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Optical shop testing [[electronic resource] /] / edited by Daniel Malacara
| Optical shop testing [[electronic resource] /] / edited by Daniel Malacara |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
| Descrizione fisica | 1 online resource (884 p.) |
| Disciplina |
681.25
681/.25 |
| Altri autori (Persone) | MalacaraDaniel <1937-> |
| Collana | Wiley series in pure and applied optics |
| Soggetto topico |
Optical measurements
Interferometry Interferometers |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-90027-X
9786610900275 0-470-13597-2 1-61583-841-4 0-470-13596-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Shop Testing; Contents; Preface; Contributors; Chapter 1. Newton, Fizeau, and Haidinger Interferometers; 1.1. Introduction; 1.2. Newton Interferometer; 1.2.1. Source and Observer's Pupil Size Considerations; 1.2.2. Some Suitable Light Sources; 1.2.3. Materials for the Optical Flats; 1.2.4. Simple Procedure for Estimating Peak Error; 1.2.5. Measurement of Spherical Surfaces; 1.2.6. Measurement of Aspheric Surfaces; 1.2.7. Measurement of Flatness of Opaque Surfaces; 1.3. Fizeau Interferometer; 1.3.1. The Basic Fizeau Interferometer; 1.3.2. Coherence Requirements for the Light Source
1.3.3. Quality of Collimation Lens Required1.3.4. Liquid Reference Flats; 1.3.5. Fizeau Interferometer with Laser Source; 1.3.6. Multiple-Beam Fizeau Setup; 1.3.7. Testing Nearly Parallel Plates; 1.3.8. Testing the Inhomogeneity of Large Glass or Fused Quartz Samples; 1.3.9. Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates; 1.3.10. Testing Cube Corner and Right-Angle Prisms; 1.3.11. Fizeau Interferometer for Curved Surfaces; 1.3.12. Testing Concave and Convex Surfaces; 1.4. Haldinger Interferometer; 1.4.1. Applications of Haidinger Fringes 1.4.2. Use of Laser Source for Haidinger Interferometer1.4.3. Other Applications of Haidinger Fringes; 1.5. Absolute Testing of Flats; Chapter 2. Twyman-Green Interferometer; 2.1. Introduction; 2.2. Beam-Splitter; 2.2.1. Optical Path Difference Introduced by the Beam Splitter Plate; 2.2.2. Required Accuracy in the Beam Splitter Plate; 2.2.3. Polarizing Cube Beam Splitter; 2.2.4. Nonpolarizing Cube Beam Splitter; 2.3. Coherence Requirements; 2.3.1. Spatial Coherence; 2.3.2. Temporal Coherence; 2.4. Uses of a Twyman-Green Interferometer; 2.4.1. Testing of Prisms and Diffraction Rulings 2.4.2. Testing of Lenses2.4.3. Testing of Microscope Objectives; 2.5. Compensation of Intrinsic Aberrations in the Interferometer; 2.6. Unequal-Path Interferometer; 2.6.1. Some Special Designs; 2.6.2. Improving the Fringe Stability; 2.7. Open Path Interferometers; 2.7.1. Mach-Zehnder Interferometers; 2.7.2. Oblique Incidence Interferometers; 2.8. Variations from the Twyman-Green Configuration; 2.8.1. Multiple Image Interferometers; 2.8.2. Interferometers with Diffractive Beam Splitters; 2.8.3. Phase Conjugating Interferometer; 2.9. Twyman-Green Interferograms and their Analysis 2.9.1. Analysis of Interferograms of Arbitrary WavefrontsChapter 3. Common-Path Interferometers; 3.1. Introduction; 3.2. Burch's Interferometer Employing Two Matched Scatter Plates; 3.2.1. Fresnel Zone Plate Interferometer; 3.2.2. Burch and Fresnel Zone Plate Interferometers for Aspheric Surfaces; 3.2.3. Burch and Fresnel Zone Plate Interferometers for Phase Shifting; 3.3. Birefringent Beam Splitters; 3.3.1. Savart Polariscope; 3.3.2. Wollaston Prism; 3.3.3. Double-Focus Systems; 3.4. Lateral Shearing Interferometers; 3.4.1. Use of a Savart Polariscope; 3.4.2. Use of a Wollaston Prism 3.5. Double-Focus Interferometer |
| Record Nr. | UNINA-9910143556003321 |
| Hoboken, N.J., : Wiley-Interscience, c2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical shop testing [[electronic resource] /] / edited by Daniel Malacara
| Optical shop testing [[electronic resource] /] / edited by Daniel Malacara |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
| Descrizione fisica | 1 online resource (884 p.) |
| Disciplina |
681.25
681/.25 |
| Altri autori (Persone) | MalacaraDaniel <1937-> |
| Collana | Wiley series in pure and applied optics |
| Soggetto topico |
Optical measurements
Interferometry Interferometers |
| ISBN |
1-280-90027-X
9786610900275 0-470-13597-2 1-61583-841-4 0-470-13596-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Shop Testing; Contents; Preface; Contributors; Chapter 1. Newton, Fizeau, and Haidinger Interferometers; 1.1. Introduction; 1.2. Newton Interferometer; 1.2.1. Source and Observer's Pupil Size Considerations; 1.2.2. Some Suitable Light Sources; 1.2.3. Materials for the Optical Flats; 1.2.4. Simple Procedure for Estimating Peak Error; 1.2.5. Measurement of Spherical Surfaces; 1.2.6. Measurement of Aspheric Surfaces; 1.2.7. Measurement of Flatness of Opaque Surfaces; 1.3. Fizeau Interferometer; 1.3.1. The Basic Fizeau Interferometer; 1.3.2. Coherence Requirements for the Light Source
1.3.3. Quality of Collimation Lens Required1.3.4. Liquid Reference Flats; 1.3.5. Fizeau Interferometer with Laser Source; 1.3.6. Multiple-Beam Fizeau Setup; 1.3.7. Testing Nearly Parallel Plates; 1.3.8. Testing the Inhomogeneity of Large Glass or Fused Quartz Samples; 1.3.9. Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates; 1.3.10. Testing Cube Corner and Right-Angle Prisms; 1.3.11. Fizeau Interferometer for Curved Surfaces; 1.3.12. Testing Concave and Convex Surfaces; 1.4. Haldinger Interferometer; 1.4.1. Applications of Haidinger Fringes 1.4.2. Use of Laser Source for Haidinger Interferometer1.4.3. Other Applications of Haidinger Fringes; 1.5. Absolute Testing of Flats; Chapter 2. Twyman-Green Interferometer; 2.1. Introduction; 2.2. Beam-Splitter; 2.2.1. Optical Path Difference Introduced by the Beam Splitter Plate; 2.2.2. Required Accuracy in the Beam Splitter Plate; 2.2.3. Polarizing Cube Beam Splitter; 2.2.4. Nonpolarizing Cube Beam Splitter; 2.3. Coherence Requirements; 2.3.1. Spatial Coherence; 2.3.2. Temporal Coherence; 2.4. Uses of a Twyman-Green Interferometer; 2.4.1. Testing of Prisms and Diffraction Rulings 2.4.2. Testing of Lenses2.4.3. Testing of Microscope Objectives; 2.5. Compensation of Intrinsic Aberrations in the Interferometer; 2.6. Unequal-Path Interferometer; 2.6.1. Some Special Designs; 2.6.2. Improving the Fringe Stability; 2.7. Open Path Interferometers; 2.7.1. Mach-Zehnder Interferometers; 2.7.2. Oblique Incidence Interferometers; 2.8. Variations from the Twyman-Green Configuration; 2.8.1. Multiple Image Interferometers; 2.8.2. Interferometers with Diffractive Beam Splitters; 2.8.3. Phase Conjugating Interferometer; 2.9. Twyman-Green Interferograms and their Analysis 2.9.1. Analysis of Interferograms of Arbitrary WavefrontsChapter 3. Common-Path Interferometers; 3.1. Introduction; 3.2. Burch's Interferometer Employing Two Matched Scatter Plates; 3.2.1. Fresnel Zone Plate Interferometer; 3.2.2. Burch and Fresnel Zone Plate Interferometers for Aspheric Surfaces; 3.2.3. Burch and Fresnel Zone Plate Interferometers for Phase Shifting; 3.3. Birefringent Beam Splitters; 3.3.1. Savart Polariscope; 3.3.2. Wollaston Prism; 3.3.3. Double-Focus Systems; 3.4. Lateral Shearing Interferometers; 3.4.1. Use of a Savart Polariscope; 3.4.2. Use of a Wollaston Prism 3.5. Double-Focus Interferometer |
| Record Nr. | UNINA-9910830255403321 |
| Hoboken, N.J., : Wiley-Interscience, c2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical shop testing [[electronic resource] /] / edited by Daniel Malacara
| Optical shop testing [[electronic resource] /] / edited by Daniel Malacara |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley-Interscience, c2007 |
| Descrizione fisica | 1 online resource (884 p.) |
| Disciplina |
681.25
681/.25 |
| Altri autori (Persone) | MalacaraDaniel <1937-> |
| Collana | Wiley series in pure and applied optics |
| Soggetto topico |
Optical measurements
Interferometry Interferometers |
| ISBN |
1-280-90027-X
9786610900275 0-470-13597-2 1-61583-841-4 0-470-13596-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Optical Shop Testing; Contents; Preface; Contributors; Chapter 1. Newton, Fizeau, and Haidinger Interferometers; 1.1. Introduction; 1.2. Newton Interferometer; 1.2.1. Source and Observer's Pupil Size Considerations; 1.2.2. Some Suitable Light Sources; 1.2.3. Materials for the Optical Flats; 1.2.4. Simple Procedure for Estimating Peak Error; 1.2.5. Measurement of Spherical Surfaces; 1.2.6. Measurement of Aspheric Surfaces; 1.2.7. Measurement of Flatness of Opaque Surfaces; 1.3. Fizeau Interferometer; 1.3.1. The Basic Fizeau Interferometer; 1.3.2. Coherence Requirements for the Light Source
1.3.3. Quality of Collimation Lens Required1.3.4. Liquid Reference Flats; 1.3.5. Fizeau Interferometer with Laser Source; 1.3.6. Multiple-Beam Fizeau Setup; 1.3.7. Testing Nearly Parallel Plates; 1.3.8. Testing the Inhomogeneity of Large Glass or Fused Quartz Samples; 1.3.9. Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates; 1.3.10. Testing Cube Corner and Right-Angle Prisms; 1.3.11. Fizeau Interferometer for Curved Surfaces; 1.3.12. Testing Concave and Convex Surfaces; 1.4. Haldinger Interferometer; 1.4.1. Applications of Haidinger Fringes 1.4.2. Use of Laser Source for Haidinger Interferometer1.4.3. Other Applications of Haidinger Fringes; 1.5. Absolute Testing of Flats; Chapter 2. Twyman-Green Interferometer; 2.1. Introduction; 2.2. Beam-Splitter; 2.2.1. Optical Path Difference Introduced by the Beam Splitter Plate; 2.2.2. Required Accuracy in the Beam Splitter Plate; 2.2.3. Polarizing Cube Beam Splitter; 2.2.4. Nonpolarizing Cube Beam Splitter; 2.3. Coherence Requirements; 2.3.1. Spatial Coherence; 2.3.2. Temporal Coherence; 2.4. Uses of a Twyman-Green Interferometer; 2.4.1. Testing of Prisms and Diffraction Rulings 2.4.2. Testing of Lenses2.4.3. Testing of Microscope Objectives; 2.5. Compensation of Intrinsic Aberrations in the Interferometer; 2.6. Unequal-Path Interferometer; 2.6.1. Some Special Designs; 2.6.2. Improving the Fringe Stability; 2.7. Open Path Interferometers; 2.7.1. Mach-Zehnder Interferometers; 2.7.2. Oblique Incidence Interferometers; 2.8. Variations from the Twyman-Green Configuration; 2.8.1. Multiple Image Interferometers; 2.8.2. Interferometers with Diffractive Beam Splitters; 2.8.3. Phase Conjugating Interferometer; 2.9. Twyman-Green Interferograms and their Analysis 2.9.1. Analysis of Interferograms of Arbitrary WavefrontsChapter 3. Common-Path Interferometers; 3.1. Introduction; 3.2. Burch's Interferometer Employing Two Matched Scatter Plates; 3.2.1. Fresnel Zone Plate Interferometer; 3.2.2. Burch and Fresnel Zone Plate Interferometers for Aspheric Surfaces; 3.2.3. Burch and Fresnel Zone Plate Interferometers for Phase Shifting; 3.3. Birefringent Beam Splitters; 3.3.1. Savart Polariscope; 3.3.2. Wollaston Prism; 3.3.3. Double-Focus Systems; 3.4. Lateral Shearing Interferometers; 3.4.1. Use of a Savart Polariscope; 3.4.2. Use of a Wollaston Prism 3.5. Double-Focus Interferometer |
| Record Nr. | UNINA-9910841876103321 |
| Hoboken, N.J., : Wiley-Interscience, c2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||