Info
Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter
| Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [2nd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XLIX, 648 p. 473 illus., 272 illus. in color.) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuits
Optical materials Electronics - Materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials |
| ISBN | 3-030-15085-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- Analog/RF CMOS -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability. |
| Record Nr. | UNINA-9910366587603321 |
El-Kareh Badih
|
||
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter
| Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / / by Badih El-Kareh, Lou N. Hutter |
| Autore | El-Kareh Badih |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (634 p.) |
| Disciplina |
620
620.11295 620.11297 621.3815 |
| Soggetto topico |
Electronic circuits
Optical materials Electronics - Materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials |
| ISBN | 1-4939-2751-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability. |
| Record Nr. | UNINA-9910299832603321 |
|
El-Kareh Badih
|
||
| New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||