A Practical Guide to Surface Metrology / Michael Quinten |
Autore | Quinten, Michael |
Pubbl/distr/stampa | Cham, : Springer, 2019 |
Descrizione fisica | xxv, 230 p. : ill. ; 24 cm |
Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020] 74K35 - Thin films [MSC 2020] 74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020] |
Soggetto non controllato |
Confocal optical profiling
Digital Holographic Microscopy Elastic light scattering Grazing incidence interferometry Light sectional methods Multi-wavelength interferometry Practical surface characterisation Practical surface measurement Scanning nearfield optical microscopy Shearing interferometry Spectral Reflectometry and Ellipsometry Surface optical metrology White light interferometry |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Titolo uniforme | |
Record Nr. | UNICAMPANIA-VAN0214455 |
Quinten, Michael
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Cham, : Springer, 2019 | ||
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Lo trovi qui: Univ. Vanvitelli | ||
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Electromagnetic and light scattering, Theory and applications. Proceedings of the 1st workshop on Electromagnetic and LightScattering, theory and applications, March 18-19, 1996, Bremen, Germany / Thomas Wriedt, Michael Quinten, Klaus Bauckhage, editors |
Pubbl/distr/stampa | Bremen : Universitat Bremen, 1996 |
Descrizione fisica | 146 p. ill. 23 cm |
ISBN | 3-88722-359-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | ita |
Record Nr. | UNINA-990000372460403321 |
Bremen : Universitat Bremen, 1996 | ||
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Lo trovi qui: Univ. Federico II | ||
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