Testing for EMC compliance : approaches and techniques / / Mark I. Montrose, Edward M. Nakauchi |
Autore | Montrose Mark I. |
Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley, , 2004 |
Descrizione fisica | 1 online resource (480 p.) |
Disciplina |
621.382
621.382/24 621.38224 |
Altri autori (Persone) | NakauchiEdward M |
Soggetto topico |
Electromagnetic compatibility
Electromagnetic interference |
ISBN |
1-280-36799-7
9786610367993 0-470-24874-2 0-471-64468-4 0-471-64465-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction. -- 2. Electric, Magnetic, and Static Fields. -- 3. Instrumentation. -- 4. Test Facilities. -- 5. Probes, Antennas, and Support Equipment. -- 6. Conducted Testing. -- 7. Radiated Testing. -- 8. General Approaches Troubleshooting. -- 9. On-Site Troubleshooting Techniques. -- Appendix A: Building Probes. -- Appendix B: Test Procedures. -- Glossary. -- Bibliography. -- Index. -- About the Authors. |
Record Nr. | UNINA-9910146065003321 |
Montrose Mark I. | ||
Hoboken, New Jersey : , : John Wiley, , 2004 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Testing for EMC compliance : approaches and techniques / / Mark I. Montrose, Edward M. Nakauchi |
Autore | Montrose Mark I. |
Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley, , 2004 |
Descrizione fisica | 1 online resource (480 p.) |
Disciplina |
621.382
621.382/24 621.38224 |
Altri autori (Persone) | NakauchiEdward M |
Soggetto topico |
Electromagnetic compatibility
Electromagnetic interference |
ISBN |
1-280-36799-7
9786610367993 0-470-24874-2 0-471-64468-4 0-471-64465-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction. -- 2. Electric, Magnetic, and Static Fields. -- 3. Instrumentation. -- 4. Test Facilities. -- 5. Probes, Antennas, and Support Equipment. -- 6. Conducted Testing. -- 7. Radiated Testing. -- 8. General Approaches Troubleshooting. -- 9. On-Site Troubleshooting Techniques. -- Appendix A: Building Probes. -- Appendix B: Test Procedures. -- Glossary. -- Bibliography. -- Index. -- About the Authors. |
Record Nr. | UNINA-9910830329203321 |
Montrose Mark I. | ||
Hoboken, New Jersey : , : John Wiley, , 2004 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Testing for EMC compliance : approaches and techniques / / Mark I. Montrose, Edward M. Nakauchi |
Autore | Montrose Mark I |
Pubbl/distr/stampa | Hoboken, NJ, : John Wiley, 2004 |
Descrizione fisica | 1 online resource (480 p.) |
Disciplina | 621.382/24 |
Altri autori (Persone) | NakauchiEdward M |
Soggetto topico |
Electromagnetic compatibility
Electromagnetic interference |
ISBN |
1-280-36799-7
9786610367993 0-470-24874-2 0-471-64468-4 0-471-64465-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | 1. Introduction. -- 2. Electric, Magnetic, and Static Fields. -- 3. Instrumentation. -- 4. Test Facilities. -- 5. Probes, Antennas, and Support Equipment. -- 6. Conducted Testing. -- 7. Radiated Testing. -- 8. General Approaches Troubleshooting. -- 9. On-Site Troubleshooting Techniques. -- Appendix A: Building Probes. -- Appendix B: Test Procedures. -- Glossary. -- Bibliography. -- Index. -- About the Authors. |
Record Nr. | UNINA-9910877164103321 |
Montrose Mark I | ||
Hoboken, NJ, : John Wiley, 2004 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|