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Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings
Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings
Autore Mittal K. L.
Pubbl/distr/stampa [Place of publication not identified], : American Society for Testing & Materials, 1978
Descrizione fisica 1 online resource (402 pages)
Disciplina 541.3453
Soggetto topico Adhesion
ISBN 0-8031-5546-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910164731603321
Mittal K. L.  
[Place of publication not identified], : American Society for Testing & Materials, 1978
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Contact angle, wettability and adhesion . Volume 5 / / editor, K.L. Mittal
Contact angle, wettability and adhesion . Volume 5 / / editor, K.L. Mittal
Pubbl/distr/stampa Leiden [The Netherlands] : , : VSP, , 2008
Descrizione fisica 1 online resource (318 p.)
Disciplina 620.44
668.14
668/.14
Altri autori (Persone) MittalK. L
Collana Contact angle, wettability and adhesion
Soggetto topico Surface chemistry
Contact angle
Wetting
Adhesion
Soggetto genere / forma Electronic books.
ISBN 0-429-08776-4
1-282-94907-1
9786612949074
90-474-2999-0
1-60119-997-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Contact angle measurements and solid surface free energy -- pt. 2. Relevance of wetting in cleaning and adhesion -- pt. 3. Superhydrophobic surfaces.
Record Nr. UNINA-9910455265003321
Leiden [The Netherlands] : , : VSP, , 2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Contact angle, wettability and adhesion . Volume 5 / / editor, K.L. Mittal
Contact angle, wettability and adhesion . Volume 5 / / editor, K.L. Mittal
Pubbl/distr/stampa Leiden [The Netherlands] : , : VSP, , 2008
Descrizione fisica 1 online resource (318 p.)
Disciplina 620.44
668.14
668/.14
Altri autori (Persone) MittalK. L
Collana Contact angle, wettability and adhesion
Soggetto topico Surface chemistry
Contact angle
Wetting
Adhesion
Soggetto genere / forma Conference papers and proceedings.
Soggetto non controllato Wettibility
ISBN 0-429-08776-4
1-282-94907-1
9786612949074
90-474-2999-0
1-60119-997-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Contact angle measurements and solid surface free energy -- pt. 2. Relevance of wetting in cleaning and adhesion -- pt. 3. Superhydrophobic surfaces.
Record Nr. UNINA-9910778545103321
Leiden [The Netherlands] : , : VSP, , 2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Developments in surface contamination and cleaning . Volume five Contaminant removal and monitoring / / edited by Rajiv Kohli and K.L. Mittal
Developments in surface contamination and cleaning . Volume five Contaminant removal and monitoring / / edited by Rajiv Kohli and K.L. Mittal
Pubbl/distr/stampa Amsterdam, : Elsevier, 2013
Descrizione fisica 1 online resource (241 p.)
Disciplina 620.44
660.6
Altri autori (Persone) KohliRajiv
MittalK. L
Soggetto topico Surfaces (Technology) - Inspection
Surface contamination - Prevention
Particles - Measurement
ISBN 1-283-61976-8
9786613932211
1-4377-7882-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Developments in Surface Contamination and Cleaning: Contaminant Removal and Monitoring; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Surface Contamination Removal Using Dense-Phase Fluids: Liquid and Supercritical Carbon Dioxide; 1. INTRODUCTION; 2. SURFACE CLEANLINESS LEVELS; 4. PRINCIPLES OF DENSE-PHASE CO2 CLEANING; 5. ADVANTAGES AND DISADVANTAGES OF DENSE-PHASE CO2 CLEANING; 6. APPLICATIONS; 7. SUMMARY AND CONCLUSIONS; ACKNOWLEDGMENT; DISCLAIMER; REFERENCES
Chapter 2 - Plasma Cleaning for Electronic, Photonic, Biological, and Archeological Applications1. INTRODUCTION; 2. PLASMA REACTOR CONFIGURATIONS; 3. SEMICONDUCTOR MANUFACTURING; 4. PHOTOVOLTAIC CELL PROCESSING; 5. PLASMA STERILIZATION; 6. PLASMA CLEANING IN THE RESTORATION INDUSTRY; 7. PLASMA CLEANING APPLICATIONS IN ELECTRON MICROSCOPY; 8. ADDITIONAL PLASMA APPLICATIONS; 9. SUMMARY AND FUTURE NEEDS; REFERENCES; Chapter 3 - Clean Room Wipers for Removal of Surface Contamination; 1. PRINCIPLES OF WIPING FOR REMOVAL OF CONTAMINANTS; 2. TYPES OF WIPERS; 3. WIPER TESTING
4. METHODS TO ASSESS WIPER QUALITY5. THE IMPORTANCE OF AUTOMATION; 6. APPLICATIONS; 7. CURRENT TRENDS IN WIPER TECHNOLOGY; 8. FUTURE DEVELOPMENTS IN CLEAN ROOM WIPERS; REFERENCES; Chapter 4 - Impact of Microbial Surface Contamination and Effective Environment Monitoring System in Pharmaceutical Manufacturing; 1. INTRODUCTION; 2. IMPACT OF MICROORGANISMS IN THE ENVIRONMENT; 3. SANITIZATION; 4. ENVIRONMENTAL MONITORING; 5. ENVIRONMENTAL CONTAMINATION CONTROL; 6. FUTURE DEVELOPMENTAL REQUIREMENTS; REFERENCES
Chapter 5 - Neutron Holography as a Technique for Probing Local Atomic Structures on the Nanoscale1. INTRODUCTION; 2. BASIC CONCEPTS; 3. EXPERIMENTAL REQUIREMENTS; 4. EXAMPLES; 5. OUTLOOK; REFERENCES; Index
Record Nr. UNINA-9911006548403321
Amsterdam, : Elsevier, 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Developments in surface contamination and cleaning . Volume four Detection, characterization, and analysis of contaminants / / edited by Rajiv Kohli and K.L. Mittal
Developments in surface contamination and cleaning . Volume four Detection, characterization, and analysis of contaminants / / edited by Rajiv Kohli and K.L. Mittal
Edizione [1st ed.]
Pubbl/distr/stampa Amsterdam, : William Andrew, 2012
Descrizione fisica 1 online resource (361 p.)
Disciplina 620.44
Altri autori (Persone) KohliRajiv
MittalK. L
Soggetto topico Surfaces (Technology) - Inspection
Surface contamination - Prevention
Cleaning
Coatings
Dust control
ISBN 1-283-29379-X
9786613293794
1-4377-7884-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Basics and Sampling of Particles for Size Analysis and Identification; 1.Introduction and basics; 2.Sampling; 3.Solvents and solubility parameters; 4.Cleanroom airflows and their consideration in contamination sampling; 5.Summary; References; Chapter 2 - Computational Fluid Dynamics of Particle Transport and Deposition; 1 Introduction; 2 Formulation; 3 Applications; 4 Conclusions; Acknowledgments; References
Chapter 3 - Methods for Monitoring and Measuring Cleanliness of Surfaces1 Introduction; 2 Types of Contaminants; 3 Product Cleanliness Levels; 4 Methods for Monitoring Surface Cleanliness; 5 Summary; Disclaimer; Acknowledgment; References; Chapter 4 - Size Analysis and Identification of Particles; 1 Introduction; 2 Particle Identification; 3 Summary; References; Chapter 5 - Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features; 1 Introduction; 2 Impact of Contaminants; 3 Nature and Size of Particles
4 Recent Developments in Characterization Techniques5 Miscellaneous Innovative Applications of Characterization Methods; 6 Summary; Disclaimer; References; Chapter 6 - Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions; 1 Introduction; 2 AFM - Modes of Operation; 3 Adhesion Forces; 4 Application of AFM; 5 Summary; References; Index
Record Nr. UNINA-9911004850103321
Amsterdam, : William Andrew, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Methods for removal of particle contaminants / / edited by Rajiv Kohli and K.L. Mittal
Methods for removal of particle contaminants / / edited by Rajiv Kohli and K.L. Mittal
Edizione [1st ed.]
Pubbl/distr/stampa Oxford [U.K.] ; ; Burlington, Mass., : William Andrew, an imprint of Elsevier, 2011
Descrizione fisica 1 online resource (259 p.)
Disciplina 620/.44
Altri autori (Persone) KohliRajiv
MittalK. L
Collana Developments in surface contamination and cleaning
Soggetto topico Surfaces (Technology) - Inspection
Surface contamination - Prevention
Particles - Measurement
ISBN 1-4377-7886-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Supersonic Nano-Particle Beam Technique for Removing Nano-Sized Contaminant Particles from Surfaces; 1.Introduction; 2.Theoretical Background; 3.Supersonic Nozzle Beam Technique; 4.Electrospray Technique; 5.Summary; Acknowledgment; References; Chapter 2 -Megasonic Cleaning; 1.Introduction; 2.Cleaning Mechanism; 3.Theory of Megasonic Cleaning; 4.Surface Cleanliness Measurement; 5.Megasonic System Evaluation in the Laboratory and in Industry
6.Industry Case Studies7.Concluding Remarks; References; Chapter 3 - Laser Cleaning for Removal of Nano/Micro-Scale Particles and Film Contamination; 1.Introduction; 2.Dry Particle Removal Technique Requirements; 3.Laser Cleaning Techniques; 4.Future Directions in Laser Particle Removal Research; 5.Conclusions and Remarks; Acknowledgments; References; Chapter 4 -Non-Aqueous Interior Surface Cleaning Using Projectiles; 1.Introduction; 2.Types of Contamination; 3.Effects of Contamination; 4.Fluid Cleanliness Levels; 5.Tube Cleaning Methods; 6.Non-Aqueous Projectile Cleaning Method; 7.Summary
AcknowkledgmentDisclaimer; References; Chapter 5 -Electrostatic Removal of Particles and its Applications to Self-Cleaning Solar Panels and Solar Concentrators; 1.Introduction; 2.Solar Power Potential and the Global Energy Needs; 3.Atmospheric Dust and Its Deposition on Solar Panel; 4.Loss of PV Output Power Caused by Dust Deposition; 5.Electrostatic Charging of Dust Particles; 6.Dust Deposition Process: Effects of Size and Charge Distributions; 7.Transmission Loss Due to Atmospheric Dust; 8.Experimental Studies on Solar Panel Obscuration by Dust Deposition
9.Effect of Microstructural Deposition Pattern: Particle Size, Shape, and Electrostatic Charge Distributions10.Removal of Dust From Solar Panels Using Low-Power Electrodynamic Screens; 11.Trajectories of Charged Particles on the Electrodynamic Screen; 12.Dielectrophoretic Force; 13.Tribocharging of Particles; 14.Removal of Uncharged Conducting Particles; 15.High-Voltage Three-Phase Power Supply for the Electrodynamic Screen; 16.Testing of the Electrodynamic Screen; 17.Measurement of Maximum Power Point Operation of the PV System With EDS
18.Testing the Solar Panels Integrated With EDS for Maximum Power Point Operation19.Results; 20.Summary and Conclusions; Acknowledgments; References; Chapter 6 -Alternate Semi-Aqueous Precision Cleaning Techniques: Steam Cleaning and Supersonic Gas/Liquid Cleaning Systems; 1.Introduction; 2.Precision Steam Cleaning; 3.Supersonic Gas-Liquid Cleaning; 4.Summary; Acknowledgments; Disclaimer; References; Index
Record Nr. UNINA-9911006820903321
Oxford [U.K.] ; ; Burlington, Mass., : William Andrew, an imprint of Elsevier, 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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