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Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1978 to September 30, 1979 / / F. F. Oettinger; R. D. Larrabee
| Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1978 to September 30, 1979 / / F. F. Oettinger; R. D. Larrabee |
| Autore | Oettinger F. F |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
LarrabeeR. D
OettingerF. F |
| Collana | NBSIR |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Measurement techniques for high power semiconductor materials and devices |
| Record Nr. | UNINA-9910710232003321 |
Oettinger F. F
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1977 to September 30, 1978 / / F. F. Oettinger
| Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1977 to September 30, 1978 / / F. F. Oettinger |
| Autore | Oettinger F. F |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | OettingerF. F |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Measurement techniques for high power semiconductor materials and devices |
| Record Nr. | UNINA-9910710286303321 |
|
Oettinger F. F
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement techniques for high power semiconductor materials and devices : Annual report, January 1, to December 31, 1977 / / F. F. Oettinger
| Measurement techniques for high power semiconductor materials and devices : Annual report, January 1, to December 31, 1977 / / F. F. Oettinger |
| Autore | Oettinger F. F |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | OettingerF. F |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Measurement techniques for high power semiconductor materials and devices |
| Record Nr. | UNINA-9910709914803321 |
|
Oettinger F. F
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||