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Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
Pubbl/distr/stampa Cambridge : , : Cambridge University Press, , 2000
Descrizione fisica 1 online resource (xii, 391 pages) : digital, PDF file(s)
Disciplina 537.6/23/0284
Soggetto topico High temperature superconductors
Electron microscopy - Technique
ISBN 1-107-11301-6
1-280-41701-3
9786610417018
0-511-17507-8
0-511-03966-2
0-511-15517-4
0-511-32866-4
0-511-53482-5
0-511-05339-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid.
Altri titoli varianti Characterization of High Tc Materials & Devices by Electron Microscopy
Record Nr. UNINA-9910449815603321
Cambridge : , : Cambridge University Press, , 2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
Pubbl/distr/stampa Cambridge : , : Cambridge University Press, , 2000
Descrizione fisica 1 online resource (xii, 391 pages) : digital, PDF file(s)
Disciplina 537.6/23/0284
Soggetto topico High temperature superconductors
Electron microscopy - Technique
ISBN 1-107-11301-6
1-280-41701-3
9786610417018
0-511-17507-8
0-511-03966-2
0-511-15517-4
0-511-32866-4
0-511-53482-5
0-511-05339-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid.
Altri titoli varianti Characterization of High Tc Materials & Devices by Electron Microscopy
Record Nr. UNINA-9910777075803321
Cambridge : , : Cambridge University Press, , 2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui