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Ferroelectric Random Access Memories [[electronic resource] ] : Fundamentals and Applications / / edited by Hiroshi Ishiwara, Masanori Okuyama, Yoshihiro Arimoto
Ferroelectric Random Access Memories [[electronic resource] ] : Fundamentals and Applications / / edited by Hiroshi Ishiwara, Masanori Okuyama, Yoshihiro Arimoto
Edizione [1st ed. 2004.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2004
Descrizione fisica 1 online resource (XIII, 291 p.)
Disciplina 621.39/73
Collana Topics in Applied Physics
Soggetto topico Metals
Optical materials
Electronic materials
Condensed matter
Solid state physics
Spectroscopy
Microscopy
Metallic Materials
Optical and Electronic Materials
Condensed Matter Physics
Solid State Physics
Spectroscopy and Microscopy
ISBN 3-540-45163-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Part I Ferroelectric Thin Films: Overview -- Novel Si-substituted Ferroelectric Films -- Static and Dynamic Properties of Domains -- Nanoscale Phenomena in Ferroelectric Thin Films -- Part II Deposition and Characterization Methods: Sputtering Techniques -- Chemical Approach Using Tailored Liquid Sources to Bi-based Layer-structured Perovskite Thin Films -- Recent Development of Ferroelectric Thin Films by MOCVD -- Materials Integration Strategies -- Characterization by Scanning Nonlinear Dielectric Microscopy -- Part III Fabrication Process and Circuit Design: Current Status of FeRAMs -- Operation Principle and Circuit Design Issues -- High Density Integration -- Testing and Reliability -- Part IV Advanced-Type Memories: Chain FeRAMs -- Capacitor-on-Metal/Via-stacked-Plug (CMVP) Memory Cell and Application to a Non-volatile SRAM -- FET-type FeRAMs -- Part V Applications and Future Prospects: Application to Future Information Technology World -- Subject Index.
Record Nr. UNINA-9910634053103321
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Ferroelectric Thin Films [[electronic resource] ] : Basic Properties and Device Physics for Memory Applications / / edited by Masanori Okuyama, Yoshihiro Ishibashi
Ferroelectric Thin Films [[electronic resource] ] : Basic Properties and Device Physics for Memory Applications / / edited by Masanori Okuyama, Yoshihiro Ishibashi
Edizione [1st ed. 2005.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2005
Descrizione fisica 1 online resource (XIII, 244 p.)
Disciplina 538
Collana Topics in Applied Physics
Soggetto topico Magnetism
Magnetic materials
Crystallography
Electronics
Microelectronics
Metals
Engineering
Magnetism, Magnetic Materials
Crystallography and Scattering Methods
Electronics and Microelectronics, Instrumentation
Metallic Materials
Engineering, general
ISBN 1-281-39020-8
9786611390204
3-540-31479-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Theoretical Aspects of Phase Transitions in Ferroelectric Thin Films -- Chemical Solution Deposition of Layered-Structured Ferroelectric Thin Films -- PB-Based Ferroelectric Thin Films Prepared by MOCVD -- Spontaneous Polarization and Crystal Orientation Control of MOCVD PZT and Bi4Ti3O12-Based Films -- Rhombohedral PZT Thin Films Prepared by Sputtering -- Scanning Nonlinear Dielectric Microscope -- Analysis of Ferroelectricity and Enhanced Piezoelectricity near Morphotropic Phase Boundary -- Correlation between Domain Structures in Dielectric Properties in Single Crystals of Ferroelectric Solid Solutions -- Relaxor Behaviors in Perovskite-Type Dielectric Compounds -- Artificial Control of Ordered/Disordered State of B-Site Ions in Ba(Zr,Ti)O3 by a Superlattice Technique -- Physics of Ferroelectric Interface: An Attempt to Nano-Ferrolectric Physics -- Preparation and Property of Ferroelectic-Insulator-Semiconductor Junction Using YMNO3 Thin Film -- Improvement of Memory Retention in Metal-Ferroelectric-Insulator-Semiconductor (MFIS) Structure.
Record Nr. UNINA-9910634037903321
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Ferroelectric-Gate Field Effect Transistor Memories [[electronic resource] ] : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Ferroelectric-Gate Field Effect Transistor Memories [[electronic resource] ] : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Edizione [2nd ed. 2020.]
Pubbl/distr/stampa Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020
Descrizione fisica 1 online resource (XIV, 425 p. 313 illus., 183 illus. in color.)
Disciplina 621.3815284
Collana Topics in Applied Physics
Soggetto topico Electronic circuits
Electronics
Microelectronics
Materials—Surfaces
Thin films
Surfaces (Physics)
Interfaces (Physical sciences)
Electronic Circuits and Devices
Electronics and Microelectronics, Instrumentation
Surfaces and Interfaces, Thin Films
Circuits and Systems
Surface and Interface Science, Thin Films
ISBN 981-15-1212-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto I. Introduction -- II. Practical Characteristics of Inorganic Ferroelectric-gate FETs: Si-Based Ferroelectric-gate Field Effect Transistors -- III. Practical Characteristics of Inorganic Ferroelectric-Gate FETs: Thin Film-Based Ferroelectric-Gate Field Effect Transistors -- Ⅳ Practical Characteristics of Organic Ferroelectric-Gate FETs: Si-Based Ferroelectric-Gate Field Effect Transistors -- V Practical Characteristics of Organic Ferroelectric-Gate FETs: Thin Film-Based Ferroelectric-Gate Field Effect Transistors -- VI Practical Characteristics of Organic Ferroelectric-Gate FETs : Ferroelectric-Gate Field Effect Transistors with Flexible Substrates -- Ⅶ Applications and Future Prospects.
Record Nr. UNISA-996418178403316
Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Ferroelectric-Gate Field Effect Transistor Memories : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Ferroelectric-Gate Field Effect Transistor Memories : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Edizione [2nd ed. 2020.]
Pubbl/distr/stampa Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020
Descrizione fisica 1 online resource (XIV, 425 p. 313 illus., 183 illus. in color.)
Disciplina 621.3815284
Collana Topics in Applied Physics
Soggetto topico Electronic circuits
Electronics
Microelectronics
Materials—Surfaces
Thin films
Surfaces (Physics)
Interfaces (Physical sciences)
Electronic Circuits and Devices
Electronics and Microelectronics, Instrumentation
Surfaces and Interfaces, Thin Films
Circuits and Systems
Surface and Interface Science, Thin Films
ISBN 981-15-1212-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto I. Introduction -- II. Practical Characteristics of Inorganic Ferroelectric-gate FETs: Si-Based Ferroelectric-gate Field Effect Transistors -- III. Practical Characteristics of Inorganic Ferroelectric-Gate FETs: Thin Film-Based Ferroelectric-Gate Field Effect Transistors -- Ⅳ Practical Characteristics of Organic Ferroelectric-Gate FETs: Si-Based Ferroelectric-Gate Field Effect Transistors -- V Practical Characteristics of Organic Ferroelectric-Gate FETs: Thin Film-Based Ferroelectric-Gate Field Effect Transistors -- VI Practical Characteristics of Organic Ferroelectric-Gate FETs : Ferroelectric-Gate Field Effect Transistors with Flexible Substrates -- Ⅶ Applications and Future Prospects.
Record Nr. UNINA-9910410005303321
Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Ferroelectric-Gate Field Effect Transistor Memories : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Ferroelectric-Gate Field Effect Transistor Memories : Device Physics and Applications / / edited by Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min Yoon
Edizione [1st ed. 2016.]
Pubbl/distr/stampa Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2016
Descrizione fisica 1 online resource (350 p.)
Disciplina 530
Collana Topics in Applied Physics
Soggetto topico Electronic circuits
Electronics
Microelectronics
Materials—Surfaces
Thin films
Surfaces (Physics)
Interfaces (Physical sciences)
Electronic Circuits and Devices
Electronics and Microelectronics, Instrumentation
Surfaces and Interfaces, Thin Films
Circuits and Systems
Surface and Interface Science, Thin Films
ISBN 94-024-0841-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Operation Principle of One-Transistor Type Ferroelectric-gate Field Effect Transistors -- Practical Characteristics of Inorganic Ferroelectric-gate FETs -- Si-Based Ferroelectric-gate Field Effect Transistors -- Thin film-Based Ferroelectric-gate Field Effect Transistors -- Practical Characteristics of Organic Ferroelectric-gate FETs -- Si-Based Ferroelectric-gate Field Effect Transistors -- Thin film-Based Ferroelectric-gate Field Effect Transistors -- Ferroelectric-gate Field Effect Transistors with flexible substrates -- Applications and Future Prospects.
Record Nr. UNINA-9910254628103321
Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui