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A Fortran program for analysis of ellipsometer measurements / / Frank L. McCrackin
| A Fortran program for analysis of ellipsometer measurements / / Frank L. McCrackin |
| Autore | McCrackin F. L (Frank L.) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | McCrackinF. L (Frank L.) |
| Collana | NBS technical note |
| Soggetto topico |
Computer programming
Ellipsometry FORTRAN (Computer program language) Polarization (Light) |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711241303321 |
McCrackin F. L (Frank L.)
|
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin
| A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin |
| Autore | McCrackin F. L (Frank L.) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1964 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | McCrackinF. L (Frank L.) |
| Collana | NBS technical note |
| Soggetto topico |
FORTRAN (Computer program language)
Thin films - Optical properties |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711247303321 |
|
McCrackin F. L (Frank L.)
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1964 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||