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Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu
| Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu |
| Autore | Li Xiaowei |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Gateway East, Singapore : , : Springer, , [2023] |
| Descrizione fisica | 1 online resource (318 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Masks |
| ISBN | 981-19-8551-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion. |
| Record Nr. | UNINA-9910678251903321 |
Li Xiaowei
|
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| Gateway East, Singapore : , : Springer, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu
| Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu |
| Autore | Li Xiaowei |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Gateway East, Singapore : , : Springer, , [2023] |
| Descrizione fisica | 1 online resource (318 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Masks |
| ISBN | 981-19-8551-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion. |
| Record Nr. | UNISA-996547956703316 |
|
Li Xiaowei
|
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| Gateway East, Singapore : , : Springer, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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