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Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland |
| Autore | Kirkland Earl J |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectroscopy
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNINA-9910409987503321 |
Kirkland Earl J
|
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland |
| Autore | Kirkland Earl J |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectroscopy
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNISA-996418444503316 |
|
Kirkland Earl J
|
||
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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