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Advanced Maintenance Policies for Shock and Damage Models / / by Xufeng Zhao, Toshio Nakagawa
Advanced Maintenance Policies for Shock and Damage Models / / by Xufeng Zhao, Toshio Nakagawa
Autore Zhao Xufeng
Edizione [1st ed. 2018.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018
Descrizione fisica 1 online resource (XI, 285 p.)
Disciplina 620.00452
Collana Springer Series in Reliability Engineering
Soggetto topico Computer software—Reusability
Computer system failures
Quality control
Reliability
Industrial safety
Performance and Reliability
System Performance and Evaluation
Quality Control, Reliability, Safety and Risk
ISBN 3-319-70456-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- Shock and Damage Models -- Standard Maintenance Policies -- Multiple Maintenance Policies -- Uncertain Failure Models -- Job Completion Models -- Inspection Policies -- Comparative Methods -- Generational Garbage Collection -- Incremental Backup -- Other Extended Models.
Record Nr. UNINA-9910299578603321
Zhao Xufeng  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Optimal inspection models with their applications / / Kodo Ito and Toshio Nakagawa
Optimal inspection models with their applications / / Kodo Ito and Toshio Nakagawa
Autore Ito Kodo
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2023]
Descrizione fisica 1 online resource (266 pages)
Disciplina 670.425
Collana Springer Series in Reliability Engineering Series
Soggetto topico Engineering inspection
Reliability (Engineering)
ISBN 3-031-22021-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. Introduction -- 2. Standard Inspection Models -- 3. Random Inspection Models -- 4. General Inspection Models -- 5. Inspection Models with Minimal Repair -- 6. Hierarchical Structure Reliability -- 7. Application Examples of Storage System -- 8. Application Examples of Phased Array Radar -- 9. Application Examples of Power Generator -- 10. Application Examples of Airframe -- 10.A Appendix -- A. Answer to Selected Problems. .
Record Nr. UNINA-9910678248803321
Ito Kodo  
Cham, Switzerland : , : Springer, , [2023]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Which-Is-Better (WIB): Problems in Reliability Theory / / by Satoshi Mizutani, Xufeng Zhao, Toshio Nakagawa
Which-Is-Better (WIB): Problems in Reliability Theory / / by Satoshi Mizutani, Xufeng Zhao, Toshio Nakagawa
Autore Mizutani Satoshi
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (281 pages)
Disciplina 620.00452
Collana Springer Series in Reliability Engineering
Soggetto topico Computers
Buildings—Repair and reconstruction
Buildings—Maintenance
System theory
Electrical engineering
Hardware Performance and Reliability
Building Repair and Maintenance
Complex Systems
Electrical and Electronic Engineering
Soggetto non controllato Engineering
Technology & Engineering
ISBN 9783031273162
9783031273155
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Chapter 1. Introduction -- Chapter 2. Random Age Replacement Model -- Chapter 3. Replacement Model with Minimal Repair -- Chapter 4. Periodic Replacement Models -- Chapter 5. Extended Replacement Models -- Chapter 6. Which is Better for Standby or Parallel Systems -- Chapter 7. Which is Better Problems in Shock and Damage Models -- Chapter 8. Which is Better Problems in Backup Models -- Chapter 9. Which is Better Problems in Checkpoint Models -- Appendix A: Extended Failure Rates References -- Appendix B: Answer to Selected Problems -- Index.
Record Nr. UNINA-9910725083403321
Mizutani Satoshi  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui