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Bayesian Inference and Computation in Reliability and Survival Analysis [[electronic resource] /] / edited by Yuhlong Lio, Ding-Geng Chen, Hon Keung Tony Ng, Tzong-Ru Tsai
Bayesian Inference and Computation in Reliability and Survival Analysis [[electronic resource] /] / edited by Yuhlong Lio, Ding-Geng Chen, Hon Keung Tony Ng, Tzong-Ru Tsai
Edizione [1st ed. 2022.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2022
Descrizione fisica 1 online resource (367 pages)
Disciplina 519.542
Collana Emerging Topics in Statistics and Biostatistics
Soggetto topico Statistics
Clinical medicine - Research
Bayesian Inference
Bayesian Network
Clinical Research
Estadística bayesiana
Soggetto genere / forma Llibres electrònics
ISBN 3-030-88658-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. A Bayesian Approach for Step-stress Accelerated Life-tests for One-shot Devices under Exponential Distributions -- 2. Bayesian Estimation of Stress-strength Parameter for Moran-Downton Bivariate Exponential Distribution under Progressive Type-II Censoring -- 3. Bayesian Computation in A Birnbaum-Saunders Reliability Model with Applications to Fatigue Data -- 4. A Competing Risks Model Based on A Two-parameter Exponential Family Distribution under Progressive Type-II Censoring -- 5. Bayesian Computations for Reliability Analysis in Dynamic Environments -- 6. Bayesian Analysis of Stochastic Processes in Reliability -- 7. Bayesian Analysis of A New Bivariate Wiener Degradation Process -- 8. Bayesian Estimation for Bivariate Gamma Processes with Copula -- 9. Review of Statistical Treatment for Oncology Dose Escalation Trial with Prolonged Evaluation Window or Fast Enrollment -- 10. A Bayesian Approach for the Analysis of Tumorigenicity Data from Sacrificial Experiments under Weibull Lifetimes -- 11. Bayesian Sensitivity Analysis in Survival and Longitudinal Trial with Missing Data -- 12. Bayesian Analysis for Clustered Data under A Semi-competing Risks Framework -- 13. Survival Analysis for the Inverse Gaussian Distribution: Natural Conjugate and Jeffrey’s Priors -- 14. Bayesian Inferences for Panel Count Data and Interval-censored Data with Nonparametric Modeling of the Baseline Functions -- 15. Bayesian Approach for Interval-censored Survival Data with Time-varying Coefficients -- 16. Bayesian Approach for Joint-modeling Longitudinal Data and Survival Data Simultaneously in Public Health Studies.
Record Nr. UNISA-996485662503316
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2022
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Bayesian Inference and Computation in Reliability and Survival Analysis [[electronic resource] /] / edited by Yuhlong Lio, Ding-Geng Chen, Hon Keung Tony Ng, Tzong-Ru Tsai
Bayesian Inference and Computation in Reliability and Survival Analysis [[electronic resource] /] / edited by Yuhlong Lio, Ding-Geng Chen, Hon Keung Tony Ng, Tzong-Ru Tsai
Edizione [1st ed. 2022.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2022
Descrizione fisica 1 online resource (367 pages)
Disciplina 519.542
Collana Emerging Topics in Statistics and Biostatistics
Soggetto topico Statistics
Clinical medicine - Research
Bayesian Inference
Bayesian Network
Clinical Research
Estadística bayesiana
Soggetto genere / forma Llibres electrònics
ISBN 3-030-88658-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto 1. A Bayesian Approach for Step-stress Accelerated Life-tests for One-shot Devices under Exponential Distributions -- 2. Bayesian Estimation of Stress-strength Parameter for Moran-Downton Bivariate Exponential Distribution under Progressive Type-II Censoring -- 3. Bayesian Computation in A Birnbaum-Saunders Reliability Model with Applications to Fatigue Data -- 4. A Competing Risks Model Based on A Two-parameter Exponential Family Distribution under Progressive Type-II Censoring -- 5. Bayesian Computations for Reliability Analysis in Dynamic Environments -- 6. Bayesian Analysis of Stochastic Processes in Reliability -- 7. Bayesian Analysis of A New Bivariate Wiener Degradation Process -- 8. Bayesian Estimation for Bivariate Gamma Processes with Copula -- 9. Review of Statistical Treatment for Oncology Dose Escalation Trial with Prolonged Evaluation Window or Fast Enrollment -- 10. A Bayesian Approach for the Analysis of Tumorigenicity Data from Sacrificial Experiments under Weibull Lifetimes -- 11. Bayesian Sensitivity Analysis in Survival and Longitudinal Trial with Missing Data -- 12. Bayesian Analysis for Clustered Data under A Semi-competing Risks Framework -- 13. Survival Analysis for the Inverse Gaussian Distribution: Natural Conjugate and Jeffrey’s Priors -- 14. Bayesian Inferences for Panel Count Data and Interval-censored Data with Nonparametric Modeling of the Baseline Functions -- 15. Bayesian Approach for Interval-censored Survival Data with Time-varying Coefficients -- 16. Bayesian Approach for Joint-modeling Longitudinal Data and Survival Data Simultaneously in Public Health Studies.
Record Nr. UNINA-9910586592203321
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Statistical Modeling for Degradation Data [[electronic resource] /] / edited by Ding-Geng (Din) Chen, Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai
Statistical Modeling for Degradation Data [[electronic resource] /] / edited by Ding-Geng (Din) Chen, Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai
Edizione [1st ed. 2017.]
Pubbl/distr/stampa Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017
Descrizione fisica 1 online resource (XVIII, 376 p. 109 illus., 67 illus. in color.)
Disciplina 519.5
Collana ICSA Book Series in Statistics
Soggetto topico Statistics 
Statistical Theory and Methods
Statistics for Business, Management, Economics, Finance, Insurance
ISBN 981-10-5194-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto I. Review and Theoretical Framework -- Chapter 1: Stochastic Accelerated Degradation Models Based on a Generalized Cumu-lative Damage Approach -- Chapter 2: Hierarchical Bayesian Change-Point Analysis for Nonlinear Degradation Data -- Chapter 3: Degradation Modeling, Analysis, and Applications on Residual Life Predic-tion -- Chapter 4: On Some Shock Models with Poisson and Generalized Poisson Shock Processes -- Chapter 5: Degradation Based Reliability Modeling and Assessment of Complex Systems in Dynamic Environments -- Chapter 6: A Survey of the Modeling and Applications on Non-Destructive and De-structive Degradation Tests -- II. Modeling and Experimental Designs -- Chapter 7: Degradation Test Plan for a Nonlinear Random-Coefficients Model -- Chapter 8: Optimal Designs for LED Degradation Modeling -- Chapter 9: Gamma Degradation Models: Inferences and Optimal Designs -- Chapter 10: Model Misspecification analysis of Inverse Gaussian and Gamma Degrada-tion Processes -- III. Applications -- Chapter 11: Practical Application of Fréchet Shock-Degradation Models for System Failures -- Chapter 12: Statistical Methods for Thermal Index Estimation Based on Accelerated Destructive Degradation Test Data -- Chapter 13: Inference on Remaining Useful Life Under Gamma Degradation Models with Random effects.-- Chapter 14: ADDT: An R Package for Analysis of Accelerated Destructive Degradation Test Data -- Chapter 15: Modeling and Inference of CD4 Data. .
Record Nr. UNINA-9910254306703321
Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Statistical Quality Technologies [[electronic resource] ] : Theory and Practice / / edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen
Statistical Quality Technologies [[electronic resource] ] : Theory and Practice / / edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen
Edizione [1st ed. 2019.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019
Descrizione fisica 1 online resource (409 pages)
Disciplina 519.5
Collana ICSA Book Series in Statistics
Soggetto topico Statistics 
Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences
Statistics for Life Sciences, Medicine, Health Sciences
Statistics for Business, Management, Economics, Finance, Insurance
ISBN 3-030-20709-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Part I. Statistical Process Control -- Chapter 1. Some Recent Studies in Statistical Process Control -- Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications -- Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control -- Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling -- Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation -- Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution -- Part II. Acceptance Sampling Plans -- Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions -- Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes -- Chapter 9. Economical Sampling Plans with Warranty -- Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test -- Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests -- Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family -- Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors -- Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring -- Chapter 15. Robust Design in the Case of Data Contamination and Model Departure -- Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing.
Record Nr. UNINA-9910349322603321
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui