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Cobalt-60 facilities available for hardness assurance testing / / J. C. Humphreys; Charles M. Dozier
| Cobalt-60 facilities available for hardness assurance testing / / J. C. Humphreys; Charles M. Dozier |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
DozierCharles M
HumphreysJimmy C |
| Collana | NBSIR |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710537603321 |
Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Criteria for characterization and performance of a high-dose radiation dosimetry calibraton laboratory / / J. C. Humphreys
| Criteria for characterization and performance of a high-dose radiation dosimetry calibraton laboratory / / J. C. Humphreys |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1996 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | HumphreysJimmy C |
| Collana | NIST special publication |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709545703321 |
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Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Dosimetry for high dose applications [[electronic resource] /] / Jimmy C. Humphreys, Dene Hocken, William L. McLaughlin
| Dosimetry for high dose applications [[electronic resource] /] / Jimmy C. Humphreys, Dene Hocken, William L. McLaughlin |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1988] |
| Descrizione fisica | 1 online resource (50 unnumbered pages) |
| Altri autori (Persone) |
HockenDene
McLaughlinWilliam L |
| Collana |
NBS measurement services
NBS special publication |
| Soggetto topico |
Ionizing radiation - Measurement - Standards
Dosimeters - Standards |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910697001803321 |
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Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Bureau of Standards, , [1988] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Measurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons / / J. C. Humphreys; S. E. Chappell; W. L. McLaughlin; R. D. Jarrett
| Measurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons / / J. C. Humphreys; S. E. Chappell; W. L. McLaughlin; R. D. Jarrett |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChappellS. E. <1931-2007.>
HumphreysJimmy C JarrettR. D McLaughlinWilliam L |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710078503321 |
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Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Radiation-hardness testing of electronic devices : a survey of facility dosimetry practices / / J. C. Humphreys; S. E. Chappell
| Radiation-hardness testing of electronic devices : a survey of facility dosimetry practices / / J. C. Humphreys; S. E. Chappell |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChappellS. E
HumphreysJimmy C |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Radiation-hardness testing of electronic devices |
| Record Nr. | UNINA-9910710018103321 |
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Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices / / J. C. Humphreys; S. E. Chappell
| Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices / / J. C. Humphreys; S. E. Chappell |
| Autore | Humphreys Jimmy C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChappellS. E
HumphreysJimmy C |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710289103321 |
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Humphreys Jimmy C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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