Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging [[electronic resource] /] / guest editors Christopher Bailey and Johan Liu |
Pubbl/distr/stampa | Bradford, England, : Emerald Group Publishing, c2006 |
Descrizione fisica | 1 online resource (72 p.) |
Disciplina | 621.381/046 |
Altri autori (Persone) |
BaileyChristopher
LiuJohan |
Collana | Soldering & surface mount technology |
Soggetto topico |
Manufacturing processes
Electronic packaging |
Soggetto genere / forma | Electronic books. |
ISBN |
1-280-54757-X
9786610547579 1-84663-011-8 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Cover; Contents; Guest editorial; Coffin-Manson constant determination for a Sn-8Zn-3Bi lead-free solder joint; High strain rate testing of solder interconnections; Intermetallic compound formation and diffusion path evolution in eutectic tin-lead flip chip solder bumps after aging; Macro-micro modelling of moisture induced stresses in an ACF flip chip assembly; High performance anisotropic conductive adhesives for lead-free interconnects; Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder
Finite element analysis of fleXBGA reliabilityInternet commentary; Book review; New products; Industry news; Exhibitions and conferences; Appointments; International diary |
Record Nr. | UNINA-9910450385003321 |
Bradford, England, : Emerald Group Publishing, c2006 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging [[electronic resource] /] / guest editors Christopher Bailey and Johan Liu |
Pubbl/distr/stampa | Bradford, England, : Emerald Group Publishing, c2006 |
Descrizione fisica | 1 online resource (72 p.) |
Disciplina | 621.381/046 |
Altri autori (Persone) |
BaileyChristopher
LiuJohan |
Collana | Soldering & surface mount technology |
Soggetto topico |
Manufacturing processes
Electronic packaging |
ISBN |
1-280-54757-X
9786610547579 1-84663-011-8 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Cover; Contents; Guest editorial; Coffin-Manson constant determination for a Sn-8Zn-3Bi lead-free solder joint; High strain rate testing of solder interconnections; Intermetallic compound formation and diffusion path evolution in eutectic tin-lead flip chip solder bumps after aging; Macro-micro modelling of moisture induced stresses in an ACF flip chip assembly; High performance anisotropic conductive adhesives for lead-free interconnects; Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder
Finite element analysis of fleXBGA reliabilityInternet commentary; Book review; New products; Industry news; Exhibitions and conferences; Appointments; International diary |
Record Nr. | UNINA-9910783539503321 |
Bradford, England, : Emerald Group Publishing, c2006 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging [[electronic resource] /] / guest editors Christopher Bailey and Johan Liu |
Edizione | [1st ed.] |
Pubbl/distr/stampa | Bradford, England, : Emerald Group Publishing, c2006 |
Descrizione fisica | 1 online resource (72 p.) |
Disciplina | 621.381/046 |
Altri autori (Persone) |
BaileyChristopher
LiuJohan |
Collana | Soldering & surface mount technology |
Soggetto topico |
Manufacturing processes
Electronic packaging |
ISBN |
1-280-54757-X
9786610547579 1-84663-011-8 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Cover; Contents; Guest editorial; Coffin-Manson constant determination for a Sn-8Zn-3Bi lead-free solder joint; High strain rate testing of solder interconnections; Intermetallic compound formation and diffusion path evolution in eutectic tin-lead flip chip solder bumps after aging; Macro-micro modelling of moisture induced stresses in an ACF flip chip assembly; High performance anisotropic conductive adhesives for lead-free interconnects; Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder
Finite element analysis of fleXBGA reliabilityInternet commentary; Book review; New products; Industry news; Exhibitions and conferences; Appointments; International diary |
Record Nr. | UNINA-9910825844003321 |
Bradford, England, : Emerald Group Publishing, c2006 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|