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Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
Soggetto genere / forma Electronic books.
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910455871203321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910780725303321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Atomic force microscopy for biologists [[electronic resource] /] / Victor J. Morris, Andrew .R Kirby, A. Patrick Gunning
Autore Morris V. J
Edizione [2nd ed.]
Pubbl/distr/stampa London, : Imperial College Press, c2010
Descrizione fisica 1 online resource (423 p.)
Disciplina 570.282
Altri autori (Persone) KirbyA. R
GunningA. P
Soggetto topico Atomic force microscopy
Biology - Technique
ISBN 1-282-76003-3
9786612760037
1-84816-468-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CONTENTS; Acknowledgements; CHAPTER 1 AN INTRODUCTION; CHAPTER 2 APPARATUS; 2.1. The atomic force microscope; 2.2. Piezoelectric scanners; 2.3. Probes and cantilevers; 2.3.1. Cantilever geometry; 2.3.2. Tip shape; 2.3.3. Tip functionality; 2.4. Sample holders; 2.4.1. Liquid cells; 2.5. Detection methods; 2.5.1. Optical detectors: laser beam deflection; 2.5.2. Optical detectors: interferometry; 2.5.3. Electrical detectors: electron tunneling; 2.5.4. Electrical detectors: capacitance; 2.5.5. Electrical detectors: piezoelectric cantilevers; 2.6. Control systems; 2.6.1. AFM electronics
2.6.2. Operation of the electronics 2.6.3. Feedback control loops; 2.6.4. Design limitations; 2.6.5. Enhancing the performance of large scanners; 2.7. Vibration isolation: thermal and mechanical; 2.8. Calibration; 2.8.1. Piezoelectric scanner non-linearity; 2.8.2. Tip related factors: convolution; 2.8.3. Calibration standards; 2.8.4. Tips for scanning a calibration specimen; 2.9. Integrated AFMs; 2.9.1. Combined AFM-light microscope (AFM-LM); 2.9.2. 'Submarine' AFM - the combined AFM - Langmuir Trough; 2.9.3. Combined AFM-surface plasmon resonance (AFM-SPR); 2.9.4. Cryo-AFM; References
Useful information sources CHAPTER 3 BASIC PRINCIPLES; 3.1. Forces; 3.1.1. The Van der Waals force and force-distance curves; 3.1.2. The electrostatic force; 3.1.3. Capillary and adhesive forces; 3.1.4. Double layer forces; 3.2. Imaging modes; 3.2.1. Contact dc mode; 3.2.2. Ac modes: Tapping and non-contact; Tapping in air; Tapping under liquid; True, non-contact ac mode; Tuning the cantilever; Influence of drive frequency; 3.2.3. Deflection mode; 3.3. Image types; 3.3.1. Topography; 3.3.2. Frictional force; 3.3.3. Phase; 3.4. Substrates; 3.4.1. Mica; 3.4.2. Glass; 3.4.3. Graphite
3.5. Common problems 3.5.1. Thermal drift; 3.5.2. Multiple tip effects; 3.5.3. The 'pool' artifact; 3.5.4. Optical interference on highly reflective samples; 3.5.5. Sample roughness; 3.5.6. Sample mobility; 3.5.7. Imaging under liquid; 3.6. Getting started; 3.6.1. DNA; 3.6.2. Troublesome large samples; 3.7. Image optimisation; 3.7.1. Grey levels and colour tables; 3.7.2. Brightness and contrast; 3.7.3. High and low pass filtering; 3.7.4. Normalisation and plane fitting; 3.7.5. Despike; 3.7.6. Fourier filtering; 3.7.7. Correlation averaging; 3.7.8. Stereographs and anaglyphs
3.7.9. Do your homework! References; CHAPTER 4 MACROMOLECULES; 4.1. Imaging methods; 4.1.1. Tip adhesion, molecular damage and displacement; 4.1.2. Depositing macromolecules onto substrates; 4.1.3. Metal coated samples; 4.1.4. Imaging in air; 4.1.5. Imaging under non-aqueous liquids; 4.1.6. Binding molecules to the substrate; 4.1.7. Imaging under water or buffers; 4.2. Nucleic acids: DNA; 4.2.1. Imaging DNA; 4.2.2. DNA conformation, size and shape; 4.2.3. DNA-protein interactions; 4.2.4. Location and mapping of specific sites; 4.2.5. Chromosomes; 4.3. Nucleic acids: RNA; 4.4. Polysaccharides
4.4.1. Imaging polysaccharides
Record Nr. UNINA-9910826608003321
Morris V. J  
London, : Imperial College Press, c2010
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui