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Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder
| Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder |
| Autore | Jenkins Ron <1932-> |
| Pubbl/distr/stampa | New York, : Wiley, c1996 |
| Descrizione fisica | 1 online resource (428 p.) |
| Disciplina | 548/.83 |
| Altri autori (Persone) | SnyderR. L <1941-> (Robert L.) |
| Collana | Chemical analysis |
| Soggetto topico |
X-rays - Diffraction - Technique
X-ray diffractometer Powders - Optical properties - Measurement |
| ISBN |
1-283-59303-3
9786613905482 1-118-52091-2 1-118-52099-8 1-118-52092-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety Considerations
ReferencesCHAPTER 2. THE CRYSTALLINE STATE; 2.1. Introduction to the Crystalline State; 2.2. Crystallographic Symmetry; 2.2.1. Point Groups and Crystal Systems; 2.2.2. The Unit Cell and Bravais Lattices; 2.2.3. Reduced Cells; 2.2.4. Space Groups; 2.3. Space Group Notation; 2.3.1. The Triclinic or Anorthic Crystal System; 2.3.2. The Monoclinic Crystal System; 2.3.3. The Orthorhombic Crystal System; 2.3.4. The Tetragonal Crystal System; 2.3.5. The Hexagonal and Trigonal Crystal Systems; 2.3.6. The Cubic Crystal System; 2.3.7. Equivalent Positions; 2.3.8. Special Positions and Site Multiplicity 2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor 3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability 4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors 5.3.3. The Scintillation Detector |
| Record Nr. | UNINA-9910139078003321 |
Jenkins Ron <1932->
|
||
| New York, : Wiley, c1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray fluorescence spectrometry [[electronic resource] /] / Ron Jenkins
| X-ray fluorescence spectrometry [[electronic resource] /] / Ron Jenkins |
| Autore | Jenkins Ron <1932-> |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | New York, : Wiley, c1999 |
| Descrizione fisica | 1 online resource (230 p.) |
| Disciplina |
543.08586
543.62 |
| Collana | Chemical analysis |
| Soggetto topico |
X-ray spectroscopy
Fluorescence spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-283-59302-5
9786613905475 1-118-52086-6 1-118-52101-3 1-118-52104-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing
2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number 4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures 5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis 7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples 9.3 Preparation of Powder Samples |
| Record Nr. | UNINA-9910139077803321 |
|
Jenkins Ron <1932->
|
||
| New York, : Wiley, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray fluorescence spectrometry [[electronic resource] /] / Ron Jenkins
| X-ray fluorescence spectrometry [[electronic resource] /] / Ron Jenkins |
| Autore | Jenkins Ron <1932-> |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | New York, : Wiley, c1999 |
| Descrizione fisica | 1 online resource (230 p.) |
| Disciplina |
543.08586
543.62 |
| Collana | Chemical analysis |
| Soggetto topico |
X-ray spectroscopy
Fluorescence spectroscopy |
| ISBN |
1-283-59302-5
9786613905475 1-118-52086-6 1-118-52101-3 1-118-52104-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing
2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number 4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures 5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis 7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples 9.3 Preparation of Powder Samples |
| Record Nr. | UNINA-9910829810803321 |
|
Jenkins Ron <1932->
|
||
| New York, : Wiley, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray fluorescence spectrometry / / Ron Jenkins
| X-ray fluorescence spectrometry / / Ron Jenkins |
| Autore | Jenkins Ron <1932-> |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | New York, : Wiley, c1999 |
| Descrizione fisica | 1 online resource (230 p.) |
| Disciplina | 543/.08586 |
| Collana | Chemical analysis |
| Soggetto topico |
X-ray spectroscopy
Fluorescence spectroscopy |
| ISBN |
1-283-59302-5
9786613905475 1-118-52086-6 1-118-52101-3 1-118-52104-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing
2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number 4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures 5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis 7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples 9.3 Preparation of Powder Samples |
| Record Nr. | UNINA-9910876645703321 |
|
Jenkins Ron <1932->
|
||
| New York, : Wiley, c1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||