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Handbook of optical constants of solids . II [[electronic resource] /] / edited by Edward D. Palik
| Handbook of optical constants of solids . II [[electronic resource] /] / edited by Edward D. Palik |
| Pubbl/distr/stampa | San Diego, : Academic Press, 1998 |
| Descrizione fisica | 1 online resource (1117 p.) |
| Disciplina |
530.4/12 20
530.412 |
| Altri autori (Persone) | PalikEdward D |
| Soggetto topico |
Solids - Optical properties
Optical materials - Tables Refractive index - Tables |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-11199-6
9786611111991 0-08-055630-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | pt. 1. Determination of optical constants -- pt. 2. Critiques. |
| Record Nr. | UNINA-9910480434103321 |
| San Diego, : Academic Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of optical constants of solids . II [[electronic resource] /] / edited by Edward D. Palik
| Handbook of optical constants of solids . II [[electronic resource] /] / edited by Edward D. Palik |
| Pubbl/distr/stampa | San Diego, : Academic Press, 1998 |
| Descrizione fisica | 1 online resource (1117 p.) |
| Disciplina |
530.4/12 20
530.412 |
| Altri autori (Persone) | PalikEdward D |
| Soggetto topico |
Solids - Optical properties
Optical materials - Tables Refractive index - Tables |
| ISBN |
1-281-11199-6
9786611111991 0-08-055630-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | pt. 1. Determination of optical constants -- pt. 2. Critiques. |
| Record Nr. | UNINA-9910784737303321 |
| San Diego, : Academic Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of optical constants of solids / / edited by Edward D. Palik
| Handbook of optical constants of solids / / edited by Edward D. Palik |
| Pubbl/distr/stampa | Orlando, : Academic Press, 1985 |
| Descrizione fisica | 1 online resource (824 p.) |
| Disciplina | 530.4/1 |
| Altri autori (Persone) | PalikEdward D |
| Collana | Academic Press handbook series |
| Soggetto topico |
Solids - Optical properties
Optical constants |
| ISBN |
1-281-11198-8
9786611111984 0-08-054721-4 1-60119-270-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Handbook of Optical Constants of Solids; Copyright Page; Table of Contents; List of Contributors; Preface; Part I: DETERMINATION OF OPTICAL CONSTANTS; Chapter 1. Introductory Remarks; I. Introduction; II. The Chapters; III. The Critiques; IV. The Tables; V. The Figures of the Tables; VI. General Remarks; References; Chapter 2. Basic Parameters for Measuring Optical Properties; I. Introduction; II. Intrinsic Material Parameters in Terms of Optical Constants; III. Reflectance, Transmittance, and Absorptanceof Layered Structures
IV. The General Lamelliform-Phase Coherency ThroughoutV. The General Lamelliform-Phase Incoherency in Substrate; VI. Summary; Appendix A. Basic Formulas for Fresnel Coefficients; Appendix B. General Formulas for the Case of a Parallel-Sided Slab; Appendix C. Reflectance, Rjk at j-k Interface; Appendix D. Reflectance of Single Layer on Each Side of a Slab and Single Layer on Either Side of a Slab; Appendix E. Critical Angle of Incidence; Definition of Terms; References; Chapter 3. Dispersion Theory, Sum Rules, and Their Application to the Analysis of Optical Data; I. Introduction II. Optical Sum Rules and Their Physical InterpretationIII. Finite-Energy Sum Rules; IV. Sum Rules for Reflection Spectroscopy; V. Analysis of Optical Data and Sum-Rule Applications; VI. Summary; References; Chapter 4. Measurement of Optical Constants in the Vacuum Ultraviolet Spectral Region; I. Introduction; II. General Discussion of Reflectance Methods; III. Reflectance Method for Two Media; References; Chapter 5. The Accurate Determination of Optical Properties by Ellipsometry; I. Reflection Techniques; Background and Overview; II. Measurement Configurations III. Accurate Determination of Optical Properties: Overlayer EffectsIV. Living with Overlayers; V. Eliminating Overlayers; VI. Bulk and Thin-Film Effects; Effective-Medium Theory; VII. Conclusion; References; References; Chapter 6. Interferometric Methods for the Determination of Thin-Film Parameters; I. Introduction; II. Basic Principles; III. Nonlaser Interferometers; IV. Kösters-Prism Interferometers; V. A Self-Calibrating Method; VI. Surface Effects; VII. Conclusions; References; Chapter 7. Thin-Film Absorptance Measurements Using Laser Calorimetry; I. Introduction II. Single-Layer FilmsIII. Wedged-Film Laser Calorimetry; IV. Electric-Field Considerations in Laser Calorimetry; V. Entrance versus Exit Surface Films; VI. Experimental Determination of αf, aaf, and afs; References; Chapter 8. Complex Index of Refraction Measurements at Near-Millimeter Wavelengths; I. Introduction; II. Fourier Transform Spectroscopy; III. Free-Space Resonant Cavity; IV. Mach-Zehnder Interferometer; V. Direct Birefringence Measurement; VI. Overmoded Nonresonant Cavity; VII. Crystal Quartz as Index Reference; VIII. Conclusion; References Chapter 9. The Quantum Extension of the Drude-Zener Theory in Polar Semiconductors |
| Record Nr. | UNINA-9911006531903321 |
| Orlando, : Academic Press, 1985 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||