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System identification : a frequency domain approach / / Rik Pintelon, Johan Schoukens
| System identification : a frequency domain approach / / Rik Pintelon, Johan Schoukens |
| Autore | Pintelon R (Rik) |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : John Wiley & Sons, 2012 |
| Descrizione fisica | 1 online resource (790 p.) |
| Disciplina | 003/.1 |
| Altri autori (Persone) | SchoukensJ (Johan) |
| Soggetto topico | System identification |
| ISBN |
1-280-67468-7
9786613651617 1-118-28741-X 1-118-28742-8 1-118-28739-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface to the First Edition -- -- Preface to the Second Edition -- -- Acknowledgments -- -- List of Operators and Notational Conventions -- List of Symbols -- List of Abbreviations -- Chapter 1 An Introduction to Identification -- Chapter 2 Measurement of Frequency Response Functions - Standard Solutions -- Chapter 3 Frequency Response Function Measurements in the Presence of Nonlinear Distortions -- Chapter 4 Detection, Quantification, and Qualification of Nonlinear Distortions in FRF Measurements -- Chapter 5 Design of Excitation Signals -- Chapter 6 Models of Linear Time-Invariant Systems -- Chapter 7 Measurement of Frequency Response Functions - The Local Polynomial Approach -- Chapter 8 An Intuitive Introduction to Frequency Domain Identification -- Chapter 9 Estimation with Know Noise Model -- Chapter 10 Estimation with Unknown Noise Model - Standard Solutions -- Chapter 11 Model Selection and Validation -- Chapter 12 Estimation with Unknown Noise Model - The Local Polynomial Approach -- Chapter 13 Basic Choices in System Identification -- Chapter 14 Guidelines for the User -- Chapter 15 Some Linear Algebra Fundamentals -- Chapter 16 Some Probability and Stochastic Convergence Fundamentals -- Chapter 17 Properties of Least Squares Estimators with Deterministic Weighting -- Chapter 18 Properties of Least Squares Estimators with Stochastic Weighting -- Chapter 19 Identification of Semilinear Models -- Chapter 20 Identification of Invariants of (Over) Parameterized Models -- References -- Subject Index -- Author Index -- About the Authors |
| Record Nr. | UNINA-9910876753903321 |
Pintelon R (Rik)
|
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| Hoboken, N.J., : John Wiley & Sons, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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System identification [[electronic resource] ] : a frequency domain approach / / Rik Pintelon, Johan Schoukens
| System identification [[electronic resource] ] : a frequency domain approach / / Rik Pintelon, Johan Schoukens |
| Autore | Pintelon R (Rik) |
| Pubbl/distr/stampa | New York, : IEEE Press, c2001 |
| Descrizione fisica | 1 online resource (644 p.) |
| Disciplina |
003.1
003/.85 |
| Altri autori (Persone) | SchoukensJ (Johan) |
| Soggetto topico |
System identification
System analysis |
| ISBN |
1-280-27280-5
9786610272808 0-470-36559-5 0-471-66095-7 0-471-72313-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Contents; Preface; Acknowledgments; List of Operators and Notational Conventions; List of Symbols; List of Abbreviations; CHAPTER 1 An Introduction to Identification; 1.1 What Is Identification?; 1.2 Identification: A Simple Example; 1.2.1 Estimation of the Value of a Resistor; 1.2.2 Simplified Analysis of the Estimators; 1.2.3 Interpretation of the Estimators: A Cost Function-Based Approach; 1.3 Description of the Stochastic Behavior of Estimators; 1.3.1 Location Properties: Unbiased and Consistent Estimates; 1.3.2 Dispersion Properties: Efficient Estimators
1.4 Basic Steps in the Identification Process1.4.1 Collect Information about the System; 1.4.2 Select a Model Structure to Represent the System; 1.4.3 Match the Selected Model Structure to the Measurements; 1.4.4 Validate the Selected Model; 1.4.5 Conclusion; 1.5 A Statistical Approach to the Estimation Problem; 1.5.1 Least Squares Estimation; 1.5.2 Weighted Least Squares Estimation; 1.5.3 The Maximum Likelihood Estimator; 1.5.4 The Bayes Estimator; 1.5.5 Instrumental Variables; 1.6 Exercises; CHAPTER 2 Measurements of Frequency Response Functions; 2.1 Introduction 2.2 An Introduction to the Discrete Fourier Transform2.2.1 The Sampling Process; 2.2.2 The Discrete Fourier Transform (DFT-FFT); 2.2.3 DFT Properties of Periodic Signals; 2.2.4 DFT of Burst Signals; 2.2.5 Conclusion; 2.3 Spectral Representations of Periodic Signals; 2.4 Analysis of FRF Measurements Using Periodic Excitations; 2.4.1 Measurement Setup; 2.4.2 Error Analysis; 2.5 Reducing FRF Measurement Errors for Periodic Excitations; 2.5.1 Basic Principles; 2.5.2 Processing Repeated Measurements; 2.5.3 Improved Averaging Methods for Nonsynchronized Measurements; 2.5.4 Coherence 2.6 FRF Measurements Using Random Excitations2.6.1 Basic Principles; 2.6.2 Reducing the Noise Influence; 2.6.3 Leakage Errors; 2.6.4 Improved FRF Measurements for Random Excitations; 2.7 FRF Measurements of Multiple Input, Multiple Output Systems; 2.8 Guidelines for FRF Measurements; 2.8.1 Guideline 1: Use Periodic Excitations; 2.8.2 Guideline 2: Select the Best FRF Estimator; 2.8.3 Guideline 3: Pretreatment of Data; 2.9 Conclusion; 2.10 Exercises; 2.11 Appendixes; Appendix 2.A: Asymptotic Behavior of Averaging Techniques; Appendix 2.B: Proof of Theorem 2.6 (On Decaying Leakage Errors) CHAPTER 3 Frequency Response Function Measurements in the Presence of Nonlinear Distortions3.1 Introduction; 3.2 Intuitive Understanding of the Behavior of Nonlinear Systems; 3.3 A Formal Framework to Describe Nonlinear Distortions; 3.3.1 Class of Excitation Signals; 3.3.2 Selection of a Model Structure for the Nonlinear System; 3.4 Study of the Properties of FRF Measurements in the Presence of Nonlinear Distortions; 3.4.1 Study of the Expected Value of the FRF for a Constant Number of Harmonics; 3.4.2 Asymptotic Behavior of the FRF if the Number of Harmonics Tends to Infinity 3.4.3 Further Comments on the Related Linear Dynamic System |
| Record Nr. | UNISA-996218164803316 |
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Pintelon R (Rik)
|
||
| New York, : IEEE Press, c2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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