Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]] |
Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2000 |
Descrizione fisica | 1 online resource (xii, 391 pages) : digital, PDF file(s) |
Disciplina | 537.6/23/0284 |
Soggetto topico |
High temperature superconductors
Electron microscopy - Technique |
ISBN |
1-107-11301-6
1-280-41701-3 9786610417018 0-511-17507-8 0-511-03966-2 0-511-15517-4 0-511-32866-4 0-511-53482-5 0-511-05339-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid. |
Altri titoli varianti | Characterization of High Tc Materials & Devices by Electron Microscopy |
Record Nr. | UNINA-9910449815603321 |
Cambridge : , : Cambridge University Press, , 2000 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]] |
Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2000 |
Descrizione fisica | 1 online resource (xii, 391 pages) : digital, PDF file(s) |
Disciplina | 537.6/23/0284 |
Soggetto topico |
High temperature superconductors
Electron microscopy - Technique |
ISBN |
1-107-11301-6
1-280-41701-3 9786610417018 0-511-17507-8 0-511-03966-2 0-511-15517-4 0-511-32866-4 0-511-53482-5 0-511-05339-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid. |
Altri titoli varianti | Characterization of High Tc Materials & Devices by Electron Microscopy |
Record Nr. | UNINA-9910777075803321 |
Cambridge : , : Cambridge University Press, , 2000 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|