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Identifying face quality and factor measures for video / / Yooyoung Lee; P. Jonathon Phillips; James J. Filliben; J. Ross Beveridge; Hao Zhang
| Identifying face quality and factor measures for video / / Yooyoung Lee; P. Jonathon Phillips; James J. Filliben; J. Ross Beveridge; Hao Zhang |
| Autore | Lee Yooyoung |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2014 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BeveridgeJ. Ross
FillibenJames J LeeYooyoung PhillipsP. Jonathon ZhangHao |
| Collana | NISTIR |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710735803321 |
Lee Yooyoung
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Robust iris recognition baseline for the grand challenge / / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben
| Robust iris recognition baseline for the grand challenge / / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben |
| Autore | Lee Yooyoung |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FillibenJames J
LeeYooyoung MichealsRoss J PhillipsP. Jonathon |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710740903321 |
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Lee Yooyoung
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Sensitivity analysis for biometric systems : a methodology based on orthogonal experiment designs / / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben
| Sensitivity analysis for biometric systems : a methodology based on orthogonal experiment designs / / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben |
| Autore | Lee Yooyoung |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FillibenJames J
LeeYooyoung MichealsRoss J PhillipsP. Jonathon |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Sensitivity analysis for biometric systems |
| Record Nr. | UNINA-9910710755903321 |
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Lee Yooyoung
|
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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