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Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties / / Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties / / Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Incorporated |
| Descrizione fisica | 1 online resource (251 pages) : illustrations |
| Disciplina | 780 |
| Soggetto topico | Materials |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-119-80814-6
1-119-80824-3 1-119-80822-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910555082603321 |
Dahoo Pierre Richard
|
||
| Hoboken, New Jersey : , : John Wiley & Sons, Incorporated | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties / / Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties / / Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Incorporated |
| Descrizione fisica | 1 online resource (251 pages) : illustrations |
| Disciplina | 780 |
| Collana |
Mechanical engineering and solid mechanics series
Reliability of multiphysical systems set |
| Soggetto topico | Metrology |
| ISBN |
1-119-80814-6
1-119-80824-3 1-119-80822-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics. |
| Record Nr. | UNINA-9910830255803321 |
|
Dahoo Pierre Richard
|
||
| Hoboken, New Jersey : , : John Wiley & Sons, Incorporated | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] |
| Descrizione fisica | 1 online resource (279 pages) : illustrations |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-119-81897-4
1-119-81896-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA. |
| Record Nr. | UNINA-9910554855903321 |
|
Dahoo Pierre Richard
|
||
| Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] |
| Descrizione fisica | 1 online resource (279 pages) : illustrations |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN |
1-119-81897-4
1-119-81896-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA. |
| Record Nr. | UNINA-9910829930303321 |
|
Dahoo Pierre Richard
|
||
| Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanometer-scale defect detection using polarized light / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Nanometer-scale defect detection using polarized light / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | London, England ; ; Hoboken, New Jersey : , : ISTE : , : Wiley, , 2016 |
| Descrizione fisica | 1 online resource (320 pages) : illustrations |
| Disciplina | 620.115 |
| Collana |
Mechanical Engineering and Solid Mechanics Series
Reliability of multiphysical systems set |
| Soggetto topico | Nanostructured materials |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-119-32963-9
1-119-32965-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Title Page; Copyright ; Contents; Preface; 1. Uncertainties; 1.1. Introduction; 1.2. The reliability based design approach; 1.2.1. The MC method; 1.2.2. The perturbation method; 1.2.3. The polynomial chaos method; 1.3. The design of experiments method; 1.3.1. Principle; 1.3.2. The Taguchi method; 1.4. The set approach; 1.4.1. The method of intervals; 1.4.2. Fuzzy logic based method; 1.5. Principal component analysis; 1.5.1. Description of the process; 1.5.2. Mathematical roots; 1.5.3. Interpretation of results; 1.6. Conclusions; 2. Reliability-based Design Optimization
2.1. Introduction2.2. Deterministic design optimization; 2.3. Reliability analysis; 2.3.1. Optimal conditions; 2.4. Reliability-based design optimization; 2.4.1. The objective function; 2.4.2. Total cost consideration; 2.4.3. The design variables; 2.4.4. Response of a system by RBDO; 2.4.5. Limit states; 2.4.6. Solution techniques; 2.5. Application: optimization of materials of an electronic circuit board; 2.5.1. Optimization problem; 2.5.2. Optimization and uncertainties; 2.5.3. Results analysis; 2.6. Conclusions; 3. The Wave-Particle Nature of Light; 3.1. Introduction 3.2. The optical wave theory of light according to Huyghens and Fresnel3.2.1. The three postulates of wave optics; 3.2.2. Luminous power and energy; 3.2.3. The monochromatic wave; 3.3. The electromagnetic wave according to Maxwell's theory; 3.3.1. The Maxwell equations; 3.3.2. The wave equation according to the Coulomb's gauge; 3.3.3. The wave equation according to the Lorenz's gauge; 3.4. The quantum theory of light; 3.4.1. The annihilation and creation operators of the harmonic oscillator; 3.4.2. The quantization of the electromagnetic field and the potential vector 3.4.3. Field modes in the second quantization4. The Polarization States of Light; 4.1. Introduction; 4.2. The polarization of light by the matrix method; 4.2.1. The Jones representation of polarization; 4.2.2. The Stokes and Muller representation of polarization; 4.3. Other methods to represent polarization; 4.3.1. The Poincaŕe description of polarization; 4.3.2. The quantum description of polarization; 4.4. Conclusions; 5. Interaction of Light and Matter; 5.1. Introduction; 5.2. Classical models; 5.2.1. The Drude model; 5.2.2. The Sellmeir and Lorentz models 5.3. Quantum models for light and matter5.3.1. The quantum description of matter; 5.3.2. Jaynes-Cummings model; 5.4. Semiclassical models; 5.4.1. Tauc-Lorentz model; 5.4.2. Cody-Lorentz model; 5.5. Conclusions; 6. Experimentation and Theoretical Models; 6.1. Introduction; 6.2. The laser source of polarized light; 6.2.1. Principle of operation of a laser; 6.2.2. The specificities of light from a laser; 6.3. Laser-induced fluorescence; 6.3.1. Principle of the method; 6.3.2. Description of the experimental setup; 6.4. The DR method; 6.4.1. Principle of the method Defects in a heterogeneous medium -- Defects at the interfaces -- Application to nanomaterials. |
| Record Nr. | UNINA-9910137075003321 |
|
Dahoo Pierre Richard
|
||
| London, England ; ; Hoboken, New Jersey : , : ISTE : , : Wiley, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanometer-scale defect detection using polarized light / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Nanometer-scale defect detection using polarized light / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | London, England ; ; Hoboken, New Jersey : , : ISTE : , : Wiley, , 2016 |
| Descrizione fisica | 1 online resource (320 pages) : illustrations |
| Disciplina | 620.115 |
| Collana |
Mechanical Engineering and Solid Mechanics Series
Reliability of multiphysical systems set |
| Soggetto topico | Nanostructured materials |
| ISBN |
1-119-32963-9
1-119-32965-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Title Page; Copyright ; Contents; Preface; 1. Uncertainties; 1.1. Introduction; 1.2. The reliability based design approach; 1.2.1. The MC method; 1.2.2. The perturbation method; 1.2.3. The polynomial chaos method; 1.3. The design of experiments method; 1.3.1. Principle; 1.3.2. The Taguchi method; 1.4. The set approach; 1.4.1. The method of intervals; 1.4.2. Fuzzy logic based method; 1.5. Principal component analysis; 1.5.1. Description of the process; 1.5.2. Mathematical roots; 1.5.3. Interpretation of results; 1.6. Conclusions; 2. Reliability-based Design Optimization
2.1. Introduction2.2. Deterministic design optimization; 2.3. Reliability analysis; 2.3.1. Optimal conditions; 2.4. Reliability-based design optimization; 2.4.1. The objective function; 2.4.2. Total cost consideration; 2.4.3. The design variables; 2.4.4. Response of a system by RBDO; 2.4.5. Limit states; 2.4.6. Solution techniques; 2.5. Application: optimization of materials of an electronic circuit board; 2.5.1. Optimization problem; 2.5.2. Optimization and uncertainties; 2.5.3. Results analysis; 2.6. Conclusions; 3. The Wave-Particle Nature of Light; 3.1. Introduction 3.2. The optical wave theory of light according to Huyghens and Fresnel3.2.1. The three postulates of wave optics; 3.2.2. Luminous power and energy; 3.2.3. The monochromatic wave; 3.3. The electromagnetic wave according to Maxwell's theory; 3.3.1. The Maxwell equations; 3.3.2. The wave equation according to the Coulomb's gauge; 3.3.3. The wave equation according to the Lorenz's gauge; 3.4. The quantum theory of light; 3.4.1. The annihilation and creation operators of the harmonic oscillator; 3.4.2. The quantization of the electromagnetic field and the potential vector 3.4.3. Field modes in the second quantization4. The Polarization States of Light; 4.1. Introduction; 4.2. The polarization of light by the matrix method; 4.2.1. The Jones representation of polarization; 4.2.2. The Stokes and Muller representation of polarization; 4.3. Other methods to represent polarization; 4.3.1. The Poincaŕe description of polarization; 4.3.2. The quantum description of polarization; 4.4. Conclusions; 5. Interaction of Light and Matter; 5.1. Introduction; 5.2. Classical models; 5.2.1. The Drude model; 5.2.2. The Sellmeir and Lorentz models 5.3. Quantum models for light and matter5.3.1. The quantum description of matter; 5.3.2. Jaynes-Cummings model; 5.4. Semiclassical models; 5.4.1. Tauc-Lorentz model; 5.4.2. Cody-Lorentz model; 5.5. Conclusions; 6. Experimentation and Theoretical Models; 6.1. Introduction; 6.2. The laser source of polarized light; 6.2.1. Principle of operation of a laser; 6.2.2. The specificities of light from a laser; 6.3. Laser-induced fluorescence; 6.3.1. Principle of the method; 6.3.2. Description of the experimental setup; 6.4. The DR method; 6.4.1. Principle of the method Defects in a heterogeneous medium -- Defects at the interfaces -- Application to nanomaterials. |
| Record Nr. | UNINA-9910830936703321 |
|
Dahoo Pierre Richard
|
||
| London, England ; ; Hoboken, New Jersey : , : ISTE : , : Wiley, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||