Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
Autore | Khursheed Anjam |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
Soggetto genere / forma | Electronic books. |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910461623303321 |
Khursheed Anjam
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Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
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Lo trovi qui: Univ. Federico II | ||
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Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
Autore | Khursheed Anjam |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910789407403321 |
Khursheed Anjam
![]() |
||
Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning electron microscope optics and spectrometers / / Anjam Khursheed |
Autore | Khursheed Anjam |
Edizione | [1st ed.] |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910808833503321 |
Khursheed Anjam
![]() |
||
Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|