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Radiation Tolerant Electronics . Volume II / / Paul Leroux
| Radiation Tolerant Electronics . Volume II / / Paul Leroux |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | Basel : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 |
| Descrizione fisica | 1 online resource (182 pages) |
| Disciplina | 539.2 |
| Soggetto topico | Radiation |
| ISBN | 3-0365-6444-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | About the Editor vii -- Preface to "Radiation Tolerant Electronics, Volume II" ix -- Radiation-Tolerant Electronics 1 -- SEU Tolerance Efficiency of Multiple Layout-Hardened 28 nm DICE D Flip-Flops 5 -- Novel Radiation-Hardened High-Speed DFF Design Based on Redundant Filter and Typical Application Analysis 17 -- A Fully Polarity-Aware Double-Node-Upset-Resilient Latch Design 25 -- TID Sensitivity Assessment of Quadrature LC-Tank VCOs Implemented in 65-nm CMOS Technology 37 -- Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS 51 -- Novel Full TMR Placement Techniques for High-Speed Radiation Tolerant Digital Integrated Circuits 67 -- A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters 77 -- A Virtual Device for Simulation-Based Fault Injection 97 -- Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches 111-- Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations -- TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials 139 -- Comparison of Total Ionizing Dose Effects in 22-nm and 28-nm FD SOI Technologies 149 -- Quantitative Research on Generalized Linear Modeling of SEU and Test Programs Based on Small Sample Data 161. |
| Record Nr. | UNINA-9910647244403321 |
Leroux Paul
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| Basel : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation Tolerant Electronics
| Radiation Tolerant Electronics |
| Autore | Leroux Paul |
| Pubbl/distr/stampa | MDPI - Multidisciplinary Digital Publishing Institute, 2019 |
| Descrizione fisica | 1 electronic resource (210 p.) |
| Soggetto non controllato |
single event effects
radiation-hardening-by-design (RHBD) frequency divider by two single event upset Image processing CMOS analog integrated circuits FPGA total ionizing dose (TID) Impulse Sensitive Function soft error hardening by design radiation hardening by design X-rays Single-Event Upsets (SEUs) line buffer heavy ions VHDL FPGA-based digital controller radiation hardening by design (RHBD) radiation hardening SRAM-based FPGA proton irradiation ring oscillator sensor readout IC fault tolerance space application physical unclonable function voltage controlled oscillator (VCO) Ring Oscillators analog single-event transient (ASET) single event opset (SEU) SEB single event upsets bipolar transistor total ionizing dose protons triple modular redundancy (TMR) gain degradation space electronics saturation effect configuration memory Co-60 gamma radiation total ionization dose (TID) frequency synthesizers CMOS PLL TDC single-event upsets (SEUs) bandgap voltage reference (BGR) 4MR single-shot error rates Radiation Hardening by Design soft errors heavy-ions single-event effects (SEE) single event transient (SET) SEE testing proton irradiation effects RFIC single event upset (SEU) FMR ionization radiation tolerant triplex-duplex neutron irradiation effects digital integrated circuits single event gate rupture (SEGR) power MOSFETs ring-oscillator selective hardening voltage reference nuclear fusion TMR gamma-rays gamma ray instrumentation amplifier radiation effects reference circuits radiation-hardened |
| ISBN | 3-03921-280-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910367565203321 |
|
Leroux Paul
|
||
| MDPI - Multidisciplinary Digital Publishing Institute, 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||