New Frontiers for Metrology |
Autore | Milton M. J. T (Martin J. T.) |
Edizione | [1st ed.] |
Pubbl/distr/stampa | , : IOS Press, Incorporated, , 2021 |
Descrizione fisica | 1 online resource (480 pages) |
Disciplina | 389.1 |
Altri autori (Persone) |
WiersmaD. S
WilliamsC. J |
Collana | Proceedings of the International School of Physics Enrico Fermi |
Soggetto topico | Metrology |
ISBN | 1-64368-247-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Intro -- Title Page -- Contents -- M.J.T. Milton, D.S. Wiersma, C.J. Williams and M. Sega - Preface -- Course group shot -- Andrew J. Lewis - Realising the metre -- Andrew J. Lewis - Dimensional metrology in practice -- E. Massa - Avogadro, Planck and the kilogram redefinition -- Juris Meija - Traceability in chemical measurements: The role of data analysis -- Juris Meija - Atomic weights of the elements: From measurements to the Periodic Table -- S.M. Judge and D.T. Burns - Metrology for the safe and effective use of ionizing radiation. Part 1: Radiation dosimetry -- Carl J. Williams - The SI from platinum to Planck: The biggest revolution in metrology since the French Revolution -- Ekkehard Peik - Optical atomic clocks and tests of fundamental principles -- Paolo Brenni - The production and trade of scientific instruments (1750-1950) -- Martin J.T. Milton and Celine Fellag Ariouet - The metric system, the Metre Convention and the BIPM -- Gael Obein - The measurement of appearance -- S.M. Judge - Metrology for the safe and effective use of ionizing radiation. Part 2: Radioactivity -- A. Henson - Metrological traceability: A global perspective -- Steven Westwood, Gustavo Martos, Norbert Stoppacher and Robert Wielgosz - Metrological applications of NMR and qNMR in organic analysis -- Michela Sega - Reference Materials: Preparation, homogeneity, stability and value assignment -- Patrizia Tavella - Analysing and obtaining statistical information on time varying quantities -- Patrizia Tavella - Timekeeping and navigation systems -- W. Bich - Measurement uncertainty: Historical perspective, present status and foreseeable future -- Carl J. Williams, John H. Lehman and Christopher W. Oates - The future of metrology -- M.-O. Andre - Fundamentals and applications in electrical metrology -- Posters.
Benjamin A. Bircher - Computed tomography for dimensional metrology: Design considerations for high-resolution CT systems -- H. Salouros and M. Collins - Application of stable isotope ratio analysis to profiling methylamphetamine: Challenges to maintain comparability -- M. Marzano - Realization of the farad from the quantum Hall effect with a fully digital bridge: Progress report -- M. Marzano, M. Kruskopf and A.R. Panna - Bridge on a chip: Realization of a Kelvin bridge based on quantum Hall elements for resistance calibration -- B. Fang, H. Le Goff, B. Chupin, L. Lorini, M. Abgrall, P. Blonde, D. Rovera, P. Tuckey, P. Uhrich, J. Achkar, J. Guena, S. Zhang, N. Lucic, R. Le Tagart, Y. Le Coq, S. Bize, H. Alvarez-Martinez, N. Galland, S. Seidelin, A. Ferrier and P. Goldner - From atomic fountains to ultra-stable lasers -- I. Murataj and F. Ferrarese Lupi - Hyperbolic metamaterials by directed self-assembly of block copolymers -- Nompumelelo Leshabane, James Tshilongo, Shadung J. Moja, Napo G. Ntsasa, Gumani Mphaphuli and Mudalo I. Jozela - Improved measurement capabilities for hydrogen sulphide reference gas mixtures in South Africa -- A. Sacco and A.M. Rossi - Metrological aspects of tip-enhanced Raman spectroscopy -- Azure Hansen, Yun-Jhih Chen, John E. Kitching and Elizabeth A. Donley - Point-source atom interferometer gyroscope -- F. Berto and C. Sias - Prospects for single-photon sideband cooling of fermionic lithium -- Douglas G. Bopp, Matthew T. Hummon, Songbai Kang, John Kitching, Qing Li, Daron A. Westly, Sangsik Kim, Kartik Srinivasan and Vladimir Aksyuk - Chip-scale wavelength standards -- List of participants. |
Altri titoli varianti | New Frontiers for Metrology |
Record Nr. | UNINA-9910795024403321 |
Milton M. J. T (Martin J. T.) | ||
, : IOS Press, Incorporated, , 2021 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
New Frontiers for Metrology |
Autore | Milton M. J. T (Martin J. T.) |
Edizione | [1st ed.] |
Pubbl/distr/stampa | , : IOS Press, Incorporated, , 2021 |
Descrizione fisica | 1 online resource (480 pages) |
Disciplina | 389.1 |
Altri autori (Persone) |
WiersmaD. S
WilliamsC. J |
Collana | Proceedings of the International School of Physics Enrico Fermi |
Soggetto topico | Metrology |
ISBN | 1-64368-247-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Intro -- Title Page -- Contents -- M.J.T. Milton, D.S. Wiersma, C.J. Williams and M. Sega - Preface -- Course group shot -- Andrew J. Lewis - Realising the metre -- Andrew J. Lewis - Dimensional metrology in practice -- E. Massa - Avogadro, Planck and the kilogram redefinition -- Juris Meija - Traceability in chemical measurements: The role of data analysis -- Juris Meija - Atomic weights of the elements: From measurements to the Periodic Table -- S.M. Judge and D.T. Burns - Metrology for the safe and effective use of ionizing radiation. Part 1: Radiation dosimetry -- Carl J. Williams - The SI from platinum to Planck: The biggest revolution in metrology since the French Revolution -- Ekkehard Peik - Optical atomic clocks and tests of fundamental principles -- Paolo Brenni - The production and trade of scientific instruments (1750-1950) -- Martin J.T. Milton and Celine Fellag Ariouet - The metric system, the Metre Convention and the BIPM -- Gael Obein - The measurement of appearance -- S.M. Judge - Metrology for the safe and effective use of ionizing radiation. Part 2: Radioactivity -- A. Henson - Metrological traceability: A global perspective -- Steven Westwood, Gustavo Martos, Norbert Stoppacher and Robert Wielgosz - Metrological applications of NMR and qNMR in organic analysis -- Michela Sega - Reference Materials: Preparation, homogeneity, stability and value assignment -- Patrizia Tavella - Analysing and obtaining statistical information on time varying quantities -- Patrizia Tavella - Timekeeping and navigation systems -- W. Bich - Measurement uncertainty: Historical perspective, present status and foreseeable future -- Carl J. Williams, John H. Lehman and Christopher W. Oates - The future of metrology -- M.-O. Andre - Fundamentals and applications in electrical metrology -- Posters.
Benjamin A. Bircher - Computed tomography for dimensional metrology: Design considerations for high-resolution CT systems -- H. Salouros and M. Collins - Application of stable isotope ratio analysis to profiling methylamphetamine: Challenges to maintain comparability -- M. Marzano - Realization of the farad from the quantum Hall effect with a fully digital bridge: Progress report -- M. Marzano, M. Kruskopf and A.R. Panna - Bridge on a chip: Realization of a Kelvin bridge based on quantum Hall elements for resistance calibration -- B. Fang, H. Le Goff, B. Chupin, L. Lorini, M. Abgrall, P. Blonde, D. Rovera, P. Tuckey, P. Uhrich, J. Achkar, J. Guena, S. Zhang, N. Lucic, R. Le Tagart, Y. Le Coq, S. Bize, H. Alvarez-Martinez, N. Galland, S. Seidelin, A. Ferrier and P. Goldner - From atomic fountains to ultra-stable lasers -- I. Murataj and F. Ferrarese Lupi - Hyperbolic metamaterials by directed self-assembly of block copolymers -- Nompumelelo Leshabane, James Tshilongo, Shadung J. Moja, Napo G. Ntsasa, Gumani Mphaphuli and Mudalo I. Jozela - Improved measurement capabilities for hydrogen sulphide reference gas mixtures in South Africa -- A. Sacco and A.M. Rossi - Metrological aspects of tip-enhanced Raman spectroscopy -- Azure Hansen, Yun-Jhih Chen, John E. Kitching and Elizabeth A. Donley - Point-source atom interferometer gyroscope -- F. Berto and C. Sias - Prospects for single-photon sideband cooling of fermionic lithium -- Douglas G. Bopp, Matthew T. Hummon, Songbai Kang, John Kitching, Qing Li, Daron A. Westly, Sangsik Kim, Kartik Srinivasan and Vladimir Aksyuk - Chip-scale wavelength standards -- List of participants. |
Altri titoli varianti | New Frontiers for Metrology |
Record Nr. | UNINA-9910824195803321 |
Milton M. J. T (Martin J. T.) | ||
, : IOS Press, Incorporated, , 2021 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|