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Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1990
Descrizione fisica 1 online resource (xiv, 601 p. ) : ill
Disciplina 519.5
Collana Wiley series in probability and mathematical statistics. Applied probability and statistics
Soggetto topico Failure time data analysis
Reliability (Engineering) - Statistical methods
Accelerated life testing - Statistical methods
ISBN 1-282-30782-7
9786612307829
0-470-31679-9
0-470-31747-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index.
Record Nr. UNINA-9910144695703321
Nelson Wayne <1936->  
New York, : Wiley, c1990
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1990
Descrizione fisica 1 online resource (xiv, 601 p. ) : ill
Disciplina 519.5
Collana Wiley series in probability and mathematical statistics. Applied probability and statistics
Soggetto topico Failure time data analysis
Reliability (Engineering) - Statistical methods
Accelerated life testing - Statistical methods
ISBN 1-282-30782-7
9786612307829
0-470-31679-9
0-470-31747-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index.
Record Nr. UNINA-9910830596903321
Nelson Wayne <1936->  
New York, : Wiley, c1990
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Accelerated testing [[electronic resource] ] : statistical models, test plans and data analysis / / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1990
Descrizione fisica 1 online resource (xiv, 601 p. ) : ill
Disciplina 519.5
Collana Wiley series in probability and mathematical statistics. Applied probability and statistics
Soggetto topico Failure time data analysis
Reliability (Engineering) - Statistical methods
Accelerated life testing - Statistical methods
ISBN 1-282-30782-7
9786612307829
0-470-31679-9
0-470-31747-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Preface. 1. Introduction and Background. 2. Models for Life Tests with Constant Stress. 3. Graphical Data Analysis. 4. Complete Data and Least Squares Analyses. 5. Censored Data and Maximum Likelihood Methods. 6. Test Plans. 7. Competing Failure Modes and Size Effect. 8. Least-Squares Comparisons for Complete Data. 9. Maximum Likelihood Comparisons for Censored and Other Data. 10. Models and Data Analyses for Step and Varying Stress. 11. Accelerated Degradation. Appendix A. Statistical Tables. References. Index.
Record Nr. UNINA-9910877144303321
Nelson Wayne <1936->  
New York, : Wiley, c1990
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1982
Descrizione fisica 1 online resource (656 p.)
Disciplina 620/.00452
Collana Wiley series in probability and mathematical statistics
Soggetto topico Reliability (Engineering)
Engineering
Soggetto genere / forma Electronic books.
ISBN 1-280-25300-2
9786610253005
0-471-72522-6
0-471-72523-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto APPLIED LIFE DATA ANALYSIS; Contents; 1. Overview and Background; 2. Basic Concepts and Distributions for Product Life; 3. Probability Plotting of Complete and Singly Censored Data; 4. Graphical Analysis of Multiply Censored Data; 5. Series Systems and Competing Risks; 6. Analysis of Complete Data; 7. Linear Methods for Singly Censored Data; 8. Maximum Likelihood Analysis of Multiply Censored Data; 9. Analyses of Inspection Data (Quantal-Response and Interval Data); 10. Comparisons (Hypothesis Tests) for Complete Data; 11. Comparisons With Linear Estimators (Singly Censored and Complete Data)
12. Maximum Likelihood Comparisons (Multiply Censored and Other Data)13. Survey of Other Topics; Appendix A Tables; References; Index;
Record Nr. UNINA-9910145901103321
Nelson Wayne <1936->  
New York, : Wiley, c1982
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1982
Descrizione fisica 1 online resource (656 p.)
Disciplina 620/.00452
Collana Wiley series in probability and mathematical statistics
Soggetto topico Reliability (Engineering)
Engineering
ISBN 1-280-25300-2
9786610253005
0-471-72522-6
0-471-72523-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto APPLIED LIFE DATA ANALYSIS; Contents; 1. Overview and Background; 2. Basic Concepts and Distributions for Product Life; 3. Probability Plotting of Complete and Singly Censored Data; 4. Graphical Analysis of Multiply Censored Data; 5. Series Systems and Competing Risks; 6. Analysis of Complete Data; 7. Linear Methods for Singly Censored Data; 8. Maximum Likelihood Analysis of Multiply Censored Data; 9. Analyses of Inspection Data (Quantal-Response and Interval Data); 10. Comparisons (Hypothesis Tests) for Complete Data; 11. Comparisons With Linear Estimators (Singly Censored and Complete Data)
12. Maximum Likelihood Comparisons (Multiply Censored and Other Data)13. Survey of Other Topics; Appendix A Tables; References; Index;
Record Nr. UNINA-9910642612303321
Nelson Wayne <1936->  
New York, : Wiley, c1982
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1982
Descrizione fisica 1 online resource (656 p.)
Disciplina 620/.00452
Collana Wiley series in probability and mathematical statistics
Soggetto topico Reliability (Engineering)
Engineering
ISBN 1-280-25300-2
9786610253005
0-471-72522-6
0-471-72523-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto APPLIED LIFE DATA ANALYSIS; Contents; 1. Overview and Background; 2. Basic Concepts and Distributions for Product Life; 3. Probability Plotting of Complete and Singly Censored Data; 4. Graphical Analysis of Multiply Censored Data; 5. Series Systems and Competing Risks; 6. Analysis of Complete Data; 7. Linear Methods for Singly Censored Data; 8. Maximum Likelihood Analysis of Multiply Censored Data; 9. Analyses of Inspection Data (Quantal-Response and Interval Data); 10. Comparisons (Hypothesis Tests) for Complete Data; 11. Comparisons With Linear Estimators (Singly Censored and Complete Data)
12. Maximum Likelihood Comparisons (Multiply Censored and Other Data)13. Survey of Other Topics; Appendix A Tables; References; Index;
Record Nr. UNINA-9910830321003321
Nelson Wayne <1936->  
New York, : Wiley, c1982
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Applied life data analysis [[electronic resource] /] / Wayne Nelson
Autore Nelson Wayne <1936->
Pubbl/distr/stampa New York, : Wiley, c1982
Descrizione fisica 1 online resource (656 p.)
Disciplina 620/.00452
Collana Wiley series in probability and mathematical statistics
Soggetto topico Reliability (Engineering)
Engineering
ISBN 1-280-25300-2
9786610253005
0-471-72522-6
0-471-72523-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto APPLIED LIFE DATA ANALYSIS; Contents; 1. Overview and Background; 2. Basic Concepts and Distributions for Product Life; 3. Probability Plotting of Complete and Singly Censored Data; 4. Graphical Analysis of Multiply Censored Data; 5. Series Systems and Competing Risks; 6. Analysis of Complete Data; 7. Linear Methods for Singly Censored Data; 8. Maximum Likelihood Analysis of Multiply Censored Data; 9. Analyses of Inspection Data (Quantal-Response and Interval Data); 10. Comparisons (Hypothesis Tests) for Complete Data; 11. Comparisons With Linear Estimators (Singly Censored and Complete Data)
12. Maximum Likelihood Comparisons (Multiply Censored and Other Data)13. Survey of Other Topics; Appendix A Tables; References; Index;
Record Nr. UNINA-9910877295203321
Nelson Wayne <1936->  
New York, : Wiley, c1982
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui