamps; 4.4.1.2 White Light LED; 4.4.1.3 Superluminescence Diodes 4.4.1.4 Xenon High-Pressure Arc Lamps4.4.1.5 Deuterium Lamps; 4.4.2 Optical Components; 4.4.2.1 Lenses and Mirrors; 4.4.2.2 Polarizers and Analyzers; 4.4.2.3 Optical Retarders; 4.4.3 Optical Fibers; 4.4.4 Miniaturized Spectrometers; 4.4.4.1 Gratings; 4.4.4.2 Detectors; 4.4.4.3 System Properties; 5 Thin-Film Thickness Determination; 5.1 Fast Fourier Transform; 5.1.1 Single Layer; 5.1.2 Layer Stack; 5.1.3 Accuracy, Resolution, Repeatability, and Reproducibility; 5.2 Regression Analysis with χ2-Test; 5.2.1 Method of Thickness Determination 5.2.2 Accuracy, Resolution, Repeatability, and Reproducibility6 The Color of Thin Films; 7 Applications; 7.1 High-Reflection and Antireflection Coatings; 7.1.1 HR Coatings on Metallic Mirrors; 7.1.2 AR Coatings on Glass; 7.1.3 AR Coatings on Solar Wafers; 7.2 Thin Single- and Double-Layer Coatings; 7.2.1 SiO2 on Silicon Wafers; 7.2.2 Si3N4 Hardcoat; 7.2.3 Double-Layer System; 7.2.4 Porous Silicon on Silicon; 7.3 Photoresists and Photolithographic Structuring; 7.4 Thickness of Wafers and Transparent Plastic Films; 7.4.1 Thickness of Semiconductor, Glass, and Sapphire Wafers 7.4.2 Thickness of Transparent Plastic Films |
| Record Nr. | UNINA-9910877006703321 |
|
Quinten Michael
|
||
| Weinheim, : Wiley-VCH, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
A Practical Guide to Surface Metrology / / by Michael Quinten
| A Practical Guide to Surface Metrology / / by Michael Quinten |
| Autore | Quinten Michael |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XXV, 230 p. 156 illus., 100 illus. in color.) |
| Disciplina | 681.25 |
| Collana | Springer Series in Measurement Science and Technology |
| Soggetto topico |
Physical measurements
Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices |
| ISBN | 3-030-29454-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface -- Introduction to Surfaces and Surface Metrology -- Tactile Surface Metrology -- Capacitive And Inductive Surface Metrology -- Optical Surface Metrology- Physical Basics -- Optical Surface Metrology - Methods -- Imaging Methods - Multisensor - Systems - A Versatile Approach To Surface Metrology -- Appendix -- Index. |
| Record Nr. | UNINA-9910373924903321 |
|
Quinten Michael
|
||
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||