Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
Autore | Kelly Joe, Ph. D. |
Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
Descrizione fisica | 1 online resource (325 p.) |
Disciplina | 621.3815 |
Altri autori (Persone) | EngelhardtM (Michael) |
Collana | Artech House microwave library |
Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
Soggetto genere / forma | Electronic books. |
ISBN | 1-58053-710-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
Record Nr. | UNINA-9910450916503321 |
Kelly Joe, Ph. D. | ||
Boston : , : Artech House, , ©2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
Autore | Kelly Joe, Ph. D. |
Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
Descrizione fisica | 1 online resource (325 p.) |
Disciplina | 621.3815 |
Altri autori (Persone) | EngelhardtM (Michael) |
Collana | Artech House microwave library |
Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
ISBN | 1-58053-710-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
Record Nr. | UNINA-9910777033903321 |
Kelly Joe, Ph. D. | ||
Boston : , : Artech House, , ©2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
Autore | Kelly Joe, Ph. D. |
Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
Descrizione fisica | 1 online resource (325 p.) |
Disciplina | 621.3815 |
Altri autori (Persone) | EngelhardtM (Michael) |
Collana | Artech House microwave library |
Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
ISBN | 1-58053-710-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
Record Nr. | UNINA-9910807375803321 |
Kelly Joe, Ph. D. | ||
Boston : , : Artech House, , ©2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|