Fundamentals of Friction and Wear on the Nanoscale / / edited by Enrico Gnecco, Ernst Meyer |
Edizione | [2nd ed. 2015.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (703 p.) |
Disciplina |
530
620.44 620.5 620115 |
Collana | NanoScience and Technology |
Soggetto topico |
Nanoscale science
Nanoscience Nanostructures Nanotechnology Materials—Surfaces Thin films Nanoscale Science and Technology Nanotechnology and Microengineering Surfaces and Interfaces, Thin Films |
ISBN | 3-319-10560-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Experimental Techniques -- Atomic-Scale Friction -- Multiscale Friction -- Nanomanipulation and Surface Diffusion -- Carbon Materials -- Polymer Friction, Nanowear -- Dissipation Mechanisms at Finite Separations -- Applications. |
Record Nr. | UNINA-9910298613503321 |
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Noncontact Atomic Force Microscopy : Volume 3 / / edited by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger |
Edizione | [1st ed. 2015.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (539 p.) |
Disciplina | 502.82 |
Collana | NanoScience and Technology |
Soggetto topico |
Nanoscale science
Nanoscience Nanostructures Materials—Surfaces Thin films Spectroscopy Microscopy Nanotechnology Nanoscale Science and Technology Surfaces and Interfaces, Thin Films Spectroscopy and Microscopy |
ISBN | 3-319-15588-1 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | From the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy. |
Record Nr. | UNINA-9910298632903321 |
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|