ELFT-EFS Evaluation of Latent Fingerprint Technologies : Extended Feature Sets [evaluation #1] / / M. Indovina; R. A. Hicklin; G. I. Kiebuzinski |
Autore | Indovina M (Michael D.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
HicklinR. Austin
IndovinaM (Michael D.) KiebuzinskiGeorge |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | ELFT-EFS Evaluation of Latent Fingerprint Technologies |
Record Nr. | UNINA-9910709597703321 |
Indovina M (Michael D.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 | ||
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Lo trovi qui: Univ. Federico II | ||
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Evaluation of latent fingerprint technologies : extended feature sets [evaluation #2] / / M. Indovina; V. Dvornychenko; R. A. Hicklin; G. I. Kiebuzinski |
Autore | Indovina M (Michael D.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
DvornychenkoV
HicklinR. Austin IndovinaM (Michael D.) KiebuzinskiGeorge |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Evaluation of latent fingerprint technologies |
Record Nr. | UNINA-9910710738103321 |
Indovina M (Michael D.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 | ||
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Lo trovi qui: Univ. Federico II | ||
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Extended Feature Set Profile Specification / / Melissa Taylor ... [and others] |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 |
Descrizione fisica | 1 online resource (11 pages) : illustrations (color) |
Altri autori (Persone) |
ChapmanWill
HicklinR. Austin KiebuzinskiGeorge KomarinskiPeter Mayer-SplainJohn TaylorMelissa WallnerRachel |
Collana | NIST special publication |
Soggetto topico |
Biometric identification
Fingerprints |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709586303321 |
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012 | ||
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Lo trovi qui: Univ. Federico II | ||
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Latent interoperability transmission specification / / Melissa K. Taylor ... [and others] |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 |
Descrizione fisica | 1 online resource (39 pages) : illustrations (color) |
Altri autori (Persone) |
ChapmanWill
HicklinR. Austin KiebuzinskiGeorge KomarinskiPeter Mayer-SplainJohn TaylorMelissa K WallnerRachel |
Collana | NIST special publication |
Soggetto topico |
Fingerprints - Identification
Forensic sciences Palmprints - Identification |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709585803321 |
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 | ||
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Lo trovi qui: Univ. Federico II | ||
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Markup instructions for extended friction ridge features / / Melissa Taylor ... [and others] |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 |
Descrizione fisica | 1 online resource (43 pages) : illustrations (color) |
Altri autori (Persone) |
ChapmanWill
HicklinR. Austin KiebuzinskiGeorge KomarinskiPeter Mayer-SplainJohn TaylorMelissa K WallnerRachel |
Collana | NIST special publication |
Soggetto topico |
Fingerprints - Identification
Forensic sciences Palmprints - Identification |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709585903321 |
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 | ||
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Lo trovi qui: Univ. Federico II | ||
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