Accomplishments in nanotechnology / / Michael T. Postek, Joseph Kopanski, David Wollman
| Accomplishments in nanotechnology / / Michael T. Postek, Joseph Kopanski, David Wollman |
| Autore | Postek Michael T |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2006 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
KopanskiJoseph
PostekMichael T WollmanDavid |
| Collana | NIST special publication |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709540703321 |
Postek Michael T
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2006 | ||
| Lo trovi qui: Univ. Federico II | ||
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Low accelerating voltage pitch standard based on the modification of NBS SRM 484 / / Michael T. Postek
| Low accelerating voltage pitch standard based on the modification of NBS SRM 484 / / Michael T. Postek |
| Autore | Postek Michael T |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1987 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | PostekMichael T |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709904903321 |
Postek Michael T
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1987 | ||
| Lo trovi qui: Univ. Federico II | ||
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Shape-sensitive linewidth measurements of resist structures : LITG410I project / / John S. Villarrubia; Andras E. Vladar; Michael T. Postek
| Shape-sensitive linewidth measurements of resist structures : LITG410I project / / John S. Villarrubia; Andras E. Vladar; Michael T. Postek |
| Autore | Villarrubia John S |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
PostekMichael T
VillarrubiaJohn S VladárAndrás E |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Shape-sensitive linewidth measurements of resist structures |
| Record Nr. | UNINA-9910710774703321 |
Villarrubia John S
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
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