Introduction to Quantum Metrology : The Revised SI System and Quantum Standards / / by Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [2nd ed. 2019.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
Descrizione fisica | 1 online resource (334 pages) |
Disciplina |
389.1015195
530.8 |
Soggetto topico |
Physical measurements
Measurement Electronics Microelectronics Nanoscale science Nanoscience Nanostructures Nanotechnology Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Nanoscale Science and Technology Nanotechnology and Microengineering |
ISBN | 3-030-19677-1 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Preface -- Theoretical Background of Quantum Metrology -- Measurements, Standards and Systems of Units -- The Revised SI System of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Satellite Navigation Systems -- Scanning Probe Microscopes -- New Standards of Mass. |
Record Nr. | UNINA-9910337880603321 |
Nawrocki Waldemar | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Introduction to Quantum Metrology : Quantum Standards and Instrumentation / / by Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [1st ed. 2015.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (287 p.) |
Disciplina | 530 |
Soggetto topico |
Physical measurements
Measurement Nanoscale science Nanoscience Nanostructures Nanotechnology Electronics Microelectronics Measurement Science and Instrumentation Nanoscale Science and Technology Nanotechnology and Microengineering Electronics and Microelectronics, Instrumentation |
ISBN | 3-319-15669-1 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Theoretical Background of Quantum Metrology -- Measures, Standards and Systems of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling and Possible Current Standard -- Atomic Clocks and Time Scales -- Interferometers and Measurements of Length -- Scanning Probe Microscopes -- Other Quantum Detectors -- Standards of the Kilogram Based on Fundamental Physical Constants. |
Record Nr. | UNINA-9910300421203321 |
Nawrocki Waldemar | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [Second edition.] |
Pubbl/distr/stampa | Boston : , : Artech House, , [2016] |
Descrizione fisica | 1 online resource (433 pages) : illustrations |
Disciplina | 681.2 |
Collana | Artech House remote sensing library |
Soggetto topico |
Electronic instruments
Measurement Detectors |
Soggetto genere / forma | Electronic books. |
ISBN |
1-5231-1737-0
1-60807-933-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910465765003321 |
Nawrocki Waldemar | ||
Boston : , : Artech House, , [2016] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [Second edition.] |
Pubbl/distr/stampa | Boston : , : Artech House, , [2016] |
Descrizione fisica | 1 online resource (433 pages) : illustrations |
Disciplina | 681.2 |
Collana | Artech House remote sensing library |
Soggetto topico |
Electronic instruments
Measurement Detectors |
ISBN |
1-5231-1737-0
1-60807-933-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910792510603321 |
Nawrocki Waldemar | ||
Boston : , : Artech House, , [2016] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [Second edition.] |
Pubbl/distr/stampa | Boston : , : Artech House, , [2016] |
Descrizione fisica | 1 online resource (433 pages) : illustrations |
Disciplina | 681.2 |
Collana | Artech House remote sensing library |
Soggetto topico |
Electronic instruments
Measurement Detectors |
ISBN |
1-5231-1737-0
1-60807-933-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910817301603321 |
Nawrocki Waldemar | ||
Boston : , : Artech House, , [2016] | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Pubbl/distr/stampa | Boston, Massachusetts : , : Artech House, , ©2005 |
Descrizione fisica | 1 online resource (338 p.) |
Disciplina | 681/.2 |
Soggetto topico |
Electronic instruments
Measurement Detectors |
Soggetto genere / forma | Electronic books. |
ISBN | 1-58053-946-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Computer-based measurement systems -- Temperature sensors -- Stress and pressure sensors -- Signal conditioners -- Digital-to-analog and analog-to-digital converters -- Measurement systems with serial interface -- Wireless measurement systems -- Measurement systems with IEEE-488 interface -- Crate and modular measurement systems -- LAN-based measurement systems -- DAQ boards and virtual instruments. |
Record Nr. | UNINA-9910451002603321 |
Nawrocki Waldemar | ||
Boston, Massachusetts : , : Artech House, , ©2005 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Pubbl/distr/stampa | Boston, Massachusetts : , : Artech House, , ©2005 |
Descrizione fisica | 1 online resource (338 p.) |
Disciplina | 681/.2 |
Soggetto topico |
Electronic instruments
Measurement Detectors |
ISBN | 1-58053-946-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Computer-based measurement systems -- Temperature sensors -- Stress and pressure sensors -- Signal conditioners -- Digital-to-analog and analog-to-digital converters -- Measurement systems with serial interface -- Wireless measurement systems -- Measurement systems with IEEE-488 interface -- Crate and modular measurement systems -- LAN-based measurement systems -- DAQ boards and virtual instruments. |
Record Nr. | UNINA-9910784141603321 |
Nawrocki Waldemar | ||
Boston, Massachusetts : , : Artech House, , ©2005 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Measurement systems and sensors / / Waldemar Nawrocki |
Autore | Nawrocki Waldemar |
Edizione | [1st ed.] |
Pubbl/distr/stampa | Boston, : Artech House, c2005 |
Descrizione fisica | 1 online resource (338 p.) |
Disciplina | 681/.2 |
Soggetto topico |
Electronic instruments
Measurement Detectors |
ISBN | 1-58053-946-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Computer-based measurement systems -- Temperature sensors -- Stress and pressure sensors -- Signal conditioners -- Digital-to-analog and analog-to-digital converters -- Measurement systems with serial interface -- Wireless measurement systems -- Measurement systems with IEEE-488 interface -- Crate and modular measurement systems -- LAN-based measurement systems -- DAQ boards and virtual instruments. |
Record Nr. | UNINA-9910806147603321 |
Nawrocki Waldemar | ||
Boston, : Artech House, c2005 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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