Energy dispersive x-ray spectrometry / / K. F. J. Heinrich, D. E. Newbury, R. L. Myklebust |
Autore | Heinrich Kurt F. J |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
HeinrichKurt F. J
MyklebustR. L NewburyDale E |
Collana | NBS special publication |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709515703321 |
Heinrich Kurt F. J
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] /] / by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
Autore | Goldstein Joseph I |
Edizione | [4th ed. 2018.] |
Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2018 |
Descrizione fisica | 1 online resource (XXIII, 550 p. 546 illus., 409 illus. in color.) |
Disciplina | 620.11 |
Soggetto topico |
Materials science
Spectroscopy Microscopy Physical measurements Measurement Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation |
ISBN | 1-4939-6676-6 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam – Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix – A Database of Electron-Solid Interactions -- Index. |
Record Nr. | UNINA-9910298587303321 |
Goldstein Joseph I
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New York, NY : , : Springer New York : , : Imprint : Springer, , 2018 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy and X-Ray Microanalysis [[electronic resource] ] : A Text for Biologists, Materials Scientists, and Geologists / / by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin |
Autore | Goldstein Joseph <1939-2015, > |
Edizione | [2nd ed. 1992.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1992 |
Descrizione fisica | 1 online resource (840 p.) |
Disciplina | 550 |
Soggetto topico |
Earth sciences
Developmental biology Materials science Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0491-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
Record Nr. | UNINA-9910478881703321 |
Goldstein Joseph <1939-2015, >
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New York, NY : , : Springer US : , : Imprint : Springer, , 1992 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.] |
Autore | Goldstein Joseph <1939-2015, > |
Edizione | [Second edition 1992.] |
Pubbl/distr/stampa | New York : , : Springer US : , : Imprint : Springer, , 1992 |
Descrizione fisica | 1 online resource (840 pages) |
Disciplina | 550 |
Soggetto topico |
Earth sciences
Developmental biology Materials science |
ISBN | 1-4613-0491-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
Record Nr. | UNINA-9910789223103321 |
Goldstein Joseph <1939-2015, >
![]() |
||
New York : , : Springer US : , : Imprint : Springer, , 1992 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / Joseph Goldstein, Dale E. Newbury, Patrick Echlin [et al.] |
Autore | Goldstein Joseph <1939-2015, > |
Edizione | [Second edition 1992.] |
Pubbl/distr/stampa | New York : , : Springer US : , : Imprint : Springer, , 1992 |
Descrizione fisica | 1 online resource (840 pages) |
Disciplina | 550 |
Soggetto topico |
Earth sciences
Developmental biology Materials science |
ISBN | 1-4613-0491-1 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4. Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
Record Nr. | UNINA-9910813104403321 |
Goldstein Joseph <1939-2015, >
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New York : , : Springer US : , : Imprint : Springer, , 1992 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910480498803321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910789220703321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
Autore | Lyman Charles E |
Edizione | [1st ed. 1990.] |
Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
Descrizione fisica | 1 online resource (XI, 407 p.) |
Disciplina | 571.8 |
Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
ISBN | 1-4613-0635-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
Record Nr. | UNINA-9910807830303321 |
Lyman Charles E
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New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
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Lo trovi qui: Univ. Federico II | ||
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