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Nanoscale Spectroscopy and Its Applications to Semiconductor Research [[electronic resource] /] / edited by Y. Watanabe, S. Heun, G. Salviati, N. Yamamoto
| Nanoscale Spectroscopy and Its Applications to Semiconductor Research [[electronic resource] /] / edited by Y. Watanabe, S. Heun, G. Salviati, N. Yamamoto |
| Edizione | [1st ed. 2002.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2002 |
| Descrizione fisica | 1 online resource (XV, 308 p.) |
| Disciplina | 621.3815/2 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Nanotechnology
Optical materials Electronic materials Solid state physics Spectroscopy Microscopy Physical measurements Measurement Optical and Electronic Materials Solid State Physics Spectroscopy and Microscopy Measurement Science and Instrumentation |
| ISBN | 3-540-45850-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Spectro-microscopy by TEM-SEM -- Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy -- Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers -- Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies -- Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL -- Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques -- Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction -- Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics -- Long-Term Oxidation Behaviour of Lead Sulfide Surfaces -- Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures -- Surface Imaging Using Electrons Excited by Metastable-Atom Impacts -- Application of Photoemission Electron Microscopy to Magnetic Domain Imaging -- Photoelectron Spectroscopy with a Photoemission Electron Microscope -- X-ray Photoemission and Low-Energy Electron Microscope -- Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics -- Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures -- Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy -- Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip -- Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography -- Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy -- Growth and Characterization of Ge Nanostructures on Si(111) -- Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy -- Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies -- Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy -- Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures -- Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures. |
| Record Nr. | UNISA-996466700503316 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Nanoscale Spectroscopy and Its Applications to Semiconductor Research / / edited by Y. Watanabe, S. Heun, G. Salviati, N. Yamamoto
| Nanoscale Spectroscopy and Its Applications to Semiconductor Research / / edited by Y. Watanabe, S. Heun, G. Salviati, N. Yamamoto |
| Edizione | [1st ed. 2002.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2002 |
| Descrizione fisica | 1 online resource (XV, 308 p.) |
| Disciplina | 621.3815/2 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Nanotechnology
Optical materials Electronics - Materials Solid state physics Spectrum analysis Microscopy Physical measurements Measurement Optical and Electronic Materials Solid State Physics Spectroscopy and Microscopy Measurement Science and Instrumentation |
| ISBN | 3-540-45850-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Spectro-microscopy by TEM-SEM -- Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy -- Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers -- Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies -- Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL -- Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques -- Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction -- Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics -- Long-Term Oxidation Behaviour of Lead Sulfide Surfaces -- Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures -- Surface Imaging Using Electrons Excited by Metastable-Atom Impacts -- Application of Photoemission Electron Microscopy to Magnetic Domain Imaging -- Photoelectron Spectroscopy with a Photoemission Electron Microscope -- X-ray Photoemission and Low-Energy Electron Microscope -- Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics -- Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures -- Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy -- Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip -- Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography -- Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy -- Growth and Characterization of Ge Nanostructures on Si(111) -- Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy -- Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies -- Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy -- Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures -- Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures. |
| Record Nr. | UNINA-9910139806703321 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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