Info
Silicon Components and Processes Self Study : Field-Effect Transistors / / by Badih El-Kareh, Lou N. Hutter
| Silicon Components and Processes Self Study : Field-Effect Transistors / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2025.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 |
| Descrizione fisica | 1 online resource (520 pages) |
| Disciplina | 621.3815284 |
| Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
| ISBN |
9783031591938
3031591933 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Intro -- Preface -- Contents -- Appendix A: Abbreviations, Acronyms -- Appendix B: List of Symbols -- Appendix C: Universal Physical Constants -- Appendix D: Properties of Silicon and Germanium -- Appendix E: Properties of SiO2 and Si3N4 (300 K) -- Appendix F: International System of Units, SI -- Appendix G: The Greek Alphabet -- Appendix H:Conversion Factors -- Appendix I: Periodic Table of the Elements -- Answers to Review Questions -- Solution Manual -- Index. |
| Record Nr. | UNINA-9910886993003321 |
El-Kareh Badih
|
||
| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Silicon Components and Processes Self Study : Unit Processes and Process Integration / / by Badih El-Kareh, Lou N. Hutter
| Silicon Components and Processes Self Study : Unit Processes and Process Integration / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2024.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
| Descrizione fisica | 1 online resource (637 pages) |
| Disciplina | 728.370942 |
| Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
| ISBN | 3-031-59219-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Intro -- Preface -- Contents -- Appendix A: Abbreviations, acronyms -- Appendix B: List of Symbols -- Appendix C: Universal Physical Constants -- Appendix D: Properties of Silicon and Germanium -- Appendix E: Properties of SiO2 and Si3N4 (300 K) -- Appendix F: International System of Units, SI -- Appendix G: The Greek Alphabet -- Appendix H:Conversion Factors -- Appendix I: Periodic Table of the Elements -- Answers to Review Questions -- Solution Manual -- Index. |
| Record Nr. | UNINA-9910882896303321 |
|
El-Kareh Badih
|
||
| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Silicon Components and Processes Self Study : Rectifying and Ohmic Contacts, Bipolar Junction Transistors / / by Badih El-Kareh, Lou N. Hutter
| Silicon Components and Processes Self Study : Rectifying and Ohmic Contacts, Bipolar Junction Transistors / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2024.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
| Descrizione fisica | 1 online resource (563 pages) |
| Disciplina | 621.381522 |
| Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
| ISBN | 3-031-59189-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910900174303321 |
|
El-Kareh Badih
|
||
| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Silicon Components and Processes Self Study : Properties of Silicon Crystals and PN Junctions / / by Badih El-Kareh, Lou N. Hutter
| Silicon Components and Processes Self Study : Properties of Silicon Crystals and PN Junctions / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2024.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
| Descrizione fisica | 1 online resource (567 pages) |
| Disciplina | 661.0683 |
| Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
| ISBN | 3-031-59185-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910887894003321 |
|
El-Kareh Badih
|
||
| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Silicon Components and Processes Self Study : Integrated High-Voltage Transistors and Passive Components / / by Badih El-Kareh, Lou N. Hutter
| Silicon Components and Processes Self Study : Integrated High-Voltage Transistors and Passive Components / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2024.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 |
| Descrizione fisica | 1 online resource (412 pages) |
| Disciplina | 620.193 |
| Soggetto topico |
Electronic circuits
Electronics Solid state physics Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices |
| ISBN |
9783031592010
3031592018 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Intro -- Preface -- Contents -- Index. |
| Record Nr. | UNINA-9910887886703321 |
|
El-Kareh Badih
|
||
| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2024 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||