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Titolo: |
Resonant X-Ray Scattering in Correlated Systems [[electronic resource] /] / edited by Youichi Murakami, Sumio Ishihara
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Pubblicazione: | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2017 |
Edizione: | 1st ed. 2017. |
Descrizione fisica: | 1 online resource (VII, 241 p. 151 illus., 25 illus. in color.) |
Disciplina: | 539.7222 |
Soggetto topico: | Condensed matter |
Materials science | |
Spectroscopy | |
Microscopy | |
Nanotechnology | |
Condensed Matter Physics | |
Characterization and Evaluation of Materials | |
Spectroscopy and Microscopy | |
Nanotechnology and Microengineering | |
Persona (resp. second.): | MurakamiYouichi |
IshiharaSumio | |
Nota di contenuto: | Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii). |
Sommario/riassunto: | The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown. |
Titolo autorizzato: | Resonant X-Ray Scattering in Correlated Systems ![]() |
ISBN: | 3-662-53227-1 |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910254603303321 |
Lo trovi qui: | Univ. Federico II |
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