Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / / Janet C. Marshall, Mona E. Zaghloul |
Autore | Marshall J. C (Janet C.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
MarshallJ. C (Janet C.)
ZaghloulM. E (Mona Elwakkad) |
Collana | NIST special publication |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711191803321 |
Marshall J. C (Janet C.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 | ||
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Lo trovi qui: Univ. Federico II | ||
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MEMS length and strain round robin results with uncertainty analysis / / Janet C. Marshall; Robert I. Scace; Winthrop A. Baylies |
Autore | Marshall J. C (Janet C.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2006 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
BayliesWinthrop A
MarshallJ. C (Janet C.) ScaceRobet I |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710764703321 |
Marshall J. C (Janet C.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2006 | ||
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Lo trovi qui: Univ. Federico II | ||
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