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Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
| Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.] |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, NJ, : World Scientific, c2009 |
| Descrizione fisica | 1 online resource (419 p.) |
| Disciplina | 530.8 |
| Altri autori (Persone) | PaveseFranco |
| Collana | Series on advances in mathematics for applied sciences |
| Soggetto topico |
Measurement
Physical measurements Metrology |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-282-44272-4
9786612442728 981-283-952-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module 3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation 4. Simulation Software Tool |
| Record Nr. | UNINA-9910456701103321 |
| Singapore ; ; Hackensack, NJ, : World Scientific, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
| Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.] |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, NJ, : World Scientific, c2009 |
| Descrizione fisica | 1 online resource (419 p.) |
| Disciplina | 530.8 |
| Altri autori (Persone) | PaveseFranco |
| Collana | Series on advances in mathematics for applied sciences |
| Soggetto topico |
Measurement
Physical measurements Metrology |
| ISBN |
1-282-44272-4
9786612442728 981-283-952-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module 3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation 4. Simulation Software Tool |
| Record Nr. | UNINA-9910780808403321 |
| Singapore ; ; Hackensack, NJ, : World Scientific, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced mathematical & computational tools in metrology & testing VIII / / editors, F. Pavese ... [et al.]
| Advanced mathematical & computational tools in metrology & testing VIII / / editors, F. Pavese ... [et al.] |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, NJ, : World Scientific, c2009 |
| Descrizione fisica | 1 online resource (419 p.) |
| Disciplina | 530.8 |
| Altri autori (Persone) | PaveseFranco |
| Collana | Series on advances in mathematics for applied sciences |
| Soggetto topico |
Measurement
Physical measurements Metrology |
| ISBN |
1-282-44272-4
9786612442728 981-283-952-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module 3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation 4. Simulation Software Tool |
| Altri titoli varianti |
Advanced mathematical and computational tools in metrology and testing VIII
AMCTM 8 |
| Record Nr. | UNINA-9910827281703321 |
| Singapore ; ; Hackensack, NJ, : World Scientific, c2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||