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Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy |
| Autore | Joy David C. <1943-> |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-53489-3
9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910451259803321 |
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy |
| Autore | Joy David C. <1943-> |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| ISBN |
0-19-773242-9
1-280-53489-3 9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910784733103321 |
|
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy |
| Autore | Joy David C. <1943-> |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| ISBN |
0-19-773242-9
1-280-53489-3 9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910808190203321 |
|
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||