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Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Pubbl/distr/stampa Weinheim, : Wiley-VCH
Descrizione fisica 1 online resource (521 p.)
Disciplina 537.6223
621.38152
Altri autori (Persone) PiprekJoachim
Soggetto topico Semiconductors
Nitrides
Soggetto genere / forma Electronic books.
ISBN 1-280-92162-5
9786610921621
3-527-61072-3
3-527-61071-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Nitride Semiconductor Devices: Principles and Simulation; Contents; Preface; List of Contributors; Part 1 Material Properties; 1 Introduction; 1.1 A Brief History; 1.2 Unique Material Properties; 1.3 Thermal Parameters; References; 2 Electron Bandstructure Parameters; 2.1 Introduction; 2.2 Band Structure Models; 2.3 Band Parameters; 2.3.1 GaN; 2.3.2 AlN; 2.3.3 InN; 2.3.4 AlGaN; 2.3.5 InGaN; 2.3.6 InAlN; 2.3.7 AlGaInN; 2.3.8 Band Offsets; 2.4 Conclusions; References; 3 Spontaneous and Piezoelectric Polarization: Basic Theory vs. Practical Recipes
3.1 Why Spontaneous Polarization in III-V Nitrides?3.2 Theoretical Prediction of Polarization Properties in AlN, GaN and InN; 3.3 Piezoelectric and Pyroelectric Effects in III-V Nitrides Nanostructures; 3.4 Polarization Properties in Ternary and Quaternary Alloys: Nonlinear Compositional Dependence and Order vs. Disorder Effects; 3.5 Orientational Dependence of Polarization; References; 4 Transport Parameters for Electrons and Holes; 4.1 Introduction; 4.2 Numerical Simulation Model; 4.2.1 Scattering in the Semi-Classical Boltzmann Equation; 4.3 Analytical Models for the Transport Parameters
4.4 GaN Transport Parameters4.4.1 Electron Transport Coefficients; 4.4.2 Hole Transport Coefficients; 4.5 AlN Transport Parameters; 4.5.1 Electron Transport Coefficients; 4.5.2 Hole Transport Coefficients; 4.6 InN Transport Parameters; 4.6.1 Electron Transport Coefficients; 4.6.2 Hole Transport Coefficients; 4.7 Conclusions; References; 5 Optical Constants of Bulk Nitrides; 5.1 Introduction; 5.2 Dielectric Function and Band Structure; 5.2.1 Fundamental Relations; 5.2.2 Valence Band Ordering, Optical Selection Rules and Anisotropy; 5.3 Experimental Results; 5.3.1 InN; 5.3.2 GaN and AlN
5.3.3 AlGaN Alloys5.3.4 In-rich InGaN and InAlN Alloys; 5.4 Modeling of the Dielectric Function; 5.4.1 Analytical Representation of the Dielectric Function; 5.4.2 Calculation of the Dielectric Function for Alloys; 5.4.3 Influence of Electric Fields on the Dielectric Function; References; 6 Intersubband Absorption in AlGaN/GaN Quantum Wells; 6.1 Introduction; 6.2 Theoretical Model; 6.2.1 Spontaneous and Piezoelectric Polarization; 6.3 Numerical Implementation; 6.3.1 Achieving Self-consistency: The Under-Relaxation Method; 6.3.2 Predictor-Corrector Approach
6.4 Absorption Energy in AlGaN-GaN MQWs6.4.1 Numerical Analysis of Periodic AlGaN-GaN MQWs; 6.4.2 Numerical Analysis of Non-periodic AlGaN-GaN MQWs and Comparison with Experimental Results; 6.5 Conclusions; References; 7 Interband Transitions in InGaN Quantum Wells; 7.1 Introduction; 7.2 Theory; 7.2.1 Bandstructure and Wavefunctions; 7.2.2 Semiconductor Bloch Equations; 7.2.3 Semiconductor Luminescence Equations; 7.2.4 Auger Recombination Processes; 7.3 Theory-Experiment Gain Comparison; 7.4 Absorption/Gain; 7.4.1 General Trends; 7.4.2 Structural Dependence; 7.5 Spontaneous Emission
7.6 Auger Recombinations
Record Nr. UNINA-9910144575503321
Weinheim, : Wiley-VCH
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Pubbl/distr/stampa Weinheim, : Wiley-VCH
Descrizione fisica 1 online resource (521 p.)
Disciplina 537.6223
621.38152
Altri autori (Persone) PiprekJoachim
Soggetto topico Semiconductors
Nitrides
ISBN 1-280-92162-5
9786610921621
3-527-61072-3
3-527-61071-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Nitride Semiconductor Devices: Principles and Simulation; Contents; Preface; List of Contributors; Part 1 Material Properties; 1 Introduction; 1.1 A Brief History; 1.2 Unique Material Properties; 1.3 Thermal Parameters; References; 2 Electron Bandstructure Parameters; 2.1 Introduction; 2.2 Band Structure Models; 2.3 Band Parameters; 2.3.1 GaN; 2.3.2 AlN; 2.3.3 InN; 2.3.4 AlGaN; 2.3.5 InGaN; 2.3.6 InAlN; 2.3.7 AlGaInN; 2.3.8 Band Offsets; 2.4 Conclusions; References; 3 Spontaneous and Piezoelectric Polarization: Basic Theory vs. Practical Recipes
3.1 Why Spontaneous Polarization in III-V Nitrides?3.2 Theoretical Prediction of Polarization Properties in AlN, GaN and InN; 3.3 Piezoelectric and Pyroelectric Effects in III-V Nitrides Nanostructures; 3.4 Polarization Properties in Ternary and Quaternary Alloys: Nonlinear Compositional Dependence and Order vs. Disorder Effects; 3.5 Orientational Dependence of Polarization; References; 4 Transport Parameters for Electrons and Holes; 4.1 Introduction; 4.2 Numerical Simulation Model; 4.2.1 Scattering in the Semi-Classical Boltzmann Equation; 4.3 Analytical Models for the Transport Parameters
4.4 GaN Transport Parameters4.4.1 Electron Transport Coefficients; 4.4.2 Hole Transport Coefficients; 4.5 AlN Transport Parameters; 4.5.1 Electron Transport Coefficients; 4.5.2 Hole Transport Coefficients; 4.6 InN Transport Parameters; 4.6.1 Electron Transport Coefficients; 4.6.2 Hole Transport Coefficients; 4.7 Conclusions; References; 5 Optical Constants of Bulk Nitrides; 5.1 Introduction; 5.2 Dielectric Function and Band Structure; 5.2.1 Fundamental Relations; 5.2.2 Valence Band Ordering, Optical Selection Rules and Anisotropy; 5.3 Experimental Results; 5.3.1 InN; 5.3.2 GaN and AlN
5.3.3 AlGaN Alloys5.3.4 In-rich InGaN and InAlN Alloys; 5.4 Modeling of the Dielectric Function; 5.4.1 Analytical Representation of the Dielectric Function; 5.4.2 Calculation of the Dielectric Function for Alloys; 5.4.3 Influence of Electric Fields on the Dielectric Function; References; 6 Intersubband Absorption in AlGaN/GaN Quantum Wells; 6.1 Introduction; 6.2 Theoretical Model; 6.2.1 Spontaneous and Piezoelectric Polarization; 6.3 Numerical Implementation; 6.3.1 Achieving Self-consistency: The Under-Relaxation Method; 6.3.2 Predictor-Corrector Approach
6.4 Absorption Energy in AlGaN-GaN MQWs6.4.1 Numerical Analysis of Periodic AlGaN-GaN MQWs; 6.4.2 Numerical Analysis of Non-periodic AlGaN-GaN MQWs and Comparison with Experimental Results; 6.5 Conclusions; References; 7 Interband Transitions in InGaN Quantum Wells; 7.1 Introduction; 7.2 Theory; 7.2.1 Bandstructure and Wavefunctions; 7.2.2 Semiconductor Bloch Equations; 7.2.3 Semiconductor Luminescence Equations; 7.2.4 Auger Recombination Processes; 7.3 Theory-Experiment Gain Comparison; 7.4 Absorption/Gain; 7.4.1 General Trends; 7.4.2 Structural Dependence; 7.5 Spontaneous Emission
7.6 Auger Recombinations
Record Nr. UNINA-9910830164503321
Weinheim, : Wiley-VCH
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Nitride semiconductor devices [[electronic resource] ] : principles and simulation / / edited by Joachim Piprek
Pubbl/distr/stampa Weinheim, : Wiley-VCH
Descrizione fisica 1 online resource (521 p.)
Disciplina 537.6223
621.38152
Altri autori (Persone) PiprekJoachim
Soggetto topico Semiconductors
Nitrides
ISBN 1-280-92162-5
9786610921621
3-527-61072-3
3-527-61071-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Nitride Semiconductor Devices: Principles and Simulation; Contents; Preface; List of Contributors; Part 1 Material Properties; 1 Introduction; 1.1 A Brief History; 1.2 Unique Material Properties; 1.3 Thermal Parameters; References; 2 Electron Bandstructure Parameters; 2.1 Introduction; 2.2 Band Structure Models; 2.3 Band Parameters; 2.3.1 GaN; 2.3.2 AlN; 2.3.3 InN; 2.3.4 AlGaN; 2.3.5 InGaN; 2.3.6 InAlN; 2.3.7 AlGaInN; 2.3.8 Band Offsets; 2.4 Conclusions; References; 3 Spontaneous and Piezoelectric Polarization: Basic Theory vs. Practical Recipes
3.1 Why Spontaneous Polarization in III-V Nitrides?3.2 Theoretical Prediction of Polarization Properties in AlN, GaN and InN; 3.3 Piezoelectric and Pyroelectric Effects in III-V Nitrides Nanostructures; 3.4 Polarization Properties in Ternary and Quaternary Alloys: Nonlinear Compositional Dependence and Order vs. Disorder Effects; 3.5 Orientational Dependence of Polarization; References; 4 Transport Parameters for Electrons and Holes; 4.1 Introduction; 4.2 Numerical Simulation Model; 4.2.1 Scattering in the Semi-Classical Boltzmann Equation; 4.3 Analytical Models for the Transport Parameters
4.4 GaN Transport Parameters4.4.1 Electron Transport Coefficients; 4.4.2 Hole Transport Coefficients; 4.5 AlN Transport Parameters; 4.5.1 Electron Transport Coefficients; 4.5.2 Hole Transport Coefficients; 4.6 InN Transport Parameters; 4.6.1 Electron Transport Coefficients; 4.6.2 Hole Transport Coefficients; 4.7 Conclusions; References; 5 Optical Constants of Bulk Nitrides; 5.1 Introduction; 5.2 Dielectric Function and Band Structure; 5.2.1 Fundamental Relations; 5.2.2 Valence Band Ordering, Optical Selection Rules and Anisotropy; 5.3 Experimental Results; 5.3.1 InN; 5.3.2 GaN and AlN
5.3.3 AlGaN Alloys5.3.4 In-rich InGaN and InAlN Alloys; 5.4 Modeling of the Dielectric Function; 5.4.1 Analytical Representation of the Dielectric Function; 5.4.2 Calculation of the Dielectric Function for Alloys; 5.4.3 Influence of Electric Fields on the Dielectric Function; References; 6 Intersubband Absorption in AlGaN/GaN Quantum Wells; 6.1 Introduction; 6.2 Theoretical Model; 6.2.1 Spontaneous and Piezoelectric Polarization; 6.3 Numerical Implementation; 6.3.1 Achieving Self-consistency: The Under-Relaxation Method; 6.3.2 Predictor-Corrector Approach
6.4 Absorption Energy in AlGaN-GaN MQWs6.4.1 Numerical Analysis of Periodic AlGaN-GaN MQWs; 6.4.2 Numerical Analysis of Non-periodic AlGaN-GaN MQWs and Comparison with Experimental Results; 6.5 Conclusions; References; 7 Interband Transitions in InGaN Quantum Wells; 7.1 Introduction; 7.2 Theory; 7.2.1 Bandstructure and Wavefunctions; 7.2.2 Semiconductor Bloch Equations; 7.2.3 Semiconductor Luminescence Equations; 7.2.4 Auger Recombination Processes; 7.3 Theory-Experiment Gain Comparison; 7.4 Absorption/Gain; 7.4.1 General Trends; 7.4.2 Structural Dependence; 7.5 Spontaneous Emission
7.6 Auger Recombinations
Record Nr. UNINA-9910841894503321
Weinheim, : Wiley-VCH
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
NUSOD '04 : proceedings of the 4th International Conference on Numerical Simulation of Optoelectronic Devices : 24-26 August, 2004, University of California at Santa Brabara / / chairs/editors, Joachim Piprek and Simon Li ; technical co-sponsor, the IEEE Lasers and Electro-Optics Society
NUSOD '04 : proceedings of the 4th International Conference on Numerical Simulation of Optoelectronic Devices : 24-26 August, 2004, University of California at Santa Brabara / / chairs/editors, Joachim Piprek and Simon Li ; technical co-sponsor, the IEEE Lasers and Electro-Optics Society
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2004
Descrizione fisica 1 online resource (305 pages)
Disciplina 621.381045
Soggetto topico Semiconductors
Nanostructures
Optoelectronic devices
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996202173403316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2004
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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NUSOD '04 : proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices : 19-22 September, 2005, Berlin, Germany
NUSOD '04 : proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices : 19-22 September, 2005, Berlin, Germany
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2005
Soggetto topico Optoelectronic devices
Semiconductors
ISBN 1-5386-0241-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996203260703316
[Place of publication not identified], : IEEE, 2005
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
NUSOD '04 : proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices : 19-22 September, 2005, Berlin, Germany
NUSOD '04 : proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices : 19-22 September, 2005, Berlin, Germany
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2005
Soggetto topico Optoelectronic devices
Semiconductors
ISBN 1-5386-0241-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910146791103321
[Place of publication not identified], : IEEE, 2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
NUSOD '06 : proceedings of the 6th International Conference on Numerical Simulation of Optoelectronic Devices : 11-14 September 2006, Singapore
NUSOD '06 : proceedings of the 6th International Conference on Numerical Simulation of Optoelectronic Devices : 11-14 September 2006, Singapore
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2006
Disciplina 621.381/045
Soggetto topico Optoelectronic devices - Simulation methods
Optoelectronic devices
Semiconductors
Nanostructures
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-9578-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996216758503316
[Place of publication not identified], : IEEE, 2006
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
NUSOD '06 : proceedings of the 6th International Conference on Numerical Simulation of Optoelectronic Devices : 11-14 September 2006, Singapore
NUSOD '06 : proceedings of the 6th International Conference on Numerical Simulation of Optoelectronic Devices : 11-14 September 2006, Singapore
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2006
Disciplina 621.381/045
Soggetto topico Optoelectronic devices - Simulation methods
Optoelectronic devices
Semiconductors
Nanostructures
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-9578-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910142664003321
[Place of publication not identified], : IEEE, 2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Process technology / / Scott Crowder
Process technology / / Scott Crowder
Autore Crowder Scott
Pubbl/distr/stampa [United States] : , : IEEE, , 2007
Descrizione fisica 1 online resource (1 video file, 60 mins) : color illustrations
Disciplina 621.381/045
Soggetto topico Optoelectronic devices - Simulation methods
Optoelectronic devices
Semiconductors
Nanostructures
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-8583-1
Formato Videoregistrazioni
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910143014103321
Crowder Scott  
[United States] : , : IEEE, , 2007
Videoregistrazioni
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Process technology / / Scott Crowder
Process technology / / Scott Crowder
Autore Crowder Scott
Pubbl/distr/stampa [United States] : , : IEEE, , 2007
Descrizione fisica 1 online resource (1 video file, 60 mins) : color illustrations
Disciplina 621.381/045
Soggetto topico Optoelectronic devices - Simulation methods
Optoelectronic devices
Semiconductors
Nanostructures
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-8583-1
Formato Videoregistrazioni
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996211043803316
Crowder Scott  
[United States] : , : IEEE, , 2007
Videoregistrazioni
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui