Interpretability for Industry 4.0 : Statistical and Machine Learning Approaches / Antonio Lepore, Biagio Palumbo, Jean-Michel Poggi editors |
Pubbl/distr/stampa | Cham, : Springer, 2022 |
Descrizione fisica | vii, 123 p. : ill. ; 24 cm |
Soggetto topico |
62-XX - Statistics [MSC 2020]
62P12 - Applications of statistics to environmental and related topics [MSC 2020] 62P20 - Applications of statistics to economics [MSC 2020] 62P30 - Applications of statistics in engineering and industry; control charts [MSC 2020] 62P35 - Applications of statistics to physics [MSC 2020] |
Soggetto non controllato |
Additive Manufacturing Systems
Generalized additive models Interpretability Machine learning Sensitivity |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNICAMPANIA-VAN0277671 |
Cham, : Springer, 2022 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|
Interpretability for Industry 4.0 : Statistical and Machine Learning Approaches / Antonio Lepore, Biagio Palumbo, Jean-Michel Poggi editors |
Pubbl/distr/stampa | Cham, : Springer, 2022 |
Descrizione fisica | vii, 123 p. : ill. ; 24 cm |
Soggetto topico |
62-XX - Statistics [MSC 2020]
62P12 - Applications of statistics to environmental and related topics [MSC 2020] 62P20 - Applications of statistics to economics [MSC 2020] 62P30 - Applications of statistics in engineering and industry; control charts [MSC 2020] 62P35 - Applications of statistics to physics [MSC 2020] |
Soggetto non controllato |
Additive Manufacturing Systems
Generalized additive models Interpretability Machine learning Sensitivity |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNICAMPANIA-VAN00277671 |
Cham, : Springer, 2022 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Vanvitelli | ||
|