Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Defects - Congresses
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996204463203316 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits |
Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Defects - Congresses
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872403403321 |
[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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