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Analysis of dimensional metrology standards / / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering
Analysis of dimensional metrology standards / / John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering
Autore Evans John
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2001
Descrizione fisica 1 online resource
Altri autori (Persone) EvansJohn
FrechetteSimon
HorstJohn
HuangHui
KramerThomas
MessinaE. R (Elena R.)
ProctorFrederick M
RippeyBill
ScottHarry
VorburgerTed
WaveringAl
Collana NISTIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710526703321
Evans John  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2001
Materiale a stampa
Lo trovi qui: Univ. Federico II
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End-to-end demonstration of the Quality Information Framework (QIF) standard at the International Manufacturing Technology Show (IMTS) 2014 / / Hui-Min Huang; John Michaloski; Daniel Campbell; Robert Stone; Thomas Kramer; Curtis Brown; Robert Brown; Gavrail Tatarliev
End-to-end demonstration of the Quality Information Framework (QIF) standard at the International Manufacturing Technology Show (IMTS) 2014 / / Hui-Min Huang; John Michaloski; Daniel Campbell; Robert Stone; Thomas Kramer; Curtis Brown; Robert Brown; Gavrail Tatarliev
Autore Huang Huimin
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016
Descrizione fisica 1 online resource (19 pages) : illustrations (chiefly color)
Altri autori (Persone) BrownCurtis
BrownRobert
CampbellDaniel
HuangHuimin
KramerThomas
MichaloskiJohn
StoneRobert
TatarlievGavrail
Collana NISTIR
Soggetto topico Information quality
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti End-to-end demonstration of the Quality Information Framework
Record Nr. UNINA-9910709600603321
Huang Huimin  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
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End-to-end Quality Information Framework (QIF) technology survey / / John Michaloski; Tom Hedberg; Hui Huang; Thomas Kramer
End-to-end Quality Information Framework (QIF) technology survey / / John Michaloski; Tom Hedberg; Hui Huang; Thomas Kramer
Autore Michaloski John
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016
Descrizione fisica 1 online resource (32 pages) : illustrations (color)
Altri autori (Persone) HedbergThomas M
HuangHui
KramerThomas
MichaloskiJohn
Collana NISTIR
Soggetto topico Manufacturing processes
Quality control
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti End-to-end Quality Information Framework
Record Nr. UNINA-9910709596303321
Michaloski John  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Handbuch zur Kinder- und Jugendliteratur : SBZ/DDR. Von 1945 bis 1990 / / herausgegeben von Rüdiger Steinlein, Heidi Strobel, Thomas Kramer
Handbuch zur Kinder- und Jugendliteratur : SBZ/DDR. Von 1945 bis 1990 / / herausgegeben von Rüdiger Steinlein, Heidi Strobel, Thomas Kramer
Edizione [1st ed. 2006.]
Pubbl/distr/stampa Stuttgart : , : J.B. Metzler : , : Imprint : J.B. Metzler, , 2006
Descrizione fisica 1 online resource (XVII, 758 S.)
Disciplina 800
Soggetto topico Children's literature
Literature—History and criticism
Children's Literature
Literary History
ISBN 3-476-00216-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione ger
Record Nr. UNINA-9910150372503321
Stuttgart : , : J.B. Metzler : , : Imprint : J.B. Metzler, , 2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Information model for disassembly for reuse, recycle, and remanufacturing / / Shaw C. Feng; Hanmin Lee; Che B. Joung; Thomas Kramer; Parisa Ghodous; Ram D. Sriram
Information model for disassembly for reuse, recycle, and remanufacturing / / Shaw C. Feng; Hanmin Lee; Che B. Joung; Thomas Kramer; Parisa Ghodous; Ram D. Sriram
Autore Feng Shaw C
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011
Descrizione fisica 1 online resource
Altri autori (Persone) FengShaw C
GhodousP (Parisa)
JoungChe B
KramerThomas
LeeHanmin
SriramRam D
Collana NISTIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910709598003321
Feng Shaw C  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Measuring and representing the performance of manufacturing assembly robots / / Michael Shneier; Elena Messina; Craig Schlenoff; Frederick Proctor; Thomas Kramer; Joseph Falco
Measuring and representing the performance of manufacturing assembly robots / / Michael Shneier; Elena Messina; Craig Schlenoff; Frederick Proctor; Thomas Kramer; Joseph Falco
Autore Shneier Michael
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015
Descrizione fisica 1 online resource (56 pages) : illustrations (chiefly color)
Altri autori (Persone) FalcoJoseph
KramerThomas
MessinaE. R (Elena R.)
ProctorFrederick
SchlenoffCraig
ShneierMichael
Collana NISTIR
Soggetto topico Performance - Evaluation
Robotics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710789703321
Shneier Michael  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Metrics and test methods for industrial kit building / / Stephen Balakirsky; Thomas Kramer; Zeid Kootbally; Anthony Pietromartire
Metrics and test methods for industrial kit building / / Stephen Balakirsky; Thomas Kramer; Zeid Kootbally; Anthony Pietromartire
Autore Balakirsky Stephen B (Stephen Bruce)
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013
Descrizione fisica 1 online resource (19 pages) : illustrations (color)
Altri autori (Persone) BalakirskyStephen B (Stephen Bruce)
KootballyZeid
KramerThomas
PietromartireAnthony
Collana NISTIR
Soggetto topico Robotics
Robots, Industrial
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710521703321
Balakirsky Stephen B (Stephen Bruce)  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Software tools for XML to OWL translation / / Thomas Kramer; Benjamin Marks; Craig Schlenoff; Stephen Balakirsky; Zeid Kootbally; Anthony Pietromartire
Software tools for XML to OWL translation / / Thomas Kramer; Benjamin Marks; Craig Schlenoff; Stephen Balakirsky; Zeid Kootbally; Anthony Pietromartire
Autore Kramer Thomas
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015
Descrizione fisica 1 online resource (34 pages) : illustrations (color)
Altri autori (Persone) BalakirskyStephen B (Stephen Bruce)
KootballyZeid
KramerThomas
MarksBenjamin
PietromartireAnthony
SchlenoffCraig
Collana NISTIR
Soggetto topico Computer software - Translators (Computer programs)
XML (Document markup language)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910709588603321
Kramer Thomas  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui