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Capacitance cell measurement of the out-of-plane expansion of thin films [[electronic resource] /] / Chad R. Snyder, Frederick I. Mopsik
| Capacitance cell measurement of the out-of-plane expansion of thin films [[electronic resource] /] / Chad R. Snyder, Frederick I. Mopsik |
| Autore | Snyder Chad R |
| Pubbl/distr/stampa | [Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2001] |
| Descrizione fisica | 1 online resource (x, 32 pages) : illustrations |
| Altri autori (Persone) | MopsikF. I |
| Collana |
NIST special publication
NIST recommended practice guide |
| Soggetto topico |
Thin-film circuits
Thin films - Thermal properties Expansion (Heat) - Measurement |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910699291703321 |
Snyder Chad R
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| [Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2001] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Measurements on insulating materials at cryogenic temperatures : annual report / / William E. Anderson; Richard S. Davis; F. I. Mopsik; S. J. Kryder; F. Khoury; J. P. Colson; L. H. Bolz
| Measurements on insulating materials at cryogenic temperatures : annual report / / William E. Anderson; Richard S. Davis; F. I. Mopsik; S. J. Kryder; F. Khoury; J. P. Colson; L. H. Bolz |
| Autore | Anderson William E |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
AndersonWilliam E
BolzL. H. <1917-2002.> ColsonJ. P DavisRichard S KhouryF KryderS. J MopsikF. I |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Measurements on insulating materials at cryogenic temperatures |
| Record Nr. | UNINA-9910710023203321 |
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Anderson William E
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Molecular dipole electrets / / Frederick I. Mopsik; Martin G. Broadhurst
| Molecular dipole electrets / / Frederick I. Mopsik; Martin G. Broadhurst |
| Autore | Mopsik F. I |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1974 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BroadhurstMartin G
MopsikF. I |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710058203321 |
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Mopsik F. I
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1974 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Preliminary screening procedures and criteria for replacements for halons 1211 and 1301 / / Richard G. Gann, John D. Barns, Sanford Davis, Jonice S. Harris, Richard H. Harris Jr., John T. Herron, Barbara C. Levin, Frederick I. Mopsik, Kathy A. Notarianni, Marc R. Nyden, Maya Paabo, Richard E. Ricker
| Preliminary screening procedures and criteria for replacements for halons 1211 and 1301 / / Richard G. Gann, John D. Barns, Sanford Davis, Jonice S. Harris, Richard H. Harris Jr., John T. Herron, Barbara C. Levin, Frederick I. Mopsik, Kathy A. Notarianni, Marc R. Nyden, Maya Paabo, Richard E. Ricker |
| Autore | Gann Richard G |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1990 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BarnesJohn D
DavisSanford GannRichard G HarrisJonice S HarrisRichard H., Jr HerronJohn T LevinBarbara C MopsikF. I NotarianniKathy A NydenMarc R PaaboMaya RickerRichard E |
| Collana | NIST technical note |
| Soggetto topico | Fire extinguishing agents |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910714144503321 |
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Gann Richard G
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A review of candidate methods for detecting incipient defects due to aging of installed cables in nuclear power plants / / Frederick I. Mopsik; Edward F. Kelley; Francoise D. Martzloff
| A review of candidate methods for detecting incipient defects due to aging of installed cables in nuclear power plants / / Frederick I. Mopsik; Edward F. Kelley; Francoise D. Martzloff |
| Autore | Mopsik F. I |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1988 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
KelleyEdward F
MartzloffFrancoise D MopsikF. I |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709930203321 |
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Mopsik F. I
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Two-fluid measurements on thin films / / Frederick I. Mopsik
| Two-fluid measurements on thin films / / Frederick I. Mopsik |
| Autore | Mopsik F. I |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1992 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | MopsikF. I |
| Collana | NIST technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711215103321 |
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Mopsik F. I
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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